Mass spectrometry of resonance capture of electrons and photo-electron spectroscopy of molecules of ethylene oxide, ethylene sulfide, and their derivatives

1989 ◽  
Vol 38 (7) ◽  
pp. 1388-1394 ◽  
Author(s):  
A. S. Vorob'ev ◽  
I. I. Furlei ◽  
A. Sh. Sultanov ◽  
V. I. Khvostenko ◽  
G. V. Leplyanin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Ethylene Oxide ◽  
Electron Spectroscopy ◽  
Resonance Capture ◽  
Resonance Capture Of Electrons

Resonance capture of electrons by substituted pyrazoline molecules

2000 ◽  
Vol 49 (4) ◽  
pp. 705-708
Author(s):  
V. S. Shmakov ◽  
I. I. Furley ◽  
A. Sh. Sultanov ◽  
V. A. Dokichev ◽  
R. M. Sultanova
Keyword(s):  
Resonance Capture ◽  
Resonance Capture Of Electrons

Chromium implantation in silica glass

1996 ◽  
Vol 11 (1) ◽  
pp. 229-235 ◽  
Author(s):  
E. Cattaruzza ◽  
R. Bertoncello ◽  
F. Trivillin ◽  
P. Mazzoldi ◽  
G. Battaglin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Silica Glass ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Rutherford Backscattering Spectrometry ◽  
X Ray ◽  
Chromium Silicide ◽  
Secondary Ion

Silica glass was implanted with chromium at the energy of 35 and 160 keV and at fluences varying from 1 × 1016 to 11 × 1016 ions cm−2. In a set of chromium-implanted samples significant amounts of carbon were detected. Samples were characterized by x-ray photoelectron spectroscopy, x-ray-excited Auger electron spectroscopy, secondary ion mass spectrometry, and Rutherford backscattering spectrometry. Chromium silicide and chromium oxide compounds were observed; the presence of carbon in the implanted layers induces the further formation of chromium carbide species. Thermodynamic considerations applied to the investigated systems supply indications in agreement with the experimental evidences.

Resonance capture of electrons by molecules of substituted acetylenes

1989 ◽  
Vol 38 (3) ◽  
pp. 511-517
Author(s):  
I. I. Furlei ◽  
A. Sh. Sultanov ◽  
E. A. Burmistrov ◽  
U. M. Dzhemilev ◽  
F. A. Selimov ◽  
...  
Keyword(s):  
Resonance Capture ◽  
Substituted Acetylenes ◽  
Resonance Capture Of Electrons

Influence of Polyether Copolymer Configuration on Polyurethane Reaction: A Mass Spectrometry Analysis

2003 ◽  
Vol 22 (1) ◽  
pp. 23-42 ◽  
Author(s):  
Wu Suen ◽  
Jennifer Percy ◽  
Shaw L. Hsu ◽  
Igor A. Kaltashov ◽  
Howard D. Stidham
Keyword(s):  
Mass Spectrometry ◽  
Molecular Weight ◽  
Ethylene Oxide ◽  
Molecular Weight Distribution ◽  
Propylene Oxide ◽  
Weight Distribution ◽  
Quantitative Description ◽  
Mass Spectrometry Analysis ◽  
Oxide Content ◽  
Natural Isotopic Abundance

Matrix Assisted Laser Desorption Ionization Time-of-Flight mass spectrometry has been applied to obtain the molecular weight distribution of two polyether copolymers containing ethylene oxide and propylene oxide units. The measured molecular weights and their distributions were surprisingly different from the expected. Based upon the natural isotopic abundance, it was possible to provide a quantitative description of the number of ethylene oxide and propylene oxide units as a function of molecular weight. Important information on composition drift and heterogeneity can be obtained from the 3-D bivariate deconvolution of the mass spectra. As the molecular weight of a random copolymer increased, the ethylene oxide content also increased. A copolymer system with a narrow molecular weight distribution did not necessarily have a narrow composition distribution. These results provide information at the molecular level regarding the hydrophilicity of these copolymers used in polyurethane formulations.

Secondary-ion mass spectrometry and x-ray photo-electron spectroscopy analyses of -irradiated Bi-2212 superconductors

1996 ◽  
Vol 29 (11) ◽  
pp. 2745-2749 ◽  
Author(s):  
A Bhattacharyay ◽  
P Rajasekar ◽  
P Chakraborty ◽  
S K Bandyopadhyay ◽  
P Barat ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Electron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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