Impact of P/E cycling on read current fluctuation of NOR Flash memory cell: A microscopic perspective based on low frequency noise analysis

2015 ◽  
Author(s):  
Xiaonan Yang ◽  
Jing Liu ◽  
Zhiwei Zheng ◽  
Yan Wang ◽  
Dandan Jiang ◽  
...  
Keyword(s):  
Flash Memory ◽  
Noise Analysis ◽  
Low Frequency ◽  
Memory Cell ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Current Fluctuation ◽  
Flash Memory Cell ◽  
Nor Flash

Effect of Adjacent Bit-Line Cell Interference on Low Frequency Noise in NAND Flash Memory Cell Strings

2013 ◽  
Vol 13 (9) ◽  
pp. 6405-6408 ◽  
Author(s):  
Bong-Su Jo ◽  
Sung-Min Joe ◽  
Min-Kyu Jeong ◽  
Kyung-Rok Han ◽  
Sung-Kye Park ◽  
...  
Keyword(s):  
Flash Memory ◽  
Low Frequency ◽  
Memory Cell ◽  
Frequency Noise ◽  
Nand Flash ◽  
Low Frequency Noise ◽  
Nand Flash Memory ◽  
Flash Memory Cell

Conduction Mechanism and Low Frequency Noise Analysis in Al/Pr0.7Ca0.3MnO3for Bipolar Resistive Switching

2011 ◽  
Vol 50 (1R) ◽  
pp. 011501 ◽  
Author(s):  
Myoung-Sun Lee ◽  
Jung-Kyu Lee ◽  
Hyun-Sang Hwang ◽  
Hyung-Cheol Shin ◽  
Byung-Gook Park ◽  
...  
Keyword(s):  
Resistive Switching ◽  
Conduction Mechanism ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Bipolar Resistive Switching

Low Frequency Noise Analysis in Advanced CMOS Devices

2011 ◽  
Vol 324 ◽  
pp. 441-444 ◽  
Author(s):  
Jalal Jomaah ◽  
Majida Fadlallah ◽  
Gerard Ghibaudo
Keyword(s):  
Experimental Data ◽  
Noise Analysis ◽  
Low Frequency ◽  
Deep Submicron ◽  
Electrical Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Sources ◽  
The Impact ◽  
Mobility Fluctuations

A review of recent results concerning the low frequency noise in modern CMOS devices is given. The approaches such as the carrier number and the Hooge mobility fluctuations used for the analysis of the noise sources are illustrated through experimental data obtained on advanced CMOS generations. Furthermore, the impact on the electrical noise of the shrinking of CMOS devices in the deep submicron range is also shown.

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