Characterization of single-sided gate-to-drain non-overlapped implantation nMOSFETs for multi-functional non-volatile memory applications
1996 ◽
Vol 12
(1)
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pp. 23-31
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2001 ◽
Vol 45
(8)
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pp. 1433-1440
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2016 ◽
Vol 4
(46)
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pp. 10967-10972
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1998 ◽
Vol 19
(1-4)
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pp. 159-177
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2000 ◽
Vol 375
(1-2)
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pp. 200-204
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