Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films

2008 ◽  
Vol 516 (21) ◽  
pp. 7511-7518 ◽  
Author(s):  
A. Kovalskiy ◽  
J.R. Neilson ◽  
A.C. Miller ◽  
F.C. Miller ◽  
M. Vlcek ◽  
...  
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Structural Transformations ◽  
Amorphous Thin Films

CoZrNb amorphous thin films deposited by r.f. diode and d.c. triode sputtering: a comparative study

1991 ◽  
Vol 26 (11) ◽  
pp. 3025-3031 ◽  
Author(s):  
F. Machizaud ◽  
G. Suran ◽  
M. Rivoire ◽  
F. W. A. Dirne
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Amorphous Thin Films

Comparative study of transparent rectifying contacts on semiconducting oxide single crystals and amorphous thin films

2013 ◽  
Vol 113 (4) ◽  
pp. 044511 ◽  
Author(s):  
Alexander Lajn ◽  
Holger von Wenckstern ◽  
Marius Grundmann ◽  
Gerald Wagner ◽  
Pedro Barquinha ◽  
...  
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Single Crystals ◽  
Amorphous Thin Films

Irradiation Effect on Al-Dispersed Amorphous Silicon Thin Films by Femtosecond Laser

2020 ◽  
Vol 984 ◽  
pp. 91-96
Author(s):  
Cheng Liu ◽  
Yu Hao Song ◽  
Dong Yang Li ◽  
Wei Li
Keyword(s):  
Thin Films ◽  
Amorphous Silicon ◽  
Laser Raman Spectroscopy ◽  
Irradiation Effect ◽  
Amorphous Thin Films ◽  
Laser Raman ◽  
Silicon Thin Films ◽  
Al Nanoparticles ◽  
Spot Area ◽  
Fs Laser

The structural and optical properties of amorphous silicon (a-Si) and Al-dispersed amorphous silicon (a-Si:Al) thin films irradiated by femtosecond (fs) laser at various energy densities are investigated comparatively in this article. It is found that there is an uneven crystallization in both amorphous thin films by means of optical microscopy and laser Raman spectroscopy respectively. The crystallization in each pulse spot area is gradually weakened from the center to the edge along with the energy dispersion of laser irradiation. The laser induced crystallization in a-Si thin films begins early and develops more extensively compared to that in a-Si:Al thin films, and Al nanoparticles inhibit somehow the crystallization of a-Si in a-Si:Al thin films.

Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films

2003 ◽  
Vol 15 (21) ◽  
pp. 1826-1828 ◽  
Author(s):  
V. Lyahovitskaya ◽  
I. Zon ◽  
Y. Feldman ◽  
S.R. Cohen ◽  
A.K. Tagantsev ◽  
...  
Keyword(s):  
Thin Films ◽  
Amorphous Thin Films

A comparative study on the NO2 gas sensing properties of ZnO thin films, nanowires and nanorods

2011 ◽  
Vol 520 (3) ◽  
pp. 932-938 ◽  
Author(s):  
S. Öztürk ◽  
N. Kılınç ◽  
N. Taşaltin ◽  
Z.Z. Öztürk
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Gas Sensing ◽  
Zno Thin Films ◽  
Sensing Properties ◽  
Gas Sensing Properties
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