Effect of Surface Oxides on the Quality of Pseudo-Kikuchi Patterns in the Scanning Electron Microscope

Metallography ◽  
1973 ◽  
Vol 6 (5) ◽  
pp. 429-432
Author(s):  
S.K. Bhambri ◽  
P. Audit
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Oxides ◽  
Scanning Electron ◽  
Effect Of Surface

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

The Effect of Surface Finish on Zinc Whisker Growth

2012 ◽  
Vol 472-475 ◽  
pp. 2756-2759
Author(s):  
Wen Cui ◽  
Shao Jun Qi
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Finish ◽  
Whisker Growth ◽  
Experimental Conditions ◽  
Steel Substrates ◽  
The Relationship ◽  
Rough Surface Finish ◽  
Scanning Electron ◽  
Effect Of Surface

To understand the relationship between surface finish and zinc whisker growth, this study investigated the growth of whiskers on two mild steel substrates of different surface finish by Field Emission Gun Scanning Electron Microscope (FEG SEM). Results show that, under the same experimental conditions, deposits on substrates with a mirror finish grew less whiskers and nodules than substrates with a rough surface finish.

The Determination and Application of the Point Spread Function in the Scanning Electron Microscope

2018 ◽  
Vol 24 (4) ◽  
pp. 396-405 ◽  
Author(s):  
Matthew D. Zotta ◽  
Mandy C. Nevins ◽  
Richard K. Hailstone ◽  
Eric Lifshin
Keyword(s):  
Spatial Distribution ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Current ◽  
Beam Shape ◽  
Practical Applications ◽  
Energy Beam ◽  
Working Distance ◽  
Scanning Electron

AbstractA method is presented to determine the spatial distribution of electrons in the focused beam of a scanning electron microscope (SEM). Knowledge of the electron distribution is valuable for characterizing and monitoring SEM performance, as well as for modeling and simulation in computational scanning electron microscopy. Specifically, it can be used to characterize astigmatism as well as study the relationship between beam energy, beam current, working distance, and beam shape and size. In addition, knowledge of the distribution of electrons in the beam can be utilized with deconvolution methods to improve the resolution and quality of backscattered, secondary, and transmitted electron images obtained with thermionic, FEG, or Schottky source instruments. The proposed method represents an improvement over previous methods for determining the spatial distribution of electrons in an SEM beam. Several practical applications are presented.

Qualitative Analysis and Study the Workpiece Shearing Surface Quality of Fine-Blanking with Negative Clearance

2011 ◽  
Vol 697-698 ◽  
pp. 371-376
Author(s):  
Hong Du ◽  
Zhong Mei Zhang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Qualitative Analysis ◽  
Surface Quality ◽  
Reference Value ◽  
Quality Standard ◽  
Fine Blanking ◽  
Negative Clearance ◽  
Scanning Electron

The workpieces of fine blanking with negative clearance were obtained through the fine-blanking with negative clearance processing experiment. The fractography photographs of workpieces shearing surface were scanned by scanning electron microscope (SEM), and the characterization parameters and quality standard of workpieces shearing surface with negative clearance were analyzed in the processing of blanking. According to the characterization parameters and quality standard of workpieces shearing surface with negative clearance, the workpiece with the length ratio of burnish band, deflection error, rollover error and blanking burr were analyzed qualitative. The findings have a certain reference value to the blanking related profession.

Fabrication of Accurate Diamond - Metal Composite Cutting Blade by Electrotyping Method

2006 ◽  
Vol 304-305 ◽  
pp. 57-61
Author(s):  
L.L. Fang ◽  
Bing Lin Zhang ◽  
Ning Yao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Ph Value ◽  
Photoemission Spectroscopy ◽  
Metal Composite ◽  
X Ray Diffraction ◽  
Electrolytic Solution ◽  
X Ray ◽  
Scanning Electron

In this paper, we report that the experimental results of fabricated diamond-metal composite film. Electrotyping method was used to deposit the thick film. During the deposition, low internal stress electrolytic solution, the electric current density of cathode, PH value, temperature, the distance between cathode and anode, the pretreatment of motherboard cathode were selected simultaneously. It was found that stirring strongly affected the quality of the film. Especially stirring velocity affected the distribution of diamond grains. Scanning electron microscope (SEM), X-ray photoemission spectroscopy (XPS) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure, diamond grains distribution and the chemical environment of the film.

Sign in / Sign up

Export Citation Format

Share Document