Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2?ZrO2?TiO2 thin films

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.1014 ◽

2003 ◽

Vol 17 (9) ◽

pp. 996-1001 ◽

Author(s):

Simona Barison ◽

Davide Barreca ◽

Giovanni A. Battiston ◽

Sergio Daolio ◽

Monica Fabrizio ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Chemical Vapor ◽

Tio2 Thin Films ◽

X Ray ◽

Chemical Vapor Deposited ◽

Ion Mass Spectrometry ◽

Download Full-text

X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel

Thin Solid Films ◽

10.1016/0040-6090(93)90615-v ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 276-279 ◽

Author(s):

G.M. Ingo ◽

G. Padeletti

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Austenitic Stainless Steel ◽

Boron Nitride ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

Secondary ion mass spectrometry and X-ray photoelectron spectroscopy studies on TiO2 and nitrogen doped TiO2 thin films

Solid State Communications ◽

10.1016/j.ssc.2010.11.017 ◽

2011 ◽

Vol 151 (3) ◽

pp. 245-249 ◽

Author(s):

N.C. Raut ◽

T. Mathews ◽

S. Rajagopalan ◽

R.V. Subba Rao ◽

S. Dash ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Tio2 Thin Films ◽

X Ray ◽

Nitrogen Doped ◽

Spectroscopy Studies ◽

Download Full-text

Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

Download Full-text

Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578851 ◽

1994 ◽

Vol 12 (3) ◽

pp. 671-676 ◽

Author(s):

P. W. Jahn ◽

F. M. Petrat ◽

D. Wolany ◽

M. Deimel ◽

T. Gantenfort ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

On Line ◽

Download Full-text

A Combined Investigation into the Effect of Ni/Mn/Co Ions on Lithium-Ion Battery Anodes Using X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry

ECS Meeting Abstracts ◽

10.1149/ma2014-01/2/245 ◽

2014 ◽

Keyword(s):

Mass Spectrometry ◽

Lithium Ion Battery ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Lithium Ion ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

Interaction of nitrogen and ammonia plasmas with polystyrene and polycarbonate studied by X-ray photoelectron spectroscopy, neutron activation analysis and static secondary ion mass spectrometry

Polymer ◽

10.1016/0032-3861(89)90380-7 ◽

1989 ◽

Vol 30 (1) ◽

pp. 40-44 ◽

Author(s):

J. Lub ◽

F.C.B.M. van Vroonhoven ◽

E. Bruninx ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

Neutron Activation Analysis ◽

Activation Analysis ◽

Neutron Activation ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

97/05172 Identification of inorganic nitrogen in an Australian bituminous coal using X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOFSIMS)

Fuel and Energy Abstracts ◽

10.1016/s0140-6701(97)82445-9 ◽

1997 ◽

Vol 38 (6) ◽

pp. 448-449

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Bituminous Coal ◽

Secondary Ion Mass Spectrometry ◽

Inorganic Nitrogen ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene

Applied Spectroscopy ◽

10.1366/0003702914337588 ◽

1991 ◽

Vol 45 (2) ◽

pp. 209-217 ◽

Author(s):

Ashutosh Chilkoti ◽

David G. Castner ◽

Buddy D. Ratner

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Download Full-text

Aluminum chemical vapor deposition reaction of dimethylaluminum hydride on TiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/s0169-4332(00)00542-0 ◽

2001 ◽

Vol 171 (1-2) ◽

pp. 71-81 ◽

Author(s):

Kozo Tanaka ◽

Hiroyuki Yanashima ◽

Tadaaki Yako ◽

Kunimasa Kamio ◽

Kazumi Sugai ◽

...

Keyword(s):

Mass Spectrometry ◽

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Vapor ◽

X Ray ◽

Secondary Ion ◽

Chemical Vapor Deposition Reaction

Download Full-text