Characterization of transport mechanisms for controlled release polymer membranes using focused ion beam scanning electron microscopy image-based modelling

2020 ◽  
pp. 102136
Author(s):  
Shawn Zhang ◽  
Gerard Byrne
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polymer Membranes ◽  
Scanning Electron Microscopy Image ◽  
Transport Mechanisms ◽  
Microscopy Image ◽  
Controlled Release Polymer ◽  
Scanning Electron

scholarly journals AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Julian Hennies ◽  
José Miguel Serra Lleti ◽  
Nicole L. Schieber ◽  
Rachel M. Templin ◽  
Anna M. Steyer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Scanning Electron Microscopy Image ◽  
Beam Scanning ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron

scholarly journals Bridging the gap: 3D real-space characterization of colloidal assemblies via FIB-SEM tomography

Nanoscale ◽  
2019 ◽  
Vol 11 (12) ◽  
pp. 5304-5316 ◽  
Author(s):  
Jessi E. S. van der Hoeven ◽  
Ernest B. van der Wee ◽  
D. A. Matthijs de Winter ◽  
Michiel Hermes ◽  
Yang Liu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Real Space ◽  
Particle Level ◽  
Particle Assemblies ◽  
Space Characterization ◽  
Scanning Electron

Focused ion beam-scanning electron microscopy tomography for quantitative real space studies of particle assemblies on a single particle level.

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 614-615
Author(s):  
J. Lin ◽  
W. Heeschen ◽  
J. Reffner ◽  
J. Hook
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Pigment Dispersion ◽  
Beam Scanning ◽  
Paint Films ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Spatially Resolved Characterization of Plastic Deformation Induced by Focused-Ion Beam Processing in Structured InGaN/GaN Layers

2007 ◽  
Vol 1020 ◽  
Author(s):  
R. Barabash ◽  
G. Ice ◽  
R. Kroger ◽  
H. Lohmeyer ◽  
K. Sebald ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Changes ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
X Ray ◽  
Spatially Resolved ◽  
Transmission Electron ◽  
Impact Area ◽  
Scanning Electron

AbstractIn this study the results of polychromatic X-ray microbeam analysis (PXM) of the structural changes caused by FIB in nitride heterostructures are presented and discussed in connection with micro-photoluminescence (μ-PL), fluorescent analysis, scanning electron (SEM) and transmission electron microscopy (TEM) data. It is shown that FIB processing distorts the lattice in the InGaN/GaN layer not only in the immediate vicinity of the processed area but also in the surroundings. A narrow amorphidized top layer is formed in the direct ion beam impact area.

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