Anomalous ionization loss of high-energy e+e− pairs in thin targets

Author(s):  
S.V. Trofymenko ◽  
N.F. Shul'ga
Keyword(s):  
2022 ◽  
Vol 17 (01) ◽  
pp. P01015
Author(s):  
R.M. Nazhmudinov ◽  
A.V. Shchagin ◽  
A.S. Kubankin ◽  
A.G. Afonin ◽  
G.I. Britvich ◽  
...  

Abstract Research of the ionization loss of 50 GeV protons, the path of which in the depleted layer of the silicon detector was smoothly regulated in the range from 0.3 to 10 mm, is presented. In the experiment, we used a flat silicon detector with a fixed thickness of the depleted layer of 300 μm. The smooth regulation of the path was realized due to the variation of the angle between the surface of the detector and the incident proton beam. The comparison of experimental data and theoretical calculations of the ionization loss demonstrates agreement in all range of thicknesses. Results of the research can be used in order to control the angle between the surface of the detector and the incident beam of relativistic particles. Besides, the results can be used in the analysis of data from astrophysical silicon detectors of charged particles if high-energy particles crossed flat detectors at arbitrary angle.


1974 ◽  
Vol 9 (4) ◽  
pp. 1418-1429 ◽  
Author(s):  
James T. O'Brien ◽  
Hall Crannell ◽  
F. J. Kline ◽  
S. Penner

2020 ◽  
Vol 80 (7) ◽  
Author(s):  
S. V. Trofymenko ◽  
I. V. Kyryllin

Abstract The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length $$l_d$$ld is considered. It is shown that in this case the shape of the spectrum noticeably depends on $$l_d$$ld. The evolution of various characteristic parameters of the spectrum with the change of $$l_d$$ld is investigated. A method of the experimental determination of $$l_d$$ld on the basis of the measurement of the ionization loss spectrum is proposed.


1984 ◽  
Vol 75 ◽  
pp. 599-602
Author(s):  
T.V. Johnson ◽  
G.E. Morfill ◽  
E. Grun

A number of lines of evidence suggest that the particles making up the E-ring are small, on the order of a few microns or less in size (Terrile and Tokunaga, 1980, BAAS; Pang et al., 1982 Saturn meeting; Tucson, AZ). This suggests that a variety of electromagnetic and plasma affects may be important in considering the history of such particles. We have shown (Morfill et al., 1982, J. Geophys. Res., in press) that plasma drags forces from the corotating plasma will rapidly evolve E-ring particle orbits to increasing distance from Saturn until a point is reached where radiation drag forces acting to decrease orbital radius balance this outward acceleration. This occurs at approximately Rhea's orbit, although the exact value is subject to many uncertainties. The time scale for plasma drag to move particles from Enceladus' orbit to the outer E-ring is ~104yr. A variety of effects also act to remove particles, primarily sputtering by both high energy charged particles (Cheng et al., 1982, J. Geophys. Res., in press) and corotating plasma (Morfill et al., 1982). The time scale for sputtering away one micron particles is also short, 102 - 10 yrs. Thus the detailed particle density profile in the E-ring is set by a competition between orbit evolution and particle removal. The high density region near Enceladus' orbit may result from the sputtering yeild of corotating ions being less than unity at this radius (e.g. Eviatar et al., 1982, Saturn meeting). In any case, an active source of E-ring material is required if the feature is not very ephemeral - Enceladus itself, with its geologically recent surface, appears still to be the best candidate for the ultimate source of E-ring material.


Author(s):  
J. B. Warren

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.


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