MnS@N,S Co‐Doped Carbon Core/Shell Nanocubes: Sulfur‐Bridged Bonds Enhanced Na‐Storage Properties Revealed by In Situ Raman Spectroscopy and Transmission Electron Microscopy

Small ◽  
2020 ◽  
Vol 16 (45) ◽  
pp. 2003001
Author(s):  
Jinliang Zhu ◽  
Pengcheng Wei ◽  
Qingkai Zeng ◽  
Guifang Wang ◽  
Kaipeng Wu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Core Shell ◽  
In Situ Raman Spectroscopy ◽  
In Situ Raman ◽  
Transmission Electron ◽  
Carbon Core ◽  
Storage Properties ◽  
Co Doped

Eu3+/Tb3+ Co-Doped Cerium Oxide Transparent Nanocomposite for Color-Tunable Emission

NANO ◽  
2018 ◽  
Vol 13 (10) ◽  
pp. 1850119
Author(s):  
Xiaoyan Li ◽  
Yunlong Yu ◽  
Xiangfeng Guan ◽  
Peihui Luo ◽  
Linqin Jiang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thermal Stability ◽  
Transmission Electron Microscopy ◽  
Sol Gel ◽  
Homogeneous Precipitation ◽  
Transmission Electron ◽  
Color Tunable ◽  
Co Doped ◽  
Tunable Emission

Eu[Formula: see text]/Tb[Formula: see text] co-doped nanocomposite containing CeO2 nanocrystals was successfully prepared by an in situ sol–gel polymerization approach. High-resolution transmission electron microscopy demonstrated the homogeneous precipitation of CeO2 nanocrystals among the polymethylmethacrylate (PMMA) matrix. The thermal stability and UV-shielding capability of the obtained nanocomposite were improved with increase of CeO2 content. The tuning of the emissive color from green and yellow to red can be easily achieved by varying the dopant species and concentration. These results suggested that the obtained nanocomposite could be potentially applicable in transparent solid-state luminescent devices.

Transmission electron microscopy and in situ Raman studies of glassy sanbornite: An insight into nucleation trend and its relation to structural variation

2010 ◽  
Vol 108 (6) ◽  
pp. 063507 ◽  
Author(s):  
Yoshihiro Takahashi ◽  
Minoru Osada ◽  
Hirokazu Masai ◽  
Takumi Fujiwara
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Structural Variation ◽  
In Situ Raman ◽  
Transmission Electron ◽  
Insight Into

Structural origin of set-reset processes in Ge15Te83Si2 glass investigated using in situ Raman scattering and transmission electron microscopy

2009 ◽  
Vol 105 (8) ◽  
pp. 084517 ◽  
Author(s):  
M. Anbarasu ◽  
S. Asokan ◽  
Sudakshina Prusty ◽  
A. K. Sood
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Scattering ◽  
In Situ Raman ◽  
Transmission Electron

scholarly journals Reversible Redox Property of Co(III) in Amorphous Co-doped SiO2/γ-Al2O3 Layered Composites

Materials ◽  
2020 ◽  
Vol 13 (23) ◽  
pp. 5345
Author(s):  
Shotaro Tada ◽  
Shota Saito ◽  
Akito Mori ◽  
Hideki Mizuno ◽  
Shiori Ando ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Redox Reactions ◽  
Composite Powder ◽  
Amorphous Sio2 ◽  
X Ray ◽  
Transmission Electron ◽  
Reversible Redox ◽  
Co Doped

This paper reports on a unique reversible reducing and oxidizing (redox) property of Co(III) in Co-doped amorphous SiO2/γ-Al2O3 composites. The Fenton reaction during the H2O2-catalyzed sol–gel synthesis utilized in this study lead to the partial formation of Co(III) in addition to Co(II) within the composites. High-resolution transmission electron microscopy (HRTEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) analyses for the composite powder sample with a composition of Al:Si:Co = 85:10:5 showed the amorphous state of the Co-doped SiO2 that modified γ-Al2O3 nanocrystalline surfaces. In situ X-ray absorption fine structure (XAFS) spectroscopic analysis suggested reversible redox reactions of Co species in the composite powder sample during heat-treatment under H2 at 500 °C followed by subsequent cooling to RT under Ar. Further analyses by in situ IR spectroscopy combined with cyclic temperature programmed reduction/desorption (TPR/TPD) measurements and X-ray photoelectron spectroscopic (XPS) analysis revealed that the alternating Co(III)/(II) redox reactions were associated with OH formation (hydrogenation)-deformation (dehydrogenation) of the amorphous aluminosilicate matrix formed in situ at the SiO2/γ-Al2O3 hetero interface, and the redox reactions were governed by the H2 partial pressure at 250–500 °C. As a result, a supported mesoporous γ-Al2O3/Co-doped amorphous SiO2/mesoporous γ-Al2O3 three-layered composite membrane exhibited an H2-triggered chemical valve property: mesopores under H2 flow (open) and micropores under He flow (closure) at 300–500 °C.

scholarly journals Stability of a Bifunctional Cu-Based Core@Zeolite Shell Catalyst for Dimethyl Ether Synthesis Under Redox Conditions Studied by Environmental Transmission Electron Microscopy andIn SituX-Ray Ptychography

2017 ◽  
Vol 23 (3) ◽  
pp. 501-512 ◽  
Author(s):  
Sina Baier ◽  
Christian D. Damsgaard ◽  
Michael Klumpp ◽  
Juliane Reinhardt ◽  
Thomas Sheppard ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dimethyl Ether ◽  
Core Shell ◽  
X Ray ◽  
Environmental Transmission ◽  
The Core ◽  
Transmission Electron ◽  
The Stability

AbstractWhen using bifunctional core@shell catalysts, the stability of both the shell and core–shell interface is crucial for catalytic applications. In the present study, we elucidate the stability of a CuO/ZnO/Al2O3@ZSM-5 core@shell material, used for one-stage synthesis of dimethyl ether from synthesis gas. The catalyst stability was studied in a hierarchical manner by complementary environmental transmission electron microscopy (ETEM), scanning electron microscopy (SEM) andin situhard X-ray ptychography with a specially designedin situcell. Both reductive activation and reoxidation were applied. The core–shell interface was found to be stable during reducing and oxidizing treatment at 250°C as observed by ETEM andin situX-ray ptychography, although strong changes occurred in the core on a 10 nm scale due to the reduction of copper oxide to metallic copper particles. At 350°C,in situX-ray ptychography indicated the occurrence of structural changes also on theµm scale, i.e. the core material and parts of the shell undergo restructuring. Nevertheless, the crucial core–shell interface required for full bifunctionality appeared to remain stable. This study demonstrates the potential of these correlativein situmicroscopy techniques for hierarchically designed catalysts.

scholarly journals Mechanical, Electrical, and Crystallographic Property Dynamics of Bent and Strained Ge/Si Core–Shell Nanowires As Revealed by in situ Transmission Electron Microscopy

Nano Letters ◽  
2018 ◽  
Vol 18 (11) ◽  
pp. 7238-7246 ◽  
Author(s):  
Chao Zhang ◽  
Dmitry G. Kvashnin ◽  
Laure Bourgeois ◽  
Joseph F. S. Fernando ◽  
Konstantin Firestein ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Core Shell ◽  
Transmission Electron ◽  
Crystallographic Property ◽  
Shell Nanowires

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition

1989 ◽  
Vol 47 ◽  
pp. 462-463
Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
High Vacuum ◽  
High Energy ◽  
Energy Electron ◽  
Ultra High Vacuum ◽  
Ex Situ ◽  
Transmission Electron

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.

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