Combined atomic force-, friction force- and local elasticity microscopy on ReS2 crystals: Surface topography and material contrast

1995 ◽  
Vol 23 (6) ◽  
pp. 399-403 ◽  
Author(s):  
Th. Schimmel ◽  
K. Friemelt ◽  
M. Lux-Steiner ◽  
E. Bucher
2018 ◽  
Vol 5 (9) ◽  
pp. 180766 ◽  
Author(s):  
Lixin Wang ◽  
Dashuai Tao ◽  
Shiyun Dong ◽  
Shanshan Li ◽  
Yu Tian

Nepenthes slippery zone presents surface anisotropy depending on its specialized structures. Herein, via macro–micro–nano scaled experiments, we analysed the contributions of lunate cells and wax crystals to this anisotropy. Macroscopic climbing of insects showed large displacements (triple body length within 3 s) and high velocities (6.16–20.47 mm s −1 ) in the inverted-fixed (towards digestive zone) slippery zone, but failed to climb forward in the normal-fixed (towards peristome) one. Friction force of insect claws sliding across inverted-fixed lunate cells was about 2.4 times of that sliding across the normal-fixed ones, whereas showed unobvious differences (1.06–1.11 times) between the inverted- and normal-fixed wax crystals. Innovative results from atomic force microscope scanning and microstructure examination demonstrated the upper layer of wax crystals causes the cantilever tip to generate rather small differences in friction data (1.92–2.72%), and the beneath layer provides slightly higher differences (4.96–7.91%). The study confirms the anisotropic configuration of lunate cells produces most of the anisotropy, whereas both surface topography and structural features of the wax crystals generate a slight contribution. These results are helpful for understanding the surface anisotropy of Nepenthes slippery zone, and guide the design of bioinspired surface with anisotropic properties.


2006 ◽  
Vol 512 ◽  
pp. 395-398
Author(s):  
Nobumitsu Hirai ◽  
Tatsuya Tooyama ◽  
Toshihiro Tanaka

Potential dependence of the friction force between an atomically-flat terrace of Au(100) single crystal and a tip attached to a silicon nitride cantilever of electrochemical atomic force microscope (EC-AFM) have been investigated qualitatively in 0.05 M H2SO4 aqueous solution. It is found that the friction force gains when the potential increases in the potential range between −400 mV and 400 mV vs Hg/Hg2SO4 electrode.


2014 ◽  
Vol 1621 ◽  
pp. 243-248
Author(s):  
Elise Spedden ◽  
Cristian Staii

ABSTRACTTopographical features are known to influence the axonal outgrowth of neurons. Understanding what kinds of topographical features are most effective at growth cone guidance and how outgrowth responds to these structures is of great importance to the study of nerve regeneration. To this end we analyze axonal outgrowth on tilted nanorod substrates which have been shown to impart directional bias to neuron growth. We utilize the Atomic Force Microscope to characterize the surface features present on these substrates and how such features are influencing the axonal outgrowth. Additionally, using a model which considers the neuronal growth cone as an object influenced by an effective potential we determine an effective force imparted on the growth cone by the surface topography.


Author(s):  
Serkan Necipog˘lu ◽  
Burak Demirel ◽  
Levent Gu¨venc¸

Atomic Force Microscope (AFM) is a very strong and beneficial instrument for acquiring images at nanometer scale. Hence, obtaining better image quality and scan speed is a research area of great interest. Improving the dynamic responses of the scanning probe and the vertical motion of the scanner mechanisms are the two major areas of concentration in this sense. Improving the vertical dynamics is achieved either by designing more complex scanner mechanisms with higher bandwidth or designing more sophisticated controllers rather than the PI, PID or PIID types of controllers that are mostly used in practice. In this paper, the authors focus on designing a repetitive control scheme for fast and accurate scanning. It is possible to implement repetitive control to achieve this goal when it is considered that the successive lines of the scan are quite similar due to the very small steps taken to advance on the sample. Repetitive control can reject higher frequency disturbances due to the surface topography in AFM much better than a conventional controller can, as it can drive the error caused by any periodic input signal to zero. Besides increasing the scan speed, it is also important that the phase lag can be compensated perfectly using repetitive control, with the knowledge of the surface topography from the previous period by introducing appropriate phase advance.


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