Structural symmetry evolution in surface and interface of SrRuO3 thin films

2021 ◽  
pp. 149574
Author(s):  
Chang Jae Roh ◽  
Jeong Rae Kim ◽  
Sungjoon Park ◽  
Yeong Jae Shin ◽  
Bohm-Jung Yang ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Symmetry ◽  
Surface And Interface

Structural symmetry ofYD3epitaxial thin films

2000 ◽  
Vol 61 (19) ◽  
pp. 12701-12704 ◽  
Author(s):  
T. J. Udovic ◽  
Q. Huang ◽  
R. W. Erwin ◽  
B. Hjörvarsson ◽  
R. C. C. Ward
Keyword(s):  
Thin Films ◽  
Structural Symmetry

scholarly journals Interface and surface stabilization of the polarization in ferroelectric thin films

2020 ◽  
Vol 117 (46) ◽  
pp. 28589-28595 ◽  
Author(s):  
Chiara Gattinoni ◽  
Nives Strkalj ◽  
Rea Härdi ◽  
Manfred Fiebig ◽  
Morgan Trassin ◽  
...  
Keyword(s):  
Thin Films ◽  
Density Functional ◽  
Second Harmonic ◽  
Information Storage ◽  
Digital Information ◽  
Polarization Direction ◽  
Strontium Ruthenate ◽  
Precise Control ◽  
Surface And Interface ◽  
Bottom Interface

Ferroelectric perovskites present a switchable spontaneous polarization and are promising energy-efficient device components for digital information storage. Full control of the ferroelectric polarization in ultrathin films of ferroelectric perovskites needs to be achieved in order to apply this class of materials in modern devices. However, ferroelectricity itself is not well understood in this nanoscale form, where interface and surface effects become particularly relevant and where loss of net polarization is often observed. In this work, we show that the precise control of the structure of the top surface and bottom interface of the thin film is crucial toward this aim. We explore the properties of thin films of the prototypical ferroelectric lead titanate (PbTiO3) on a metallic strontium ruthenate (SrRuO3) buffer using a combination of computational (density functional theory) and experimental (optical second harmonic generation) methods. We find that the polarization direction and strength are influenced by chemical and electronic processes occurring at the epitaxial interface and at the surface. The polarization is particularly sensitive to adsorbates and to surface and interface defects. These results point to the possibility of controlling the polarization direction and magnitude by engineering specific interface and surface chemistries.

Surface and Interface Analysis of LiCoO2 and LiPON Thin Films by Photoemission: Implications for Li-Ion Batteries

2015 ◽  
Vol 229 (9) ◽  
Author(s):  
René Hausbrand ◽  
André Schwöbel ◽  
Wolfram Jaegermann ◽  
Markus Motzko ◽  
David Ensling
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Charge Compensation ◽  
Compensation Mechanism ◽  
Li Ion Batteries ◽  
Li Ion Battery ◽  
Interface Formation ◽  
Interface Analysis ◽  
Surface And Interface ◽  
Li Ion

AbstractThin film technology is applied in different fields of Li-ion battery research and development, such as the fabrication of thin film cells and model electrodes. Data obtained by surface and interface analysis of thin films provides important insights into fundamental processes such as charge compensation mechanism or interface formation. In this overview, we present the analysis of LiCoO

Surface and Interface Analysis of LiCoO 2 and LiPON Thin Films by Photoemission: Implications for Li-Ion Batteries

ENERGYO ◽  
2018 ◽  
Author(s):  
René Hausbrand ◽  
André Schwöbel ◽  
Wolfram Jaegermann ◽  
Markus Motzko ◽  
David Ensling
Keyword(s):  
Thin Films ◽  
Li Ion Batteries ◽  
Interface Analysis ◽  
Surface And Interface ◽  
Li Ion

Perovskite crystallization of sol-gel processed (Pb,La0.06,Gd0.02)(Zr0.65,Ti0.35)O3 thin films: Dielectric, ferroelectric and optical properties

2002 ◽  
Vol 17 (10) ◽  
pp. 2652-2659 ◽  
Author(s):  
Reji Thomas ◽  
Shoichi Mochizuki ◽  
Toshiyuki Mihara ◽  
Tadashi Ishida
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Sol Gel ◽  
Band Gap Energy ◽  
Elemental Distribution ◽  
Surface And Interface ◽  
Si Substrates ◽  
Dielectric Constant And Loss ◽  
Direct Band ◽  
Free Films

Ferroelectric lead lanthanum gadolinium zirconium titanate (PLGZT) thin films were prepared by the sol-gel spin coating technique. Three-step preannealing heat treatment was employed to prepare crack-free films. Various types of substrates, and the effects of the seed layer and annealing temperature on the perovskite crystallization were studied. Phase-pure perovskite crystallization was obtained by annealing the films on PbTiO3/Pt/Ti/Si substrates at 700 °C for 30 min. The Auger electron spectroscopy depth profile showed uniform elemental distribution along the thickness except the surface and interface regions. Dielectric constant and loss tangent at 10 kHz were 1000 and 0.06, respectively. Remanent polarization (Pr) and coercive field (Ec) were 11.8 μC/cm2 and 71 kV/cm, respectively. The direct band gap energy was 3.55 eV for the amorphous films. The refractive index and extinction coefficient at 610 nm for amorphous PLGZT films were 2.14 and 0.0028, respectively. The dispersion of the refractive index was interpreted in terms of a single electronic oscillator at 6.06 eV.

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