scholarly journals Influence of Cr doping on Schottky barrier height and visible light detection of ZnO thin films deposited by magnetron sputtering

2019 ◽  
Vol 2 ◽  
pp. 48-52 ◽  
Author(s):  
S. Fareed ◽  
Arifa Jamil ◽  
N. Tiwari ◽  
M.A. Rafiq
2D Materials ◽  
2019 ◽  
Vol 7 (1) ◽  
pp. 015010 ◽  
Author(s):  
Muhammad Farooq Khan ◽  
Shania Rehman ◽  
Imtisal Akhtar ◽  
Sikandar Aftab ◽  
Hafiz Muhammad Salman Ajmal ◽  
...  

Materials ◽  
2021 ◽  
Vol 14 (10) ◽  
pp. 2678
Author(s):  
Philipp Wendel ◽  
Dominik Dietz ◽  
Jonas Deuermeier ◽  
Andreas Klein

The current-voltage characteristics of ZnO/RuO2 Schottky diodes prepared by magnetron sputtering are shown to exhibit a reversible hysteresis behavior, which corresponds to a variation of the Schottky barrier height between 0.9 and 1.3 eV upon voltage cycling. The changes in the barrier height are attributed to trapping and de-trapping of electrons in oxygen vacancies.


Author(s):  
Michael Vecchio ◽  
Amira Barhoumi Meddeb ◽  
Zoubeida Ounaies ◽  
Michael T. Lanagan ◽  
Jeff Shallenberger

2020 ◽  
Vol 128 (8) ◽  
pp. 1194
Author(s):  
D.A. Onishchuk ◽  
P.S. Parfenov ◽  
A. Dubavik ◽  
A.P. Litvin

The effect of the Schottky barrier height changes on the metal/EDT-treated (1,2-ethanedithiol) PbS nanocrystals film interface is considered. Also, the influence of shunts on the J-V characteristic and the Schottky barrier height is demonstrated, as well, the effect of silver oxide layer on the charge accumulation and tunneling. It is shown that the gold electrodes provide more stable results even when the Schottky barrier is formed, while the silver electrode provides more current. Keywords: semiconductor nanocrystals, Schottky barrier, charge carriers transport, thin films.


2020 ◽  
Vol 8 (18) ◽  
pp. 9085-9090 ◽  
Author(s):  
Lin-An Cao ◽  
Ming-Shui Yao ◽  
Hui-Jie Jiang ◽  
Susumu Kitagawa ◽  
Xiao-Liang Ye ◽  
...  

High-quality EC-MOF thin films are used to modulate the Schottky barrier height and detect light/gas by self-powered mode.


2005 ◽  
Vol 475-479 ◽  
pp. 3363-3366
Author(s):  
Xi Ying Ma

The Schottky barrier height (SBH) of IrSi nanometer thin films prepared by pulsed laser deposition at room temperature and annealed at 600 °C has been studied. The SBH of the sample is deduced from C-V and I-V data. These SBHs decrease with increasing measurement temperature.


Sign in / Sign up

Export Citation Format

Share Document