A transparent and flexible metasurface with both low infrared emission and broadband microwave absorption

Author(s):  
Yao Ma ◽  
Lihua Shi ◽  
Jianbao Wang ◽  
Liyan Zhu ◽  
Yuzhou Ran ◽  
...  
2020 ◽  
Vol 53 (13) ◽  
pp. 135109 ◽  
Author(s):  
Cuilian Xu ◽  
Binke Wang ◽  
Mingbao Yan ◽  
Yongqiang Pang ◽  
Wenjie Wang ◽  
...  

2021 ◽  
Vol 50 (4) ◽  
pp. 153-162
Author(s):  
徐翠莲 Cuilian XU ◽  
孟跃宇 Yueyu MENG ◽  
王甲富 Jiafu WANG ◽  
闫明宝 Mingbao YAN ◽  
王雯洁 Wenjie WANG ◽  
...  

1997 ◽  
Vol 161 ◽  
pp. 299-311 ◽  
Author(s):  
Jean Marie Mariotti ◽  
Alain Léger ◽  
Bertrand Mennesson ◽  
Marc Ollivier

AbstractIndirect methods of detection of exo-planets (by radial velocity, astrometry, occultations,...) have revealed recently the first cases of exo-planets, and will in the near future expand our knowledge of these systems. They will provide statistical informations on the dynamical parameters: semi-major axis, eccentricities, inclinations,... But the physical nature of these planets will remain mostly unknown. Only for the larger ones (exo-Jupiters), an estimate of the mass will be accessible. To characterize in more details Earth-like exo-planets, direct detection (i.e., direct observation of photons from the planet) is required. This is a much more challenging observational program. The exo-planets are extremely faint with respect to their star: the contrast ratio is about 10−10at visible wavelengths. Also the angular size of the apparent orbit is small, typically 0.1 second of arc. While the first point calls for observations in the infrared (where the contrast goes up to 10−7) and with a coronograph, the latter implies using an interferometer. Several space projects combining these techniques have been recently proposed. They aim at surveying a few hundreds of nearby single solar-like stars in search for Earth-like planets, and at performing a low resolution spectroscopic analysis of their infrared emission in order to reveal the presence in the atmosphere of the planet of CO H2O and O3. The latter is a good tracer of the presence of oxygen which could be, like on our Earth, released by biological activity. Although extremely ambitious, these projects could be realized using space technology either already available or in development for others missions. They could be built and launched during the first decades on the next century.


2016 ◽  
Vol 12 (2) ◽  
pp. 4204-4212 ◽  
Author(s):  
Maheshwar Sharon ◽  
Ritesh Vishwakarma ◽  
Abhijeet Rajendra Phatak ◽  
Golap Kalita ◽  
Nallin Sharma ◽  
...  

Corn cob, an agricultural waste, is paralyzed at different temperatures (700oC, 800oC and 900oC). Microwave absorption of carbon in the frequency range of 2 GHz to 8 GHz is reported. Carbon activated  with 5%  nickel nitrate showed more than 90% absorption of microwave in the frequency range from 6 GHz to 8 GHz, while carbon activated  with 10% Nickel nitrate treated corn cob showed 90% absorption  in the frequency range of 2.5 GHz to 5 GHz. Carbon showing the best absorption are characterized by XRD, Raman spectra and SEM . It is suggested that corn cob treatment   alone with KOH did not improve the microwave absorption, whereas treatment along with nickel nitrate improved the absorption property much better. It is proposed that treatment with nickel nitrate helps in creating suitable pores in carbon   which improved the absorption behavior because while treating carbon with 1N HCl helps to leach out nickel creating equivalent amount of pores in the carbon.


Author(s):  
Q. Kim ◽  
S. Kayali

Abstract In this paper, we report on a non-destructive technique, based on IR emission spectroscopy, for measuring the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET). A submicron-size He-Ne laser provides the local excitation of the gate channel and the emitted photons are collected by a spectrophotometer. Given the state of our experimental test system, we estimate a spectral resolution of approximately 0.1 Angstroms and a spatial resolution of approximately 0.9 μm, which is up to 100 times finer spatial resolution than can be obtained using the best available passive IR systems. The temperature resolution (<0.02 K/μm in our case) is dependent upon the spectrometer used and can be further improved. This novel technique can be used to estimate device lifetimes for critical applications and measure the channel temperature of devices under actual operating conditions. Another potential use is cost-effective prescreening for determining the 'hot spot' channel temperature of devices under normal operating conditions, which can further improve device design, yield enhancement, and reliable operation. Results are shown for both a powered and unpowered MESFET, demonstrating the strength of our infrared emission spectroscopy technique as a reliability tool.


Author(s):  
Steve K. Hsiung ◽  
Kevan V. Tan ◽  
Andrew J. Komrowski ◽  
Daniel J. D. Sullivan ◽  
Jan Gaudestad

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.


2009 ◽  
Vol 25 (1) ◽  
pp. 73-76 ◽  
Author(s):  
Hong JIANG ◽  
Jia GUO ◽  
Lu ZHAO ◽  
Hong ZHU

2009 ◽  
Vol 24 (2) ◽  
pp. 340-344 ◽  
Author(s):  
Deng-Ke WANG ◽  
Hao HUANG ◽  
Kuai YU ◽  
Xue-Feng ZHANG ◽  
Xing-Long DONG
Keyword(s):  

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