An XPS depth-profile study on electrochemically deposited TaO x

2013 ◽  
Vol 17 (12) ◽  
pp. 3115-3123 ◽  
Author(s):  
James Guo Sheng Moo ◽  
Zaenal Awaludin ◽  
Takeyoshi Okajima ◽  
Takeo Ohsaka
Keyword(s):  
Depth Profile ◽  
Electrochemically Deposited ◽  
Profile Study ◽  
Xps Depth Profile

XPS depth profile study of sprayed CZTS thin films

2014 ◽  
Author(s):  
D. R. Deepu ◽  
V. G. Rajeshmon ◽  
C. Sudha Kartha ◽  
K. P. Vijayakumar
Keyword(s):  
Thin Films ◽  
Depth Profile ◽  
Czts Thin Films ◽  
Profile Study ◽  
Xps Depth Profile

XPS depth profile study of CZTS thin films prepared by spray pyrolysis

2013 ◽  
Vol 10 (7-8) ◽  
pp. 1058-1061 ◽  
Author(s):  
Masami Aono ◽  
Koichiro Yoshitake ◽  
Hisashi Miyazaki
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Depth Profile ◽  
Czts Thin Films ◽  
Profile Study ◽  
Xps Depth Profile

Thermal stability of nickel-cobalt multilayer silicide

2005 ◽  
Vol 891 ◽  
Author(s):  
Kil Jin Han ◽  
Yu Jung Cho ◽  
Soon Young Oh ◽  
Yong Jin Kim ◽  
Won Jae Lee ◽  
...  
Keyword(s):  
Thermal Stability ◽  
High Temperature ◽  
Depth Profile ◽  
Ternary Phase ◽  
Nickel Silicide ◽  
Composition Gradient ◽  
Cobalt Silicide ◽  
Nickel Cobalt ◽  
Thermal Stability Of ◽  
Xps Depth Profile

ABSTRACTIn this study, we have investigated the structure of nickel-cobalt silicide to understand its behavior at high temperature. Nickel-cobalt silicide was formed after two-step RTP at 500°C and 700°C respectively. We could observe by TEM that nickel-cobalt silicide consists of a structure which seems to be a Ni-Co-Si ternary phase. No nickel silicide phases and cobalt silicide phases were detected in nickel-cobalt silicide by XRD. From XPS depth profile, we could confirm that there is a cobalt composition gradient along the silicide.

Depth profile study of polyaniline films by photoacoustic spectroscopy

2005 ◽  
Vol 125 ◽  
pp. 63-65 ◽  
Author(s):  
J. E. de Albuquerque ◽  
D. T. Balogh ◽  
R. M. Faria
Keyword(s):  
Depth Profile ◽  
Photoacoustic Spectroscopy ◽  
Polyaniline Films ◽  
Profile Study

Formation mechanism of plasmonic silver nanohexagonal particles made by galvanic displacement reaction

RSC Advances ◽  
2016 ◽  
Vol 6 (37) ◽  
pp. 31454-31461 ◽  
Author(s):  
Y. S. Yamamoto ◽  
Y. Fujime ◽  
N. Takahashi ◽  
S. Nakanishi ◽  
T. Itoh
Keyword(s):  
Formation Mechanism ◽  
Depth Profile ◽  
Profile Analysis ◽  
Displacement Reaction ◽  
Galvanic Displacement ◽  
Depth Profile Analysis ◽  
Galvanic Displacement Reaction ◽  
Xps Depth Profile

Multi-element XPS depth profile analysis made clear that Ag nanoscale hexagonal columns formed by newly-discovered galvanic displacement reaction are covered with Cu compounds which prevent Ag columns from fusion, resulting in stable hotspots.

An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

2018 ◽  
Vol 82 ◽  
pp. 62-66 ◽  
Author(s):  
Constantin Catalin Negrila ◽  
Mihail Florin Lazarescu ◽  
Constantin Logofatu ◽  
Rodica V. Ghita ◽  
Costel Cotirlan
Keyword(s):  
Depth Profile ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Gaas Structure ◽  
Profile Study
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