scholarly journals Vector analysis of electric-field-induced antiparallel magnetic domain evolution in ferromagnetic/ferroelectric heterostructures

2021 ◽  
Author(s):  
Xinger Zhao ◽  
Zhongqiang Hu ◽  
Jingen Wu ◽  
Ting Fang ◽  
Yaojin Li ◽  
...  
Keyword(s):  
Electric Field ◽  
Magnetic Domain ◽  
Vector Analysis ◽  
Magnetization Distribution ◽  
Magnetic Domains ◽  
Practical Applications ◽  
Domain Evolution ◽  
Fundamental Understanding ◽  
Multiferroic Heterostructures

AbstractElectric field (E-field) control of magnetism based on magnetoelectric coupling is one of the promising approaches for manipulating the magnetization with low power consumption. The evolution of magnetic domains under in-situ E-fields is significant for the practical applications in integrated micro/nano devices. Here, we report the vector analysis of the E-field-driven antiparallel magnetic domain evolution in FeCoSiB/PMN-PT(011) multiferroic heterostructures via in-situ quantitative magneto-optical Kerr microscope. It is demonstrated that the magnetic domains can be switched to both the 0° and 180° easy directions at the same time by E-fields, resulting in antiparallel magnetization distribution in ferromagnetic/ferroelectric heterostructures. This antiparallel magnetic domain evolution is attributed to energy minimization with the uniaxial strains by E-fields which can induce the rotation of domains no more than 90°. Moreover, domains can be driven along only one or both easy axis directions by reasonably selecting the initial magnetic domain distribution. The vector analysis of magnetic domain evolution can provide visual insights into the strain-mediated magnetoelectric effect, and promote the fundamental understanding of electrical regulation of magnetism.

Pattern Transfer and Electric-Field-Induced Magnetic Domain Formation in Multiferroic Heterostructures

2011 ◽  
Vol 23 (28) ◽  
pp. 3187-3191 ◽  
Author(s):  
Tuomas H. E. Lahtinen ◽  
Jussi O. Tuomi ◽  
Sebastiaan van Dijken
Keyword(s):  
Electric Field ◽  
Magnetic Domain ◽  
Pattern Transfer ◽  
Domain Formation ◽  
Multiferroic Heterostructures

Microstructure and Magnetic Domain Wall Motion

1981 ◽  
Vol 39 ◽  
pp. 324-325
Author(s):  
I. N. Lin
Keyword(s):  
Domain Walls ◽  
Ion Beam ◽  
Magnetic Loss ◽  
Magnetic Domain ◽  
Domain Wall Motion ◽  
Soft Magnetic Materials ◽  
Magnetic Domains ◽  
Materials Used ◽  
Mnzn Ferrites

MnZn-ferrites and Li-ferrites are soft magnetic materials used in telecommunication and entertainment electronics because of their high magnetic permeability and low magnetic loss characteristics. The magnetic properties of these materials are very sensitive to composition and microstructure. In the present paper, results of an investigation of the interaction of magnetic domains with the microstructural features are presented and the significance of such studied on microstructure-property relationships is discussed.Lorentz microscopic technique in TEM has been used to study the domain wal structure and its interaction with grain boundaries, precipitates, pores, cracks, etc. in situ. Electron transparent specimens from bulk samples were prepared by ion beam milling technique and were examined in a Philips EM301 microscope operating at 100kV. The motion of domain walls was studied in situ by tilting the specimen so that there is a magnetic field applied to the plane of the specimen.

Influence of Annealing Temperature on Microstructure and Magnetic Properties of Ti/Ni/Ti Thin Films

2011 ◽  
Vol 239-242 ◽  
pp. 1699-1702
Author(s):  
Shun Zhen Feng ◽  
Ji Hong Liu ◽  
Pu Hao ◽  
Yan Hui Dong ◽  
Hui Yuan Sun
Keyword(s):  
Room Temperature ◽  
Annealing Temperature ◽  
Magnetic Domain ◽  
Magnetic Domains ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Diffraction Peaks ◽  
Microstructure And Magnetic Properties

Ti(3nm)/Ni(10nm)/Ti(3nm) films were deposited directly on glass substrates using dc facing-target magnetron sputtering system at room temperature and in situ-annealed from room temperature(RT) to annealing temperature(Ta) 500°C, respectively. At Ta = 400°C, the gain size was about 15 nm, and the magnetic domains of the films distributed homogenously, and the magnetic domain cluster size was nearly 25 nm. The maximum perpendicular coercivity of Ti(3nm)/Ni(10nm)/Ti(3nm) films was 1360 Oe. The segregation or diffusion of Ti and the stress anisotropy played important roles to increase the coercivity. The intergrain interaction of films was obtained by δM plots. In annealing films, X-ray diffraction (XRD) profiles showed two diffraction peaks of NiTi monoclinic structure (002), (111) lattice orientations.

In situ electric field induced domain evolution in Ba(Zr0.2Ti0.8)O3-0.3(Ba0.7Ca0.3)TiO3 ferroelectrics

2014 ◽  
Vol 105 (11) ◽  
pp. 112904 ◽  
Author(s):  
M. Zakhozheva ◽  
L. A. Schmitt ◽  
M. Acosta ◽  
W. Jo ◽  
J. Rödel ◽  
...  
Keyword(s):  
Electric Field ◽  
Domain Evolution

Lorentz microscopy study of magnetic domain walls in Fe-Cr-Co alloys

1978 ◽  
Vol 36 (1) ◽  
pp. 462-463
Author(s):  
Yalcin Belli
Keyword(s):  
Domain Walls ◽  
Magnetic Domain ◽  
Microscopy Study ◽  
Ferromagnetic Phase ◽  
Stable Phase ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Magnetic Hardening ◽  
Electron Microscopes ◽  
Co Alloys

Fe-Cr-Co alloys have great technological potential to replace Alnico alloys as hard magnets. The relationship between the microstructures and the magnetic properties has been recently established for some of these alloys. The magnetic hardening has been attributed to the decomposition of the high temperature stable phase (α) into an elongated Fe-rich ferromagnetic phase (α1) and a weakly magnetic or non-magnetic Cr-rich phase (α2). The relationships between magnetic domains and domain walls and these different phases are yet to be understood. The TEM has been used to ascertain the mechanism of magnetic hardening for the first time in these alloys. The present paper describes the magnetic domain structure and the magnetization reversal processes in some of these multiphase materials. Microstructures to change properties resulting from, (i) isothermal aging, (ii) thermomagnetic treatment (TMT) and (iii) TMT + stepaging have been chosen for this investigation. The Jem-7A and Philips EM-301 transmission electron microscopes operating at 100 kV have been used for the Lorentz microscopy study of the magnetic domains and their interactions with the finely dispersed precipitate phases.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

1992 ◽  
Vol 50 (1) ◽  
pp. 256-257
Author(s):  
Tai D. Nguyen ◽  
Ronald Gronsky ◽  
Jeffrey B. Kortright
Keyword(s):  
Layered Structure ◽  
Driving Force ◽  
High Energy ◽  
Superior Performance ◽  
In Situ Tem ◽  
Rayleigh Instability ◽  
Practical Applications ◽  
Transmission Electron ◽  
Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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