In situ study of thin film growth by internal stress measurement under ultrahigh vacuum conditions: Silver and copper under the influence of oxygen

1986 ◽  
Vol 142 (1) ◽  
pp. 65-76 ◽  
Author(s):  
R. Abermann ◽  
R. Koch
Keyword(s):  
Thin Film ◽  
Internal Stress ◽  
Film Growth ◽  
Stress Measurement ◽  
Ultrahigh Vacuum ◽  
Thin Film Growth ◽  
In Situ Study ◽  
Internal Stress Measurement

In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction

2007 ◽  
Vol 126 (1) ◽  
pp. 332-337 ◽  
Author(s):  
R MARTINS ◽  
N SCHELL ◽  
R SILVA ◽  
L PEREIRA ◽  
K MAHESH ◽  
...  
Keyword(s):  
Thin Film ◽  
Intermediate Layer ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Study

In situ study of a strontium β-diketonate precursor for thin-film growth by atomic layer epitaxy

1994 ◽  
Vol 4 (8) ◽  
pp. 1239-1244 ◽  
Author(s):  
Jaan Aarik ◽  
Aleks Aidla ◽  
Andres Jaek ◽  
Markku Leskelä ◽  
Lauri Niinistö
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Atomic Layer ◽  
Thin Film Growth ◽  
Atomic Layer Epitaxy ◽  
In Situ Study

In situ work function study of oxidation and thin film growth on clean surfaces

1999 ◽  
Vol 433-435 ◽  
pp. 770-774 ◽  
Author(s):  
I.D Baikie ◽  
U Petermann ◽  
B Lägel
Keyword(s):  
Thin Film ◽  
Work Function ◽  
Film Growth ◽  
Thin Film Growth ◽  
Function Study

Soft x-ray spectrometer for in situ monitoring of thin-film growth

1994 ◽  
Author(s):  
Per Skytt ◽  
Carl J. Englund ◽  
Nial Wassdahl ◽  
Derrick C. Mancini ◽  
Joseph Nordgren
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Thin Film Growth ◽  
In Situ Monitoring ◽  
X Ray
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