Mis-layered structure of twin-twin interface with 7.4°<-12-10> misorientation relationship in Mg alloy

AbstractThe formation of entrainment defects, (also known as double oxide film defects or bifilms), caused by the entrapment of a doubled-over surface oxide film containing a small amount of local atmosphere, has been investigated by combining practical experiments using a commercial-purity Mg-alloy under protective gases, with theoretical thermodynamic calculations. Evolution of the entrainment defects was studied, and a double-layered structure of their oxide films was found, which was different from the single-layered structure of the Mg-alloy melt surface films that have been previously reported. A pore gas analyzer was used to analyze the gas trapped within the defects from which H2 and N2 (from the air) were detected. It was found that entrapped gases can be depleted through reactions with the surrounding liquid Mg-alloy, resulting in the oxide films growing together in the melt. Transformation of the entrained gas to solid-phase compounds could reduce the void volume of the defects, thus probably diminishing the negative effect of the entrainment defects on the quality of castings.

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Lattice imaging of precipitates in Al-Zn-Mg alloy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100143651 ◽

1986 ◽

Vol 44 ◽

pp. 412-413

Author(s):

C. K. Wu

Keyword(s):

Grain Boundaries ◽

Homogeneous Nucleation ◽

Alloy System ◽

Mg Alloy ◽

List Type ◽

Lattice Structures ◽

Type Number ◽

Orientation Relationships ◽

Lattice Imaging ◽

The Matrix

The precipitation phenomenon in Al-Zn-Mg alloy is quite interesting and complicated and can be described in the following categories:(i) heterogeneous nucleation at grain boundaries;(ii) precipitate-free-zones (PFZ) adjacent to the grain boundaries;(iii) homogeneous nucleation of snherical G.P. zones, n' and n phases inside the grains. The spherical G.P. zones are coherent with the matrix, whereas the n' and n phases are incoherent. It is noticed that n' and n phases exhibit plate-like morpholoay with several orientation relationship with the matrix. The high resolution lattice imaging techninue of TEM is then applied to study precipitates in this alloy system. It reveals the characteristics of lattice structures of each phase and the orientation relationships with the matrix.

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In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121685 ◽

1992 ◽

Vol 50 (1) ◽

pp. 256-257

Author(s):

Tai D. Nguyen ◽

Ronald Gronsky ◽

Jeffrey B. Kortright

Keyword(s):

Layered Structure ◽

Driving Force ◽

High Energy ◽

Superior Performance ◽

In Situ Tem ◽

Rayleigh Instability ◽

Practical Applications ◽

Transmission Electron ◽

Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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