Theoretical determination of temperature distributions for non-destructive depth profiling of opaque solids

1991 ◽  
Vol 15 (1) ◽  
pp. 57-68
Author(s):  
Baki Koyuncu
Keyword(s):  
Depth Profiling ◽  
Theoretical Determination ◽  
Temperature Distributions ◽  
Non Destructive

Computer Simulation and Depth Profiling of Light Nuclei by Nuclear Techniques

2010 ◽  
Vol 107 ◽  
pp. 123-128 ◽  
Author(s):  
J.A.R. Pacheco de Carvalho ◽  
C.F.F.P.R. Pacheco ◽  
A.D. Reis
Keyword(s):  
Computer Simulation ◽  
Elastic Scattering ◽  
Nuclear Reactions ◽  
Depth Profiling ◽  
Thick Target ◽  
Light Nuclei ◽  
Target Composition ◽  
Nuclear Techniques ◽  
Non Destructive

This article involves computer simulation and surface analysis by nuclear techniques, which are non-destructive. The “energy method of analysis” for nuclear reactions and elastic scattering is used. Energy spectra are computer simulated and compared with experimental data, giving target composition and concentration profile information. The method is successfully applied to depth profiling of 18O and 12C nuclei in thick targets through the 18O(p,α0)15N and 12C(d,p0)13C reactions, respectively. Similarly, elastic scattering of (4He)+ ions is applied to determination of concentration profiles of O and Al for a thick target containing a thin film of aluminium oxide.

Determination of 3-Dimensional Defect Structures in Gallium Arsenide Epilayers on Silicon Using White Beam Synchrotron Radiation Topography in both Transmission and Grazing Bragg-Laue Geometry.

1989 ◽  
Vol 160 ◽  
Author(s):  
M. Dudley ◽  
G.-D. Yao ◽  
J. Wu ◽  
H.-Y. Liu ◽  
Y.C. Kao
Keyword(s):  
Dislocation Line ◽  
Depth Profiling ◽  
Threading Dislocations ◽  
Defect Structures ◽  
3 Dimensional ◽  
White Beam ◽  
Depth Analysis ◽  
Interfacial Dislocations ◽  
Non Destructive

AbstractWhite beam synchrotron topography in both transmission and grazing Bragg-Laue geometries has been used to reveal the 3-dimensional defect structure in MBE grown GaAs epilayers on Si. Defects observed and characterized include substrate threading dislocations and interfacial dislocations. Dislocation line direction and Burgers vector analysis was performed on transmission topographs. The relationship between substrate threading dislocations and interfacial dislocations was established. In the grazing Bragg-Laue case, manipulation of geometry enabled depth profiling of defect structures in the epilayer. The position of the interfacial dislocations was verified by correlating penetration depth analysis with the visibility of the dislocations under different diffraction conditions.This technique affords a rapid and non-destructive way of quantitatively characterizing processing induced damage in such systems.

Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

1983 ◽  
Vol 27 ◽  
Author(s):  
L. Salamanca-Riba ◽  
B.S. Elman ◽  
M.S. Dresselhaus ◽  
T. Venkatesan
Keyword(s):  
Experimental Error ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Intercalation Compounds ◽  
Graphite Intercalation Compounds ◽  
X Ray ◽  
Donor And Acceptor ◽  
Graphite Intercalation ◽  
Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

Application of EDS Technique for OSP Film Thickness Measurement

2006 ◽  
Author(s):  
Prong Kongsubto ◽  
Sirarat Kongwudthiti
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Joint Strength ◽  
Critical Factor ◽  
Thickness Measurement ◽  
Ic Manufacturing ◽  
And Control ◽  
Film Thickness Measurement ◽  
Non Destructive

Abstract Organic solderability preservatives (OSPs) pad is one of the pad finishing technologies where Cu pad is coated with a thin film of an organic material to protect Cu from oxidation during storage and many processes in IC manufacturing. Thickness of OSP film is a critical factor that we have to consider and control in order to achieve desirable joint strength. Until now, no non-destructive technique has been proposed to measure OSP thickness on substrate. This paper reports about the development of EDS technique for estimating OSP thickness, starting with determination of the EDS parameter followed by establishing the correlation between C/Cu ratio and OSP thickness and, finally, evaluating the accuracy of the EDS technique for OSP thickness measurement. EDS quantitative analysis was proved that it can be utilized for OSP thickness estimation.

scholarly journals Non-Destructive Micromagnetic Determination of Hardness and Case Hardening Depth Using Linear Regression Analysis and Artificial Neural Networks

Metals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 18
Author(s):  
Rahel Jedamski ◽  
Jérémy Epp
Keyword(s):  
Neural Network ◽  
Neural Networks ◽  
Regression Analysis ◽  
Artificial Neural Networks ◽  
Linear Regression ◽  
Linear Regression Analysis ◽  
Case Hardening ◽  
Artificial Neural ◽  
Non Destructive

Non-destructive determination of workpiece properties after heat treatment is of great interest in the context of quality control in production but also for prevention of damage in subsequent grinding process. Micromagnetic methods offer good possibilities, but must first be calibrated with reference analyses on known states. This work compares the accuracy and reliability of different calibration methods for non-destructive evaluation of carburizing depth and surface hardness of carburized steel. Linear regression analysis is used in comparison with new methods based on artificial neural networks. The comparison shows a slight advantage of neural network method and potential for further optimization of both approaches. The quality of the results can be influenced, among others, by the number of teaching steps for the neural network, whereas more teaching steps does not always lead to an improvement of accuracy for conditions not included in the initial calibration.

Theoretical progress in the H2+ molecular ion: towards electron to proton mass ratio determinationThis paper was presented at the International Conference on Precision Physics of Simple Atomic Systems, held at École de Physique, les Houches, France, 30 May – 4 June, 2010.

2011 ◽  
Vol 89 (1) ◽  
pp. 103-107 ◽  
Author(s):  
J.-Ph. Karr ◽  
L. Hilico ◽  
V. I. Korobov
Keyword(s):  
High Resolution ◽  
Mass Ratio ◽  
Theoretical Determination ◽  
Atomic Systems ◽  
The Road ◽  
Theoretical Progress ◽  
Proton Mass ◽  
Accuracy Level ◽  
Ratio Determination

High resolution ro-vibrational spectroscopy of H 2+ or HD+ can lead to a significantly improved determination of the electron to proton mass ratio me/mp if the theoretical determination of transition frequencies becomes sufficiently accurate. We report on recent theoretical progress in the description of the hyperfine structure of H 2+ , as well as first steps in the evaluation of radiative corrections at order mα7. Completion of the latter calculation should allow us to reach the projected 10−10 accuracy level and open the road to mass ratio determination.

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