A compact fiber-based sensor for wide range strain measurement

This special issue of Microscopy and Microanalysis explores quantitative electron diffraction from nonbiological materials. Jim Turner and I have put many hours of work into bringing it together, and we thank the authors for their fine contributions. The articles cover a wide range of materials and techniques, from convergent-beam electron diffraction (CBED) to the new Kohler SAD mode, as well as the use of direct methods, the study of diffuse elastic scattering from defects, strain measurement, and multiwavelength methods. We were sorry that we could not obtain recent work using the precession electron diffraction camera by our deadline, but readers should be aware of that promising method also.

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Depth capabilities of neutron and synchrotron diffraction strain measurement instruments. II. Practical implications

Journal of Applied Crystallography ◽

10.1107/s0021889804012750 ◽

2004 ◽

Vol 37 (4) ◽

pp. 607-612 ◽

Cited By ~ 22

Author(s):

Philip John Withers

Keyword(s):

Strain Measurement ◽

Measurement Accuracy ◽

Radiation Energy ◽

Calibration Data ◽

Measurement Instruments ◽

Penetration Length ◽

Wide Range ◽

Sampling Volume ◽

Practical Implications ◽

Transmission And Reflection

In part I [Withers (2004).J. Appl. Cryst.37, 596–606], a framework was presented for estimating the maximum feasible penetration length for neutron and synchrotron X-ray strain measurement. This calculation reflected the attenuation and scattering capability of the material under examination, the incident flux and detector arrangement, the likely background signal, the required strain measurement accuracy, the sampling volume, and the diffracting geometry. In the present paper (part II), preliminary calibration data acquired for a very wide range of neutron and synchrotron sources are presented. This database is used to explore the implications of the framework for delineating those conditions under which a specific instrument can provide useful information within a feasible timescale, in order to identify the most appropriate radiation, energy and instrumental configuration for undertaking measurements in transmission and reflection as a function of depth, and to establish guiding principles for improving the performance of existing instruments.

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Hollow cylinder torsional simple shear apparatus capable of a wide range of shear strain measurement

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(93)92270-z ◽

1993 ◽

Vol 30 (5) ◽

pp. 274

Keyword(s):

Shear Strain ◽

Hollow Cylinder ◽

Simple Shear ◽

Strain Measurement ◽

Wide Range

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Recent Applications of High Resolution Electron Microscopy to Crystalline Arrays of Virus Particles

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070199 ◽

1978 ◽

Vol 36 (3) ◽

pp. 470-482 ◽

Cited By ~ 1

Author(s):

R.W. Horne

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

Analytical Techniques ◽

Staining Technique ◽

High Resolution Electron Microscopy ◽

Optical Diffraction ◽

Full Potential ◽

Virus Particles ◽

Resolution Electron ◽

Wide Range

The technique of surrounding virus particles with a neutralised electron dense stain was described at the Fourth International Congress on Electron Microscopy, Berlin 1958 (see Home & Brenner, 1960, p. 625). For many years the negative staining technique in one form or another, has been applied to a wide range of biological materials. However, the full potential of the method has only recently been explored following the development and applications of optical diffraction and computer image analytical techniques to electron micrographs (cf. De Hosier & Klug, 1968; Markham 1968; Crowther et al., 1970; Home & Markham, 1973; Klug & Berger, 1974; Crowther & Klug, 1975). These image processing procedures have allowed a more precise and quantitative approach to be made concerning the interpretation, measurement and reconstruction of repeating features in certain biological systems.

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Microfabrication research at the National Submicron Facility

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100074331 ◽

1983 ◽

Vol 41 ◽

pp. 86-89

Author(s):

E.D. Wolf

Keyword(s):

Integrated Circuits ◽

Particle Physics ◽

High Speed ◽

New Technology ◽

High Energy ◽

High Energy Particle ◽

New Science ◽

Wide Range ◽

Intermediate Domain ◽

Circuit Function

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.

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Application of TEM to Deformation, Wear, and Fracture of Ceramics

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052377 ◽

1974 ◽

Vol 32 ◽

pp. 472-473

Author(s):

B. J. Hockey

Keyword(s):

Wear Resistance ◽

High Temperature ◽

Mechanical Behavior ◽

Brittle Materials ◽

High Temperature Strength ◽

Wide Range ◽

Corrosive Environments ◽

Further Development

Ceramics, such as Al2O3 and SiC have numerous current and potential uses in applications where high temperature strength, hardness, and wear resistance are required often in corrosive environments. These materials are, however, highly anisotropic and brittle, so that their mechanical behavior is often unpredictable. The further development of these materials will require a better understanding of the basic mechanisms controlling deformation, wear, and fracture.The purpose of this talk is to describe applications of TEM to the study of the deformation, wear, and fracture of Al2O3. Similar studies are currently being conducted on SiC and the techniques involved should be applicable to a wide range of hard, brittle materials.

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