Mechanical and electrical behavior of carbon fiber structural capacitors: Effects of delamination and interlaminar damage

2017 ◽  
Vol 166 ◽  
pp. 38-48 ◽  
Author(s):  
Zhenglai Shen ◽  
Hongyu Zhou

2009 ◽  
Vol 21 (3) ◽  
pp. 233-242 ◽  
Author(s):  
Y. Ngabonziza ◽  
H. Ergun ◽  
R. Kuznetsova ◽  
J. Li ◽  
B.M. Liaw ◽  
...  


2019 ◽  
Vol 9 (11) ◽  
pp. 2390 ◽  
Author(s):  
Qian Zhao ◽  
Kai Zhang ◽  
Shuang Zhu ◽  
Hanyang Xu ◽  
Dianguo Cao ◽  
...  

Carbon fiber reinforced polymer (CFRP) plays an important role in many fields, especially in aviation and civil industries. The electrical conductivity of CFRP is critical for its electrical behavior, such as its lightning strike vulnerability, electromagnetic shielding ability, and potential uses for self-sensing. In addition, the electrical conductivity is related to the mechanical integrity. Therefore, electrical properties can be measured as an indication when detecting delamination and other defects in CFRP. This review provides a comprehensive basis for readers to grasp recent research progresses on electrical behaviors of CFRP.



2015 ◽  
Vol 18 (6) ◽  
pp. 1209-1216 ◽  
Author(s):  
Williane Oliveira de Souza ◽  
Kledermon Garcia ◽  
Christian Frederico de Avila Von Dollinger ◽  
Luiz Claudio Pardini




Author(s):  
N.-H. Cho ◽  
S. McKernan ◽  
C.B. Carter ◽  
K. Wagner

Interest has recently increased in the possibility of growing III-V compounds epitactically on non-polar substrates to produce device quality material. Antiphase boundaries (APBs) may then develop in the GaAs epilayer because it has sphalerite structure (face-centered cubic with a two-atom basis). This planar defect may then influence the electrical behavior of the GaAs epilayer. The orientation of APBs and their propagation into GaAs epilayers have been investigated experimentally using both flat-on and cross-section transmission electron microscope techniques. APBs parallel to (110) plane have been viewed at the atomic resolution and compared to simulated images.Antiphase boundaries were observed in GaAs epilayers grown on (001) Ge substrates. In the image shown in Fig.1, which was obtained from a flat-on sample, the (110) APB planes can be seen end-on; the faceted APB is visible because of the stacking fault-like fringes arising from a lattice translation at this interface.



Author(s):  
Hong-Ming Lin ◽  
C. H. Liu ◽  
R. F. Lee

Polyetheretherketone (PEEK) is a crystallizable thermoplastic used as composite matrix materials in application which requires high yield stress, high toughness, long term high temperature service, and resistance to solvent and radiation. There have been several reports on the crystallization behavior of neat PEEK and of CF/PEEK composite. Other reports discussed the effects of crystallization on the mechanical properties of PEEK and CF/PEEK composites. However, these reports were all concerned with the crystallization or melting processes at or close to atmospheric pressure. Thus, the effects of high pressure on the crystallization of CF/PEEK will be examined in this study.The continuous carbon fiber reinforced PEEK (CF/PEEK) laminate composite with 68 wt.% of fibers was obtained from Imperial Chemical Industry (ICI). For the high pressure experiments, HIP was used to keep these samples under 1000, 1500 or 2000 atm. Then the samples were slowly cooled from 420 °C to 60 °C in the cooling rate about 1 - 2 degree per minute to induce high pressure crystallization. After the high pressure treatment, the samples were scanned in regular DSC to study the crystallinity and the melting temperature. Following the regular polishing, etching, and gold coating of the sample surface, the scanning electron microscope (SEM) was used to image the microstructure of the crystals. Also the samples about 25mmx5mmx3mm were prepared for the 3-point bending tests.



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