Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2?ZrO2?TiO2 thin films

2003 ◽  
Vol 17 (9) ◽  
pp. 996-1001 ◽  
Author(s):  
Simona Barison ◽  
Davide Barreca ◽  
Giovanni A. Battiston ◽  
Sergio Daolio ◽  
Monica Fabrizio ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Vapor ◽  
Tio2 Thin Films ◽  
X Ray ◽  
Chemical Vapor Deposited ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary ion mass spectrometry and X-ray photoelectron spectroscopy studies on TiO2 and nitrogen doped TiO2 thin films

2011 ◽  
Vol 151 (3) ◽  
pp. 245-249 ◽  
Author(s):  
N.C. Raut ◽  
T. Mathews ◽  
S. Rajagopalan ◽  
R.V. Subba Rao ◽  
S. Dash ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Tio2 Thin Films ◽  
Doped Tio2 ◽  
X Ray ◽  
Nitrogen Doped ◽  
Spectroscopy Studies ◽  
Secondary Ion
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