Theory of life-time measurements with the scanning electron microscope: steady state

1976 ◽  
Vol 15 (4) ◽  
pp. 270
Keyword(s):  
Electron Microscope ◽  
Steady State ◽  
Scanning Electron Microscope ◽  
Life Time ◽  
Scanning Electron

Effective Diffusivity of Carbon Dioxide and Iodine through “G” Tunnel Tuff

1989 ◽  
Vol 176 ◽  
Author(s):  
Tevfik Bardakci ◽  
Franklin G. King ◽  
Maung K. Sein
Keyword(s):  
Carbon Dioxide ◽  
Electron Microscope ◽  
Steady State ◽  
Scanning Electron Microscope ◽  
Effective Diffusivity ◽  
Unsteady State ◽  
Steady State Method ◽  
Mercury Porosimeter ◽  
State Method ◽  
Scanning Electron

ABSTRACTThe effective diffusivity of carbon dioxide and iodine through “G” tunnel tuff were determined using a steady-state method and an unsteady-state method respectively. Results show that the effective diffusivity of carbon dioxide and iodine through dry tuff increased with temperature. The effective diffusivity of carbon dioxide decreased as the moisture content of the “G” tunnel tuff increased. An emprical correlation was obtained to estimate the effective diffusivity of carbon dioxide as a function temperature and the percent saturation. Specific surface area and pore volume of tuff was determined using a mercury porosimeter. A scanning electron microscope was utilized to further characterize the porous structure of the tuff samples.

Electromigration in Al/W and Al(Cu)/W Interconnect Structures

1991 ◽  
Vol 225 ◽  
Author(s):  
C-K. Hu ◽  
P. S. Ho ◽  
M. B. Small ◽  
K. Kelleher
Keyword(s):  
Electron Microscope ◽  
Steady State ◽  
Scanning Electron Microscope ◽  
Drift Velocity ◽  
Current Density ◽  
Electron Microprobe ◽  
Temperature Range ◽  
Final Steady State ◽  
Current Densities ◽  
Scanning Electron

ABSTRACTThe electromigration drift velocity of Al in Al(3wt.% Si), Al(2wt.%Cu), and Al(2wt.%Cu,3wt.%Si) was measured in a temperature range 133 to 220 °C with current densities of 1.0 to 1.5×106A/cm2. In Al(3wt.% Si), a significant Al depletion at the cathode end and accumulation at the anode end of stripe were observed within a few hours at 1.5×106A/cm2 and 200°C. In addition, local hillocks and voids along the metal lines were observed. For Al(Cu,Si), the Al drift velocity was slowed down by Cu addition. The majority of hillocks started to grow at a distance about 6 μm away from the cathode end with current density of 1.5×106 A/cm2. The drift velocity of Al in Al(Cu,Si) was found to be a function of time starting with an initial low value and increasing to a an final steady-state value. The behavior was attributed to the migration of Cu and dissolution of Al2Cu precipitates. The activation energies of the depletion 3 Aμm of Al(2%,Cu, 3%Si) was determined to be 0.90±02 eV. The dissolution and growth of A12Cu in the tested samples of Ti/Al(2%Cu)/Ti/TiN were observed using the scanning electron microscope and an electron microprobe.

scholarly journals Perubahan Mikrostruktur Beton Akibat Agresi Asam Sulfat

2016 ◽  
Vol 2 (2) ◽  
Author(s):  
Faisal Rizal ◽  
Hanif Hanif
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Capillary Pressure ◽  
Life Time ◽  
X Ray ◽  
Mercury Injection ◽  
Mercury Injection Capillary Pressure ◽  
Scanning Electron

Life time (umur layan) struktur beton yang berada dilingkungan yang korosif sampai saat ini masih menjadi permasalahan yang besar. Salah satu permasalahan tersebut adalah terjadi penurunan kuat tekan beton pada umur 56 hari sebesar 8,17% akibat adanya agresi asam sulfat, penurunan ini terjadi seiring dengan adanya perubahan pada mikrostruktur beton. Hal ini dikarenakan terbentuknya senyawa gypsum (Ca SO4 .2H2O) dan ettringite (Ca6Al2SO43OH2 . 25H2O) sehingga terjadi microcrack dan beton menjadi lebih porous. Hasil pengujian X-Ray Difractometer, Scanning Electron Microscope dan Mercury Injection Capillary Pressure pada penelitian ini memperlihatkan adanya perubahan-perubahan yang terjadi pada mikrostruktur beton akibat agresi asam sulfat.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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