scholarly journals Dimethyl ether aromatization over nanosized zeolites: Effect of preparation method and zinc modification on catalyst performance

2021 ◽  
Vol 149 ◽  
pp. 106176
Author(s):  
K.B. Golubev ◽  
K. Zhang ◽  
X. Su ◽  
N.V. Kolesnichenko ◽  
W. Wu
2013 ◽  
Vol 26 (1) ◽  
pp. 77-82 ◽  
Author(s):  
Xue Zhang ◽  
Yu‐ping Li ◽  
Song‐bai Qiu ◽  
Tie‐jun Wang ◽  
Ming‐yue Ding ◽  
...  

2016 ◽  
Vol 6 (9) ◽  
pp. 2975-2983 ◽  
Author(s):  
Zhenzhou Zhang ◽  
Qingde Zhang ◽  
Lingyu Jia ◽  
Wenfeng Wang ◽  
Tao Zhang ◽  
...  

A new preparation method for MoO3–SnO2 catalysts precipitated by HNO3 was developed to selectively synthesize industrially useful chemicals formaldehyde and methyl formate via oxidation of dimethyl ether.


Fuel ◽  
2014 ◽  
Vol 121 ◽  
pp. 173-177 ◽  
Author(s):  
Zhuo Li ◽  
Jianqing Li ◽  
Meng Dai ◽  
Yongqiang Liu ◽  
Dezhi Han ◽  
...  

Author(s):  
R. W. Anderson ◽  
D. L. Senecal

A problem was presented to observe the packing densities of deposits of sub-micron corrosion product particles. The deposits were 5-100 mils thick and had formed on the inside surfaces of 3/8 inch diameter Zircaloy-2 heat exchanger tubes. The particles were iron oxides deposited from flowing water and consequently were only weakly bonded. Particular care was required during handling to preserve the original formations of the deposits. The specimen preparation method described below allowed direct observation of cross sections of the deposit layers by transmission electron microscopy.The specimens were short sections of the tubes (about 3 inches long) that were carefully cut from the systems. The insides of the tube sections were first coated with a thin layer of a fluid epoxy resin by dipping. This coating served to impregnate the deposit layer as well as to protect the layer if subsequent handling were required.


Author(s):  
Toshihiko Takita ◽  
Tomonori Naguro ◽  
Toshio Kameie ◽  
Akihiro Iino ◽  
Kichizo Yamamoto

Recently with the increase in advanced age population, the osteoporosis becomes the object of public attention in the field of orthopedics. The surface topography of the bone by scanning electron microscopy (SEM) is one of the most useful means to study the bone metabolism, that is considered to make clear the mechanism of the osteoporosis. Until today many specimen preparation methods for SEM have been reported. They are roughly classified into two; the anorganic preparation and the simple preparation. The former is suitable for observing mineralization, but has the demerit that the real surface of the bone can not be observed and, moreover, the samples prepared by this method are extremely fragile especially in the case of osteoporosis. On the other hand, the latter has the merit that the real information of the bone surface can be obtained, though it is difficult to recognize the functional situation of the bone.


Author(s):  
Jian-Shing Luo ◽  
Hsiu Ting Lee

Abstract Several methods are used to invert samples 180 deg in a dual beam focused ion beam (FIB) system for backside milling by a specific in-situ lift out system or stages. However, most of those methods occupied too much time on FIB systems or requires a specific in-situ lift out system. This paper provides a novel transmission electron microscopy (TEM) sample preparation method to eliminate the curtain effect completely by a combination of backside milling and sample dicing with low cost and less FIB time. The procedures of the TEM pre-thinned sample preparation method using a combination of sample dicing and backside milling are described step by step. From the analysis results, the method has applied successfully to eliminate the curtain effect of dual beam FIB TEM samples for both random and site specific addresses.


Author(s):  
Chuan Zhang ◽  
Jane Y. Li ◽  
John Aguada ◽  
Howard Marks

Abstract This paper introduces a novel sample preparation method using plasma focused ion-beam (pFIB) milling at low grazing angle. Efficient and high precision preparation of site-specific cross-sectional samples with minimal alternation of device parameters can be achieved with this method. It offers the capability of acquiring a range of electrical characteristic signals from specific sites on the cross-section of devices, including imaging of junctions, Fins in the FinFETs and electrical probing of interconnect metal traces.


Sign in / Sign up

Export Citation Format

Share Document