Corrigendum to “Three-dimensional characterization of fatigue cracks in Ti-6246 using X-ray tomography and electron backscatter diffraction” [Acta Materialia 57 (2009) 5834–5847]

2010 ◽  
Vol 58 (4) ◽  
pp. 1466
Author(s):  
S. Birosca ◽  
J.Y. Buffiere ◽  
F.A. Garcia-Pastor ◽  
M. Karadge ◽  
L. Babout ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Fatigue Cracks ◽  
Three Dimensional ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Three-dimensional characterization of fatigue cracks in Ti-6246 using X-ray tomography and electron backscatter diffraction

2009 ◽  
Vol 57 (19) ◽  
pp. 5834-5847 ◽  
Author(s):  
S. Birosca ◽  
J.Y. Buffiere ◽  
F.A. Garcia-Pastor ◽  
M. Karadge ◽  
L. Babout ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Fatigue Cracks ◽  
Three Dimensional ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Shape Recovery and ε - γ Transformation in Fe29Mn7Si5Cr SMA

2008 ◽  
Vol 59 ◽  
pp. 86-91 ◽  
Author(s):  
Nele Van Caenegem ◽  
Kim Verbeken ◽  
Roumen H. Petrov ◽  
N.M. van der Pers ◽  
Yvan Houbaert
Keyword(s):  
Martensitic Transformation ◽  
Shape Memory ◽  
Shape Recovery ◽  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Shape Memory Behaviour ◽  
Backscatter Diffraction

The shape memory behaviour of a Fe29Mn7Si5Cr based alloy has been investigated. Characterization of the martensitic transformation and the different structural constituents was performed using optical microscopy, X-ray diffraction (XRD) methods and electron backscatter diffraction (EBSD). The transformation temperatures and the shape recovery were determined by dilatometry on prestrained samples.

scholarly journals Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

2013 ◽  
Vol 46 (4) ◽  
pp. 1145-1150 ◽  
Author(s):  
Melanie Syha ◽  
Andreas Trenkle ◽  
Barbara Lödermann ◽  
Andreas Graff ◽  
Wolfgang Ludwig ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Data Reconstruction ◽  
Characterization Methods ◽  
Diffraction Contrast ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Tomography Data ◽  
Good Agreement

Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.

Application of Electron Backscatter Diffraction for Crystallographic Characterization of Tin Whiskers

2012 ◽  
Vol 18 (4) ◽  
pp. 876-884 ◽  
Author(s):  
Joseph R. Michael ◽  
Bonnie B. McKenzie ◽  
Donald F. Susan
Keyword(s):  
Electron Backscatter Diffraction ◽  
Growth Direction ◽  
Tin Whiskers ◽  
Physical Growth ◽  
Final Choice ◽  
Advantages And Disadvantages ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractUnderstanding the growth of whiskers or high aspect ratio features on substrates can be aided when the crystallography of the feature is known. This study has evaluated three methods that utilize electron backscatter diffraction (EBSD) for the determination of the crystallographic growth direction of an individual whisker. EBSD has traditionally been a technique applied to planar, polished samples, and thus the use of EBSD for out-of-surface features is somewhat more difficult and requires additional steps. One of the methods requires the whiskers to be removed from the substrate resulting in the loss of valuable physical growth relationships between the whisker and the substrate. The other two techniques do not suffer this disadvantage and provide the physical growth information as well as the crystallographic growth directions. The final choice of method depends on the information required. The accuracy and the advantages and disadvantages of each method are discussed.

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