Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing heterogeneities in the polymer microstructure that are not apparent from the topographic image. The enhanced contrast provided by phase images often allows for identification of different material constituents. However, while the phase changes of the oscillating probe are associated with energy dissipation between the probe tip and the sample surface, the relationship between this energy dissipation and the sample properties is not well understood.As the popularity of phase imaging has grown, the capability of the AFM to measure nanoscale indentation response of polymers has also been explored. Both techniques are ideal for the evaluation of multi-phase and multi-component polymer systems.

Download Full-text

Energy dissipation during nanoscale indentation of polymers with an atomic force microscope

Applied Physics Letters ◽

10.1063/1.112003 ◽

1994 ◽

Vol 64 (14) ◽

pp. 1794-1796 ◽

Cited By ~ 7

Author(s):

E. Boschung ◽

M. Heuberger ◽

G. Dietler

Keyword(s):

Energy Dissipation ◽

Atomic Force Microscope ◽

Atomic Force

Download Full-text

Measurement of the loss tangent of a thin polymeric film using the atomic force microscope

Journal of Materials Research ◽

10.1557/jmr.2004.19.1.387 ◽

2004 ◽

Vol 19 (1) ◽

pp. 387-395 ◽

Cited By ~ 18

Author(s):

P.M. McGuiggan ◽

D.J. Yarusso

Keyword(s):

Atomic Force Microscope ◽

Loss Tangent ◽

Oscillation Amplitude ◽

Polymer Surface ◽

Pressure Sensitive Adhesive ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Measurement ◽

Microscope Technique ◽

Tan Δ

An atomic force microscope was used to measure the loss tangent, tan δ, of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The atomic force microscopy measurement gave the same frequency dependence of tan δ as that measured by a dynamic shear rheometer on a film 20 times thicker. The results demonstrate that the atomic force microscope technique can quantitatively measure rheological properties of soft thin polymeric films.

Download Full-text

Experimental Study of Relationship between Energy Dissipation and Fatigue Damage from Observation of Slip Band by Atomic Force Microscope

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.891-892.606 ◽

2014 ◽

Vol 891-892 ◽

pp. 606-611 ◽

Cited By ~ 9

Author(s):

Daiki Shiozawa ◽

Ken Inaba ◽

Atsushi Akai ◽

Takahide Sakagami

Keyword(s):

Energy Dissipation ◽

Atomic Force Microscope ◽

Fatigue Damage ◽

Optical Microscope ◽

Dissipated Energy ◽

Atomic Force ◽

Slip Bands ◽

Type 316L ◽

The Relationship ◽

Type 316L Stainless Steel

In recent years, fatigue limit estimation based on dissipated energy has been introduced in various industries because of its time and cost effectiveness. However, the mechanism of energy dissipation and the relationship between energy dissipation and fatigue damage have not been investigated well. In this study, mechanism of energy dissipation is investigated in relation with formulation of slip bands for JIS type 316L stainless steel through observation of slip bands by optical microscope and atomic force microscope.

Download Full-text

Energy dissipation during nanoscale indentation of polymers with an atomic force microscope

Applied Physics Letters ◽

10.1063/1.111199 ◽

1994 ◽

Vol 64 (26) ◽

pp. 3566-3568 ◽

Cited By ~ 16

Author(s):

E. Boschung ◽

M. Heuberger ◽

G. Dietler

Keyword(s):

Energy Dissipation ◽

Atomic Force Microscope ◽

Atomic Force

Download Full-text

Photothermal excitation efficiency enhancement of cantilevers by electron beam deposition of amorphous carbon thin films

Scientific Reports ◽

10.1038/s41598-020-74433-x ◽

2020 ◽

Vol 10 (1) ◽

Author(s):

Marcos Penedo ◽

Ayhan Yurtsever ◽

Keisuke Miyazawa ◽

Hirotoshi Furusho ◽

Kiyo-Aki Ishii ◽

...

Keyword(s):

Atomic Force Microscope ◽

Amorphous Carbon ◽

Biological Samples ◽

Oscillation Amplitude ◽

Carbon Layer ◽

Stable Operation ◽

Excitation Efficiency ◽

Atomic Force ◽

Excitation Laser

Abstract In recent years, the atomic force microscope has proven to be a powerful tool for studying biological systems, mainly for its capability to measure in liquids with nanoscale resolution. Measuring tissues, cells or proteins in their physiological conditions gives us access to valuable information about their real ‘in vivo’ structure, dynamics and functionality which could then fuel disruptive medical and biological applications. The main problem faced by the atomic force microscope when working in liquid environments is the difficulty to generate clear cantilever resonance spectra, essential for stable operation and for high resolution imaging. Photothermal actuation overcomes this problem, as it generates clear resonance spectra free from spurious peaks. However, relatively high laser powers are required to achieve the desired cantilever oscillation amplitude, which could potentially damage biological samples. In this study, we demonstrate that the photothermal excitation efficiency can be enhanced by coating the cantilever with a thin amorphous carbon layer to increase the heat absorption from the laser, reducing the required excitation laser power and minimizing the damage to biological samples.

Download Full-text

Direct Observation of Friction at the Atomic Scale

MRS Proceedings ◽

10.1557/proc-119-81 ◽

1988 ◽

Vol 119 ◽

Cited By ~ 5

Author(s):

Gary M. McClelland ◽

C. Mathew Mate ◽

Ragnar Erlandsson ◽

Shirley Chiang

Keyword(s):

Atomic Force Microscope ◽

Direct Observation ◽

Frictional Force ◽

Basal Plane ◽

Graphite Surface ◽

Atomic Scale ◽

Atomic Force ◽

Tungsten Tip

AbstractAn atomic force microscope has been used to measure the frictional force on a tungsten tip sliding across the basal plane of graphite at low loads < 10-4 N. The frictional force displays the 2.5 Å periodicity of the graphite surface.

Download Full-text

Characterization of photosystem II with the atomic-force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130365 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1146-1147

Author(s):

Kathleen M. Marr ◽

Mary K. Lyon

Keyword(s):

Photosystem Ii ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Biologically Active ◽

Atomic Force ◽

Freeze Etching ◽

Image Averaging ◽

Oxygen Evolving ◽

Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Download Full-text

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152136 ◽

1989 ◽

Vol 47 ◽

pp. 32-33

Author(s):

S.A.C. Gould ◽

B. Drake ◽

C.B. Prater ◽

A.L. Weisenhorn ◽

S.M. Lindsay ◽

...

Keyword(s):

Amino Acids ◽

Dna Sequencing ◽

Aqueous Solutions ◽

Atomic Force Microscope ◽

Piezoelectric Crystal ◽

Atomic Force ◽

Structure Of Molecules ◽

Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

Download Full-text

The atomic-force microscope and its future in biology

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100149350 ◽

1993 ◽

Vol 51 ◽

pp. 704-705

Author(s):

Jean-Paul Revel

Keyword(s):

Silicon Nitride ◽

Laser Beam ◽

Atomic Force Microscope ◽

Scanning Tunneling Microscope ◽

Point Of View ◽

Scanning Tunneling ◽

Close Relative ◽

Tunneling Microscope ◽

Atomic Force ◽

Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

Download Full-text