scholarly journals A solid-state bonding technique of large copper wires for high power devices operating at high temperature

2015 ◽  
Vol 26 (6) ◽  
pp. 3521-3529 ◽  
Author(s):  
Yi-Ling Chen ◽  
Yuan-Yun Wu ◽  
Chin C. Lee
2004 ◽  
Vol 92 (6) ◽  
pp. 3843-3856 ◽  
Author(s):  
Kun Xu ◽  
John C. Selby ◽  
Mark A. Shannon ◽  
James Economy

2013 ◽  
Vol 302 ◽  
pp. 136-139 ◽  
Author(s):  
Ho Sung Lee ◽  
Jong Hoon Yoon ◽  
Joon Tae Yoo ◽  
Ji Ung Choi

In the solid state bonding, joint are made by pressing surfaces together at high temperature so that a bond grows across the interface by atomic diffusion. In order to satisfy both requirements of thermal and mechanical properties of aerospace vehicle, conductive CuCrZr alloy was bonded to duplex steel with high strength. Solid state bonding was performed at 3 different pressure conditions and at temperatures of 850°C and 950°C. Microstructural and mechanical evaluation was performed to obtain the optimum joining condition.


2010 ◽  
Vol 10 (8) ◽  
pp. 3508-3514 ◽  
Author(s):  
Narsingh B. Singh ◽  
Brian Wagner ◽  
Andre Berghmans ◽  
David J. Knuteson ◽  
Sean McLaughlin ◽  
...  

1986 ◽  
Vol 35 (388) ◽  
pp. 35-40 ◽  
Author(s):  
Akihiro HORIGUCHI ◽  
Katsuaki SUGANUMA ◽  
Yoshinari MIYAMOTO ◽  
Masahiko SHIMADA ◽  
Mitsue KOIZUMI

2020 ◽  
Author(s):  
◽  
Samira Shamsir

Wide bandgap (WBG) semiconductors such as GaN and SiC are emerging as promising alternatives to Si for new generation of high efficiency power devices. GaN has attracted a lot of attention recently because of its superior material properties leading to potential realization of power transistors for high power, high frequency, and high temperature applications. In order to utilize the full potential of GaN-based power transistors, proper device modeling is essential to verify its operation and improve the design efficiency. In this view, this research work presents modeling and characterization of GaN transistors for high power and high temperature applications. The objective of this research work includes three key areas of GaN device modeling such as physics-based analytical modeling, device simulation with numerical simulator and electrothermal SPICE model for circuit simulation. The analytical model presented in this dissertation enables understanding of the fundamental physics of this newly emerged GaN device technology to improve the operation of existing device structures and to optimize the device configuration in the future. The numerical device simulation allows to verify the analytical model and study the impact of different device parameters. An empirical SPICE model for standard circuit simulator has been developed and presented in the dissertation which allows simulation of power electronic circuits employing GaN power devices. The empirical model provides a good approximation of the device behavior and creates a link between the physics-based analytical model and the actual device testing data. Furthermore, it includes an electrothermal model which can predict the device behavior at elevated temperatures as required for high temperature applications.


2011 ◽  
Vol 324 ◽  
pp. 46-51 ◽  
Author(s):  
Dominique Tournier ◽  
Pierre Brosselard ◽  
Christophe Raynaud ◽  
Mihai Lazar ◽  
Herve Morel ◽  
...  

Progress in semiconductor technologies have been so consequent these last years that theoretical limits of silicon, speci cally in the eld of high power, high voltage and high temperature have been achieved. At the same time, research on other semiconductors, and es- pecially wide bandgap semiconductors have allowed to fabricate various power devices reliable and performant enough to design high eciency level converters in order to match applications requirements. Among these wide bandgap materials, SiC is the most advanced from a techno- logical point of view: Schottky diodes are already commercially available since 2001, JFET and MOSFET will be versy soon. SiC-based switches Inverter eciency bene ts have been quite established. Considering GaN alternative technology, its driving force was mostly blue led for optical drive or lighting. Although the GaN developments mainly focused for the last decade on optoelectronics and radio frequency, their properties were recently explored to design devices suitable for high power and high eciency applications. As inferred from various studies, due to their superior material properties, diamond and GaN should be even better than SiC, silicon (or SOI) being already closed to its theoretical limits. Even if the diamond maturity is still far away from GaN and SiC, laboratory results are encouraging speci cally for very high voltage devices. Apart from packaging considerations, SiC, GaN and Diamond o ers a great margin of progress. The new power devices o er high voltage and low on-resistance that enable important reduction in energy consumption in nal applications. Applications for wide bandgap materials are the direction of high voltage but also high temperature. As for silicon technology, WBG-ICs are under development to take full bene ts of power and drive integration for high temperature applications.


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