Effect of ion energy on structural and electrical properties of intrinsic microcrystalline silicon layer deposited in a matrix distributed electron cyclotron resonance plasma reactor

2010 ◽  
Vol 207 (3) ◽  
pp. 591-594 ◽  
Author(s):  
Sanjay K. Ram ◽  
Laurent Kroely ◽  
Pavel Bulkin ◽  
Pere Roca i Cabarrocas
1990 ◽  
Vol 57 (12) ◽  
pp. 1188-1190 ◽  
Author(s):  
Dennis J. Trevor ◽  
Nader Sadeghi ◽  
Toshiki Nakano ◽  
Jacques Derouard ◽  
Richard A. Gottscho ◽  
...  

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