Analysis of rolling contact fatigued microstructure using focused ion beam sputtering and transmission electron microscopy observation

New and interesting physical phenomena are being observed via thin film depositions using a variety of processing techniques in different material systems. The present study describes Pb-Zr-Ti-O pyrochlore thin films which were deposited onto (100) MgO substrates using an ion beam sputtering technique. These films are of interest because of their unique microstructure which may provide valuable information in better understanding the epitaxial growth of thin films. Characterization were performed using conventional transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM). Special TEM sample preparation procedures have been developed, which will be reported elsewhere.The as-deposited pyrochlore thin film is near epitaxial and is oriented with both (100) and (111) parallel to the (100) of the MgO substrate. Figure 1(a) shows the selected area diffraction pattern (SADP) of the pyrochlore thin film taken parallel to the [100] zone axis of the substrate.

Download Full-text

Size Effect in Nix(MgO)100-X Nanocomposites

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.168-169.361 ◽

2010 ◽

Vol 168-169 ◽

pp. 361-364 ◽

Cited By ~ 1

Author(s):

A.A. Grebennikov ◽

O.V. Stognei

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Curie Temperature ◽

Size Effect ◽

Room Temperature ◽

Ion Beam ◽

Ion Beam Sputtering ◽

Nanostructured Composite ◽

Transmission Electron ◽

Beam Sputtering

The possibility of obtaining a nanostructured composite in the Ni-Mg-O system by ion-beam sputtering has been investigated. The structural, magnetic and magnetoresistive properties of obtained samples have been investigated in a wide concentration range. The presence of the nanostructure in the obtained samples with Ni nanogranules (2-3 nm) has been confirmed by transmission electron microscopy. There is no observation of any magnetic or magnetoresistive properties at room temperature in the Nix(MgO)100-x composites. These properties were observed at 77 K. The obtained data mean that Curie temperature of the Ni nanogranules is lower then 298 K. This is due to small size of nickel granules and low value of exchange interaction energy in nickel.

Download Full-text

In-Situ Transmission Electron Microscopy for Analysis of Ion-Beam-Growth Processes

MRS Proceedings ◽

10.1557/proc-388-405 ◽

1995 ◽

Vol 388 ◽

Author(s):

Vladimir V. Pankov ◽

Nikolai E. Levchuk ◽

Anatoly P. Dostanko

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Beam ◽

Ion Beam Sputtering ◽

Transmission Electron Microscopy Analysis ◽

Ion Beam Etching ◽

Transmission Electron ◽

Beam Sputtering ◽

Electron Microscopy Analysis

AbstractTwo types of systems for in situ transmission electron microscopy analysis of ion-beam etching, ion-beam sputtering and ion-beam assisted deposition are reported. their design, operational features and some applications are presented. Radiation-stimulated diffusion in Mo-Si heterostructure, early growth of ion-beam sputtered in-Sn, in-Sn-O, ZnS:Mn films and recrystallization of ln-Sn-O films during vacuum post-annealing are studied.

Download Full-text