Effect of ion energy on structural and electrical properties of intrinsic microcrystalline silicon layer deposited in a matrix distributed electron cyclotron resonance plasma reactor
2010 ◽
Vol 207
(3)
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pp. 591-594
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1998 ◽
Vol 16
(5)
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pp. 2751-2756
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1996 ◽
Vol 11
(3)
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pp. 422-426
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2008 ◽
Vol 17
(7-10)
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pp. 1710-1715
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1991 ◽
Vol 9
(2)
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pp. 318
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1993 ◽
Vol 64
(12)
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pp. 3572-3584
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