Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
2004 ◽
Vol 44
(9-11)
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pp. 1721-1726
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2004 ◽
Vol 72
(1-4)
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pp. 352-356
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2012 ◽
Vol 272
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pp. 128-131
2003 ◽
Vol 20
(5)
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pp. 767-769
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2006 ◽
Vol 46
(9-11)
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pp. 1657-1663
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2004 ◽
Vol 51
(4)
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pp. 575-580
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