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High-k ZrO2 dielectric thin films on GaAs semiconductor with reduced regrowth of native oxides by atomic layer deposition
Chemical Physics Letters
◽
10.1016/j.cplett.2013.08.012
◽
2013
◽
Vol 583
◽
pp. 74-79
◽
Cited By ~ 9
Author(s):
R.B. Konda
◽
C. White
◽
J. Smak
◽
R. Mundle
◽
M. Bahoura
◽
...
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Dielectric Thin Films
◽
Native Oxides
◽
Layer Deposition
◽
High K
Download Full-text
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Cited By
References
Thermodynamics and kinetic behaviors of thickness-dependent crystallization in high-k thin films deposited by atomic layer deposition
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
◽
10.1116/1.4903946
◽
2015
◽
Vol 33
(1)
◽
pp. 01A140
◽
Cited By ~ 6
Author(s):
Xianglong Nie
◽
Fei Ma
◽
Dayan Ma
◽
Kewei Xu
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Layer Deposition
◽
High K
Download Full-text
Carboxylic Acids as Oxygen Supplying Agents for Atomic Layer Deposition of High-k Thin Films
ECS Meeting Abstracts
◽
10.1149/ma2008-02/24/1918
◽
2008
◽
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Carboxylic Acids
◽
Atomic Layer
◽
Layer Deposition
◽
High K
Download Full-text
Liquid Injection Atomic Layer Deposition of Metallic Ru Thin Films from Ru(tmhd)3 and of High-k TiO2 Thin Films from Ti(O-i-Pr)2(tmhd)2
ECS Meeting Abstracts
◽
10.1149/ma2009-02/23/2039
◽
2009
◽
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Tio2 Thin Films
◽
Layer Deposition
◽
High K
◽
Liquid Injection
Download Full-text
High-k Thin Films by Atomic Layer Deposition for Energy and Information Storage
Journal of the Korean Society for Precision Engineering
◽
10.7736/kspe.2018.35.12.1131
◽
2018
◽
Vol 35
(12)
◽
pp. 1131-1136
Author(s):
Jihwan An
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Information Storage
◽
Layer Deposition
◽
High K
Download Full-text
Electrical Characteristics of HfO2-Al2O3 Dielectric Thin Films Grown by Atomic-Layer-Deposition in Metal-Insulator-Metal Capacitor Configuration
ECS Meeting Abstracts
◽
10.1149/ma2007-01/17/816
◽
2007
◽
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Electrical Characteristics
◽
Metal Insulator
◽
Dielectric Thin Films
◽
Layer Deposition
◽
Metal Insulator Metal
Download Full-text
Effects of surface nature of different semiconductor substrates on the plasma enhanced atomic layer deposition growth of Al2O3gate dielectric thin films
physica status solidi (c)
◽
10.1002/pssc.201510016
◽
2015
◽
Vol 12
(7)
◽
pp. 980-984
◽
Cited By ~ 4
Author(s):
Emanuela Schilirò
◽
Giuseppe Greco
◽
Patrick Fiorenza
◽
Cristina Tudisco
◽
Guglielmo Guido Condorelli
◽
...
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Dielectric Thin Films
◽
Layer Deposition
◽
Semiconductor Substrates
◽
Surface Nature
Download Full-text
A Comparison of O3 and H2O as Oxygen Sources for Atomic Layer Deposition Processing of HfAlOx Thin Films for High-k Dielectric Nanocapacitor Applications
ECS Meeting Abstracts
◽
10.1149/ma2010-01/18/978
◽
2010
◽
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Layer Deposition
◽
High K
◽
High K Dielectric
Download Full-text
Robust SiO2 gate dielectric thin films prepared through plasma-enhanced atomic layer deposition involving di-sopropylamino silane (DIPAS) and oxygen plasma: Application to amorphous oxide thin film transistors
Ceramics International
◽
10.1016/j.ceramint.2017.10.075
◽
2018
◽
Vol 44
(2)
◽
pp. 1556-1565
◽
Cited By ~ 8
Author(s):
Yoo-Jin Choi
◽
Seung-Muk Bae
◽
Jae-Hwan Kim
◽
Eui-Hyun Kim
◽
Hee-Soo Hwang
◽
...
Keyword(s):
Thin Film
◽
Thin Films
◽
Atomic Layer Deposition
◽
Thin Film Transistors
◽
Oxygen Plasma
◽
Gate Dielectric
◽
Atomic Layer
◽
Oxide Thin Film
◽
Dielectric Thin Films
◽
Layer Deposition
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Characterization and electrical properties of high-k GdScO3 thin films grown by atomic layer deposition
Applied Physics A
◽
10.1007/s00339-007-4069-7
◽
2007
◽
Vol 88
(4)
◽
pp. 633-637
◽
Cited By ~ 23
Author(s):
P. Myllymäki
◽
M. Roeckerath
◽
M. Putkonen
◽
S. Lenk
◽
J. Schubert
◽
...
Keyword(s):
Thin Films
◽
Electrical Properties
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Layer Deposition
◽
High K
Download Full-text
A Comparison of O3 and H2O as Oxygen Sources for Atomic Layer Deposition Processing of HfAlOx Thin Films for High-k Dielectric Nanocapacitor Applications
ECS Transactions
◽
10.1149/1.3372567
◽
2019
◽
Vol 28
(2)
◽
pp. 97-108
◽
Cited By ~ 2
Author(s):
Richard Phillips
◽
Eric Eisenbraun
Keyword(s):
Thin Films
◽
Atomic Layer Deposition
◽
Atomic Layer
◽
Layer Deposition
◽
High K
◽
High K Dielectric
Download Full-text
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