On the ionization loss spectra of high-energy channeled negatively charged particles
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Abstract The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length $$l_d$$ld is considered. It is shown that in this case the shape of the spectrum noticeably depends on $$l_d$$ld. The evolution of various characteristic parameters of the spectrum with the change of $$l_d$$ld is investigated. A method of the experimental determination of $$l_d$$ld on the basis of the measurement of the ionization loss spectrum is proposed.
2018 ◽
Vol 13
(02)
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pp. C02020-C02020
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2003 ◽
Vol 79
(9)
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pp. 878-883
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1995 ◽
Vol 348
(3-4)
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pp. 697-709
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2017 ◽
Vol 20
(10)
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