Three-dimensional investigation of grain boundary–twin interactions in a Mg AZ31 alloy by electron backscatter diffraction and continuum modeling

2013 ◽  
Vol 61 (20) ◽  
pp. 7679-7692 ◽  
Author(s):  
A. Fernández ◽  
A. Jérusalem ◽  
I. Gutiérrez-Urrutia ◽  
M.T. Pérez-Prado
Keyword(s):  
Grain Boundary ◽  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Az31 Alloy ◽  
Continuum Modeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

2013 ◽  
Vol 46 (4) ◽  
pp. 1145-1150 ◽  
Author(s):  
Melanie Syha ◽  
Andreas Trenkle ◽  
Barbara Lödermann ◽  
Andreas Graff ◽  
Wolfgang Ludwig ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Data Reconstruction ◽  
Characterization Methods ◽  
Diffraction Contrast ◽  
Ebsd Data ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Tomography Data ◽  
Good Agreement

Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.

scholarly journals Visualization of the Bainite Fine Structure Using EBSD and Euler Angles

2019 ◽  
Vol 1 (1) ◽  
pp. 11
Author(s):  
Yu.V. Yudin ◽  
A.A. Kuklina ◽  
M.V. Maisuradze ◽  
M.S. Karabanalov
Keyword(s):  
Fine Structure ◽  
Electron Backscatter Diffraction ◽  
Three Dimensional ◽  
Diffraction Method ◽  
Bainitic Steel ◽  
Near Surface ◽  
Steel Microstructure ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Ebsd Method

The electron backscatter diffraction method (EBSD) is widely used to studycrystallographic orientational relationships of the steel microstructure constituentsincluding bainite. Nevertheless the fine structure of bainite (subunits, plates) is notinvestigated by this method. In this paper we propose a technique for visualizing ofthe structure of a bainitic steel near-surface layer using the values of Euler anglesobtained by EBSD method. A three-dimensional picture of the bainite fine structure ofthe HY-TUF steel obtained by the proposed technique is in

scholarly journals Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies

2000 ◽  
Vol 6 (S2) ◽  
pp. 940-941
Author(s):  
A.J. Schwartz ◽  
M. Kumar ◽  
P.J. Bedrossian ◽  
W.E. King
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Thermomechanical Processing ◽  
Electron Backscatter Diffraction ◽  
Grain Boundary Character Distribution ◽  
Atomic Force ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Network Engineering ◽  
Backscatter Diffraction

Grain boundary network engineering is an emerging field that encompasses the concept that modifications to conventional thermomechanical processing can result in improved properties through the disruption of the random grain boundary network. Various researchers have reported a correlation between the grain boundary character distribution (defined as the fractions of “special” and “random” grain boundaries) and dramatic improvements in properties such as corrosion and stress corrosion cracking, creep, etc. While much early work in the field emphasized property improvements, the opportunity now exists to elucidate the underlying materials science of grain boundary network engineering. Recent investigations at LLNL have coupled automated electron backscatter diffraction (EBSD) with transmission electron microscopy (TEM)5 and atomic force microscopy (AFM) to elucidate these fundamental mechanisms.An example of the coupling of TEM and EBSD is given in Figures 1-3. The EBSD image in Figure 1 reveals “segmentation” of boundaries from special to random and random to special and low angle grain boundaries in some grains, but not others, resulting from the 15% compression of an Inconel 600 polycrystal.

Determination of crystal phase from an electron backscatter diffraction pattern

2009 ◽  
Vol 42 (2) ◽  
pp. 234-241 ◽  
Author(s):  
David J. Dingley ◽  
Stuart I. Wright
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Hexagonal Phase ◽  
Three Dimensional ◽  
Lattice Parameters ◽  
Crystal Phase ◽  
Test Case ◽  
Electron Backscatter ◽  
Ebsd Pattern ◽  
Backscatter Diffraction

Electron backscatter diffraction (EBSD) is a scanning electron microscope-based technique principally used for the determination and mapping of crystal orientation. This work describes an adaptation of the EBSD technique into a potential tool for crystal phase determination. The process can be distilled into three steps: (1) extracting a triclinic cell from a single EBSD pattern, (2) identifying the crystal symmetry from an examination of the triclinic cell, and (3) determining the lattice parameters. The triclinic cell is determined by finding the bands passing through two zone axes in the pattern including a band connecting the two. A three-dimensional triclinic unit cell is constructed based on the identified bands. The EBSD pattern is indexed in terms of the triclinic cell thus formed and the crystal orientation calculated. The pattern indexing results in independent multiple orientations due to the symmetry the crystal actually possesses. By examining the relationships between these multiple orientations, the crystal system is established. By comparing simulated Kikuchi bands with the pattern the lattice parameters can be determined. Details of the method are given for a test case of EBSD patterns obtained from the hexagonal phase of titanium.

Application of Electron Backscatter Diffraction to Grain Boundaries

2010 ◽  
Vol 160 ◽  
pp. 39-46 ◽  
Author(s):  
Valerie Randle
Keyword(s):  
Grain Boundary ◽  
Electron Backscatter Diffraction ◽  
Experimental Methodology ◽  
Polycrystalline Materials ◽  
Grain Boundary Engineering ◽  
Network Characteristics ◽  
Grain Boundary Plane ◽  
Electron Backscatter ◽  
Measurement Strategies ◽  
Backscatter Diffraction

The technique of electron backscatter diffraction (EBSD) is ideal for the characterisation of grain boundary networks in polycrystalline materials. In recent years the experimental methodology has evolved to meet the needs of the research community. For example, the capabilities of EBSD have been instrumental in driving forward the topic of ‘grain boundary engineering’. In this paper the current capabilities of EBSD for grain boundary characterisation will be reviewed and illustrated by examples. Topics are measurement strategies based on misorientation statistics, determination of grain boundary plane distributions and grain boundary network characteristics.

Electron backscatter diffraction investigation of local misorientations and orientation gradients in connection with evolution of grain boundary structures in deformed and annealed zirconium. A new approach in grain boundary analysis

2013 ◽  
Vol 46 (2) ◽  
pp. 483-492 ◽  
Author(s):  
Mariusz Jedrychowski ◽  
Jacek Tarasiuk ◽  
Brigitte Bacroix ◽  
Sebastian Wronski
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Grain Orientation ◽  
Electron Backscatter Diffraction ◽  
Lattice Defect ◽  
Line Segments ◽  
Compression Direction ◽  
Electron Backscatter ◽  
Grain Orientation Spread ◽  
Backscatter Diffraction

The main aim of the present work is to study the relation between microstructural features – such as local misorientations, grain orientation gradients and grain boundary structures – and thermomechanical treatment of hexagonal zirconium (Zr702α). Electron backscatter diffraction (EBSD) topological maps are used to analyze the aforementioned material parameters at the early stages of plastic deformation imposed by channel-die compression, as well as at a partial recrystallization state achieved by brief annealing. The evolution of local misorientations and orientation gradients is investigated using the so-called kernel average misorientation (KAM) and grain orientation spread (GOS) statistics implemented in the TSLOIMdata analysis software [TexSEM Laboratories (2004), Draper, UT, USA]. In the case of grain boundaries (GBs) a new method of analysis is presented. As an addition to the classical line segments method, where the grain boundary is represented by line segments that separate particular pairs of neighboring points, an approach that focuses on grain boundary areas is proposed. These areas are represented by sets of EBSD points, which are specially selected from a modified calculation procedure for the KAM. Different evolution mechanisms of intragranular boundaries, low-angle grain boundaries and high-angle grain boundaries are observed depending on the compression direction. The observed differences are consistent with the results obtained from KAM and GOS analysis. It is also concluded that the proposed method of grain boundary characterization seems to be promising, as it provides new and interesting analysis tools such as textures, absolute fractions and other EBSD statistics of the GB areas. This description may be more compatible with a real deformed microstructure, especially for grain boundaries with very small misorientation, which are indeed clustered areas of lattice defect accumulation.

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