Comparing the relative robustness of anion exchange and the corresponding mixed-mode chromatography on removing a weakly-bound byproduct: A case study of bispecific antibody purification

2021 ◽  
pp. 105948
Author(s):  
Shengwei Zhang ◽  
Ting Zhang ◽  
Yifeng Li ◽  
Yan Wan
Keyword(s):  
Anion Exchange ◽  
Mixed Mode ◽  
Bispecific Antibody ◽  
Weakly Bound ◽  
Antibody Purification ◽  
Relative Robustness

Case Study: Combined Dynamic Laser Stimulation and Static Emission Microscopy Techniques Applied to Scan Test Failure on Mixed Mode Device

2012 ◽  
Author(s):  
Magdalena Sienkiewicz ◽  
Philippe Rousseille
Keyword(s):  
Mixed Mode ◽  
Laser Stimulation ◽  
Scan Test ◽  
Silicon Bulk ◽  
Defect Localization ◽  
Emission Microscopy ◽  
Microscopy Techniques ◽  
Test Failure

Abstract This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at the silicon bulk level.

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