Spectral Kurtosis-Based Island Detection Technique

2021 ◽  
pp. 699-706
Author(s):  
Sikander Singh ◽  
Soham Dutta ◽  
Sourav Kumar Sahu ◽  
Pradip Kumar Sadhu
Keyword(s):  
Detection Technique ◽  
Spectral Kurtosis

Clinical Application and Results of the Assessment of Coronary Blood Flow by the Regional Precordial Xenon Residue Detection Technique

1978 ◽  
Vol 17 (04) ◽  
pp. 161-171
Author(s):  
H.-J. Engel ◽  
H. Hundeshagen ◽  
P. R. Lichtlen
Keyword(s):  
Wall Motion ◽  
High Flow ◽  
Detection Technique ◽  
Fatty Tissue ◽  
Technical Aspects ◽  
Residue Detection ◽  
High Affinity ◽  
Artery Disease ◽  
The Right ◽  
Drug Interventions

Methodological and technical aspects as well as application and results of the precordial Xenon-residue-detection technique are critically reviewed. The results concern mainly normal flow in various regions of the heart esp. in the free wall of the right and left ventricle, poststenotic flow in patients with coronary artery disease in relation to the degree of proximal nar-rowings as well as wall motion of the corresponding LV segment, bypassgraft flow and flow after drug interventions esp. nitrates, betablockers, the calcium-antagonist Nifedipine and the coronary dilator Dipyridamole. In spite of its serious limitations (high affinity of Xenon for fatty tissue, geometrical problems in the assessment of flow and its relation to anatomy, gas exchange in situations of high flow etc.), the technique is found to be a usefull investigatory tool. Due to its technical display and the related high costs routine application is, however, prohibitive.

Template Detection Technique From Assorted Web Pages

2012 ◽  
Vol 2 (9) ◽  
pp. 148-150 ◽  
Author(s):  
Marriboyina Rajendra ◽  
◽  
S. Suresh Babu
Keyword(s):  
Detection Technique ◽  
Web Pages

A Primary Signal Detection Technique using Sub-band Pulses of a Multi-band Pulse

2013 ◽  
Vol 133 (6) ◽  
pp. 1145-1152
Author(s):  
Kohei Ohno ◽  
Makoto Itami ◽  
Tetsushi Ikegami
Keyword(s):  
Signal Detection ◽  
Detection Technique ◽  
Primary Signal ◽  
Multi Band

COMPOUND FAULT DIAGNOSIS OF BEARINGS USING AN IMPROVED SPECTRAL KURTOSIS BY MAXIMUM CORRELATION KURTOSIS DECONVOLUTION (MCKD).

2020 ◽  
Vol 9 (8) ◽  
pp. 66-72
Keyword(s):  
Fault Diagnosis ◽  
Resonance Frequency ◽  
Background Noise ◽  
Maximum Correlation ◽  
Vibration Signals ◽  
Filter Length ◽  
Frequency Bands ◽  
Noise Interference ◽  
Spectral Kurtosis

This paper discusses the use of Maximum Correlation kurtosis deconvolution (MCKD) method as a pre-processor in fast spectral kurtosis (FSK) method in order to find the compound fault characteristics of the bearing, by enhancing the vibration signals. FSK only extracts the resonance bands which have maximum kurtosis value, but sometimes it might possible that faults occur in the resonance bands which has low kurtosis value, also the faulty signals missed due to noise interference. In order to overcome these limitations FSK used with MCKD, MCKD extracts various faults present in different resonance frequency bands; also detect the weak impact component, as MCKD also dealt with strong background noise. By obtaining the MCKD parameters like, filter length & deconvolution period, we can extract the compound fault feature characteristics.

Application of KOH Electrochemical Etch and Passive Voltage Contrast Techniques for Deep Sub-Micron CMOS Leaky Gate Detection

2000 ◽  
Author(s):  
Fred Y. Chang ◽  
Victer Chan
Keyword(s):  
Case Studies ◽  
Detection Technique ◽  
Cobalt Silicide ◽  
Process Technology ◽  
Process Flow ◽  
Voltage Contrast ◽  
Emission Detection ◽  
Wet Etch ◽  
Direct Confirmation

Abstract This paper describes a novel de-process flow by combining cobalt silicide / nitride wet etch with KOH electrochemical wet etch (ECW) to identify leaky gate in silicided deep sub-micron process technology. Traditionally, leaky gate identification requires direct confirmation by gate level electrical or emission detection technique. Ohtani [1] used KOH electrochemical etch application to identify nonsilicided leaky gate capacitor in DRAM without using the above confirmation. The result of the case study demonstrates the expanded application of ECW etch to both silicided 0.18um logic and SRAM devices. Voltage contrast at metal 1 to assist leaky gate localization is also proposed. By combining both techniques, the possibility for isolating gate related defects are greatly enhanced. Case studies also show the advantages of the proposed technique over conventional poly level voltage contrast in leaky gate identification especially with devices that use local interconnect and nitride liner process.

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