X-ray tomographic study of spatial distribution of microinclusions in natural fibrous diamonds

2012 ◽  
Vol 30 ◽  
pp. 37-41 ◽  
Author(s):  
E.S. Kovalenko ◽  
A.A. Shiryaev ◽  
A.A. Kaloyan ◽  
K.M. Podurets
Keyword(s):  
Author(s):  
Auclair Gilles ◽  
Benoit Danièle

During these last 10 years, high performance correction procedures have been developed for classical EPMA, and it is nowadays possible to obtain accurate quantitative analysis even for soft X-ray radiations. It is also possible to perform EPMA by adapting this accurate quantitative procedures to unusual applications such as the measurement of the segregation on wide areas in as-cast and sheet steel products.The main objection for analysis of segregation in steel by means of a line-scan mode is that it requires a very heavy sampling plan to make sure that the most significant points are analyzed. Moreover only local chemical information is obtained whereas mechanical properties are also dependant on the volume fraction and the spatial distribution of highly segregated zones. For these reasons we have chosen to systematically acquire X-ray calibrated mappings which give pictures similar to optical micrographs. Although mapping requires lengthy acquisition time there is a corresponding increase in the information given by image anlysis.


2015 ◽  
Vol 48 (3) ◽  
pp. 786-796 ◽  
Author(s):  
Maheswar Nayak ◽  
P. C. Pradhan ◽  
G. S. Lodha

Element-specific structural analysis at the buried interface of a low electron density contrast system is important in many applied fields. The analysis of nanoscaled Si/B4C buried interfaces is demonstrated using resonant X-ray reflectivity. This technique combines information about spatial modulations of charges provided by scattering, which is further enhanced near the resonance, with the sensitivity to electronic structure provided by spectroscopy. Si/B4C thin-film structures are studied by varying the position of B4C in Si layers. Measured values of near-edge optical properties are correlated with the resonant reflectivity profile to quantify the element-specific composition. It is observed that, although Si/B4C forms a smooth interface, there are chemical changes in the sputtered B4C layer. Nondestructive quantification of the chemical changes and the spatial distribution of the constituents is reported.


1997 ◽  
Vol 297 (2) ◽  
pp. 101-105 ◽  
Author(s):  
Beathe Thu ◽  
Gudmund Skjåk-Bræk ◽  
Fulvio Micali ◽  
Franco Vittur ◽  
Roberto Rizzo

2014 ◽  
Vol 47 (1) ◽  
pp. 60-66 ◽  
Author(s):  
Armin Hoell ◽  
Zoltan Varga ◽  
Vikram Singh Raghuwanshi ◽  
Michael Krumrey ◽  
Christian Bocker ◽  
...  

The formation and growth of nanosized CaF2crystallites by heat treatment of an oxyfluoride glass of composition 7.65Na2O–7.69K2O–10.58CaO–12.5CaF2–5.77Al2O3–55.8SiO2(wt%) was investigated using anomalous small-angle X-ray scattering (ASAXS). A recently developed vacuum version of the hybrid pixel detector Pilatus 1M was used for the ASAXS measurements below the CaK-edge of 4038 eV down to 3800 eV. ASAXS investigation allows the determination of structural parameters such as size and size distribution of nanoparticles and characterizes the spatial distribution of the resonant element, Ca. The method reveals quantitatively that the growing CaF2crystallites are surrounded by a shell of lower electron density. This depletion shell of growing thickness hinders and finally limits the growth of CaF2crystallites. Moreover, in samples that were annealed for 10 h and more, additional very small heterogeneities (1.6 nm diameter) were found.


Results from the Ariel 5 sky survey instrument relating to the properties and the spatial distribution of extragalactic X-ray sources are discussed. The lg N -lg S relation for sources in the 2A catalogue is consistent with a uniform distribution of sources in Euclidean space. In addition, measure­ments of fluctuations in the X-ray background suggest that the Euclidean form of the source counts can be extrapolated to flux levels at least an order of magnitude fainter than the 2A catalogue limit. Information is also available from the optical identification of 2A sources which, through redshift measurements, enables the X-ray luminosity functions of the two main classes of source, namely clusters of galaxies and active galaxies, to be determined. The luminosity functions can be used to calculate the contribution of clusters of galaxies and active galaxies to the diffuse X-ray background in the 2-10 keV range. It is found that cosmological evolution of one or both populations is required to account for the diffuse X-ray background entirely in terms of the integrated emission from these sources.


2019 ◽  
Vol 8 (1) ◽  
pp. 97-111
Author(s):  
Dorothea S. Macholdt ◽  
Jan-David Förster ◽  
Maren Müller ◽  
Bettina Weber ◽  
Michael Kappl ◽  
...  

Abstract. The spatial distribution of transition metal valence states is of broad interest in the microanalysis of geological and environmental samples. An example is rock varnish, a natural manganese (Mn)-rich rock coating, whose genesis mechanism remains a subject of scientific debate. We conducted scanning transmission X-ray microscopy with near-edge X-ray absorption fine-structure spectroscopy (STXM-NEXAFS) measurements of the abundance and spatial distribution of different Mn oxidation states within the nano- to micrometer thick varnish crusts. Such microanalytical measurements of thin and hard rock crusts require sample preparation with minimal contamination risk. Focused ion beam (FIB) slicing was used to obtain ∼100–1000 nm thin wedge-shaped slices of the samples for STXM, using standard parameters. However, while this preparation is suitable for investigating element distributions and structures in rock samples, we observed artifactual modifications of the Mn oxidation states at the surfaces of the FIB slices. Our results suggest that the preparation causes a reduction of Mn4+ to Mn2+. We draw attention to this issue, since FIB slicing, scanning electron microscopy (SEM) imaging, and other preparation and visualization techniques operating in the kilo-electron-volt range are well-established in geosciences, but researchers are often unaware of the potential for the reduction of Mn and possibly other elements in the samples.


1981 ◽  
Vol 93 ◽  
pp. 207-227
Author(s):  
Paul C. Joss

The observed properties of X-ray burst sources have recently been reviewed by Lewin and Clark (1980) and Lewin and Joss (1980). About thirty-five such sources are presently known, and they have a spatial distribution reminiscent of stellar Population II (see Figure 1). The salient features of these sources include burst rise times of ≲ls, decay time scales of ~3–100 s, peak luminosities of ~1039 ergs per burst, spectra that can generally be well fitted by blackbody emission from a surface with a constant effective radius of ~10 km and a peak temperature of ~3 × 107 K, and “tails” of softer X-ray emission that may persist for several minutes after the burst maximum. Profiles of bursts from some typical burst sources are shown in Figure 2. The intervals between bursts from a given source may be regular or erratic and are typically in the range of ~104−105 s; many sources undergo burst-inactive phases that can last for weeks or months. Most burst sources are also sources of persistent X-ray emission, and the ratio of average persistent luminosity to time-averaged burst luminosity is typically ~102 during burst-active phases. (The properties of the “Rapid Burster,” MXB1730-335, are different from those of all other known burst sources and will be discussed separately in §VI below.) There are few correlations among the burst flux, burst intervals, and persistent X-ray flux from any given source, and the detailed burst shapes vary from one source to another and often vary with time in a given source.


Minerals ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 476
Author(s):  
Joshua Chisambi ◽  
Bjorn von der Heyden ◽  
Muofhe Tshibalanganda ◽  
Stephan Le Roux

In this contribution, we highlight a correlative approach in which three-dimensional structural/positional data are combined with two dimensional chemical and mineralogical data to understand a complex orogenic gold mineralization system; we use the Kirk Range (southern Malawi) as a case study. Three dimensional structures and semi-quantitative mineral distributions were evaluated using X-ray Computed Tomography (XCT) and this was augmented with textural, mineralogical and chemical imaging using Scanning Electron Microscopy (SEM) and optical microscopy as well as fire assay. Our results detail the utility of the correlative approach both for quantifying gold concentrations in core samples (which is often nuggety and may thus be misrepresented by quarter- or half-core assays), and for understanding the spatial distribution of gold and associated structures and microstructures in 3D space. This approach overlays complementary datasets from 2D and 3D analytical protocols, thereby allowing a better and more comprehensive understanding on the distribution and structures controlling gold mineralization. Combining 3D XCT analyses with conventional 2D microscopies derive the full value out of a given exploration drilling program and it provides an excellent tool for understanding gold mineralization. Understanding the spatial distribution of gold and associated structures and microstructures in 3D space holds vast potential for exploration practitioners, especially if the correlative approach can be automated and if the resultant spatially-constrained microstructural information can be fed directly into commercially available geological modelling software. The extra layers of information provided by using correlative 2D and 3D microscopies offer an exciting new tool to enhance and optimize mineral exploration workflows, given that modern exploration efforts are targeting increasingly complex and low-grade ore deposits.


2019 ◽  
Vol 246 ◽  
pp. 980-989 ◽  
Author(s):  
Yini Cao ◽  
Chuanxin Ma ◽  
Jianfeng Zhang ◽  
Shufeng Wang ◽  
Jason C. White ◽  
...  

1998 ◽  
Vol 08 (02n03) ◽  
pp. 209-216 ◽  
Author(s):  
S. MATSUYAMA ◽  
K. GOTOH ◽  
K. ISHII ◽  
H. YAMAZAKI ◽  
T. SATOH ◽  
...  

We developed a PIXE analysis system which provides spatial distribution images of elements in a region of several cm2 with a spatial resolution of < 0.5 mm. We call this system a submilli-PIXE camera. This system consists of a submilli-beam line, beam scanners and a data acquisition system in which the X-ray energy and the beam position are simultaneously measured. We demonstrate the usefulness of the submilli-PIXE camera by analyzing the surface of a shell and of granite.


Sign in / Sign up

Export Citation Format

Share Document