scholarly journals Bragg waveguide with an antiresonance intermediate layer

2015 ◽  
Vol 17 (2) ◽  
pp. 38-40 ◽  
Author(s):  
Yuriy N. Kulchin ◽  
Yuriy A. Zinin ◽  
Vladislav A. Kolchinskiy
Author(s):  
O. Eibl ◽  
G. Gieres ◽  
H. Behner

The microstructure of high-Tc YBa2Cu3O7-X thin films deposited by DC-sputtering on SrTiO3 substrates was analysed by TEM. Films were either (i) deposited in the amorphous state at substrate temperatures < 450°C and crystallised by a heat treatment at 900°C (process 1) or (ii) deposited at around 740°C in the crystalline state (process 2). Cross sections were prepared for TEM analyses and are especially useful for studying film substrate interdiffusion (fig.1). Films deposited in process 1 were polycristalline and the grain size was approximately 200 nm. Films were porous and the size of voids was approximately 100 nm. Between the SrTiO3 substrate and the YBa2Cu3Ox film a densly grown crystalline intermediate layer approximately 150 nm thick covered the SrTiO3 substrate. EDX microanalyses showed that the layer consisted of Sr, Ba and Ti, however, did not contain Y and Cu. Crystallites of the layer were carefully tilted in the microscope and diffraction patterns were obtained in five different poles for every crystallite. These patterns were consistent with the phase (Ba1-XSrx)2TiO4. The intermediate layer was most likely formed during the annealing at 900°C. Its formation can be understood as a diffusion of Ba from the amorphously deposited film into the substrate and diffusion of Sr from the substrate into the film. Between the intermediate layer and the surface of the film the film consisted of YBa2Cu3O7-x grains. Films prepared in process 1 had Tc(R=0) close to 90 K, however, critical currents were as low as jc = 104A/cm2 at 77 K.


2001 ◽  
Vol 25 (4−2) ◽  
pp. 767-770 ◽  
Author(s):  
T. Daibou ◽  
M. Oogane ◽  
Y. Ando ◽  
C. Kim ◽  
O. Song ◽  
...  

2021 ◽  
Vol 25 (10) ◽  
pp. 5629-5639
Author(s):  
Cleber Paradzinski Cavalheiro ◽  
Helena Scherer ◽  
José Carlos Pettorossi Imparato ◽  
Fabrício Mezzomo Collares ◽  
Tathiane Larissa Lenzi

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Karin Legerstee ◽  
Tsion E. Abraham ◽  
Wiggert A. van Cappellen ◽  
Alex L. Nigg ◽  
Johan A. Slotman ◽  
...  

AbstractFocal adhesions (FAs) are flat elongated structures that mediate cell migration and link the cytoskeleton to the extracellular matrix. Along the vertical axis FAs were shown to be composed of three layers. We used structured illumination microscopy to examine the longitudinal distribution of four hallmark FA proteins, which we also used as markers for these layers. At the FA ends pointing towards the adherent membrane edge (heads), bottom layer protein paxillin protruded, while at the opposite ends (tails) intermediate layer protein vinculin and top layer proteins zyxin and VASP extended further. At the tail tips, only intermediate layer protein vinculin protruded. Importantly, head and tail compositions were altered during HGF-induced scattering with paxillin heads being shorter and zyxin tails longer. Additionally, FAs at protruding or retracting membrane edges had longer paxillin heads than FAs at static edges. These data suggest that redistribution of FA-proteins with respect to each other along FAs is involved in cell movement.


2021 ◽  
Vol 11 (11) ◽  
pp. 5155
Author(s):  
Liu Jian ◽  
Gyung-Min Choi

Acoustic oscillation provides useful information regarding the interfacial coupling between metal transducer layers and substrate materials. The interfacial coupling can be significantly reduced by a mechanically soft layer between the transducer and substrate. However, preserving a thin, soft layer at the interface during fabrication is often challenging. In this study, we demonstrate that an amorphous CoB alloy on top of a sapphire substrate can substantially amplify acoustic oscillations. By analyzing the attenuation of acoustic oscillations, we show that a thin, soft layer with a thickness of >2 ± 1 Å exists at the interface. The intermediate layer at the interface is further verified by investigating heat transport. By analyzing the slow decrease of the temperature of the transducer layer, we determine a thermal conductance of 35 ± 5 MW m−2 K−1 at the transducer/substrate interface. This low value supports the existence of a thin, soft layer at the interface. Our results demonstrate that an amorphous metal with B alloying effectively preserves the soft nature at the interface and detects the acoustic propagation and heat transport across it.


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