Geochemical evidence for loss of Na and K from Moinian calc-silicate pods during prograde metamorphism

1980 ◽  
Vol 117 (3) ◽  
pp. 267-275 ◽  
Author(s):  
P. W. G. Tanner ◽  
R. G. Miller
Keyword(s):  
Major Element ◽  
Spatial Relationship ◽  
Metamorphic Grade ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Prograde Metamorphism ◽  
X Ray ◽  
Late Precambrian ◽  
Anorthite Content ◽  
Silicate Rocks

SummaryA total of 111 major element analyses have been made of impure calcareous rocks from the Late Precambrian Moinian sequence in NW Scotland. Samples were collected along a 36 km traverse from three stratigraphic horizons which are repeated by folding and vary in metamorphic grade from lower to upper amphibolite facies. Anorthite content of the plagioclase, which increases progressively from albite to anorthite, was assessed by X-ray diffraction measurement of 2θ (131–11); this value is used as a ‘metamorphic index’ for rocks with a CaO/Al2O3 (wt. %) ration of 0.3–0.7 and Na2O/Al2O3, < 0.35. Na2O/Al2O3 and K2O/Al2O3 ratios plotted against this index, together with the spatial relationship between metamorphic/chemical isograds and stratigraphic boundaries show that both Na (0.24–4.82% Na2O) and K (0.01–3.28% K2O) are lost from the calc-silicate rocks during prograde metamorphism. These chemical changes result in a variation of the stable mineralogy with increasing metamorphic grade and take place through the medium of the intergranular fluid.

Photoluminescence Enhancement of CdS Nanocrystals Fabricated on Dithiocarbamate Functionalized PET Substrates

2012 ◽  
Vol 512-515 ◽  
pp. 1511-1515
Author(s):  
Chun Lin Zhao ◽  
Li Xing ◽  
Xiao Hong Liang ◽  
Jun Hui Xiang ◽  
Fu Shi Zhang ◽  
...  
Keyword(s):  
Room Temperature ◽  
Hexagonal Structure ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Visible Absorption ◽  
X Ray ◽  
Cds Nanocrystals ◽  
Morphological Studies ◽  
Transmission Electron

Cadmium sulfide (CdS) nanocrystals (NCs) were self-assembled and in-situ immobilized on the dithiocarbamate (DTCs)-functionalized polyethylene glycol terephthalate (PET) substrates between the organic (carbon disulfide diffused in n-hexane) –aqueous (ethylenediamine and Cd2+ dissolved in water) interface at room temperature. Powder X-ray diffraction measurement revealed the hexagonal structure of CdS nanocrystals. Morphological studies performed by scanning electron microscopy (SEM) and high-resolution transmission electron microscope (HRTEM) showed the island-like structure of CdS nanocrystals on PET substrates, as well as energy-dispersive X-ray spectroscopy (EDS) confirmed the stoichiometries of CdS nanocrystals. The optical properties of DTCs modified CdS nanocrystals were thoroughly investigated by ultraviolet-visible absorption spectroscopy (UV-vis) and fluorescence spectroscopy. The as-prepared DTCs present intrinsic hydrophobicity and strong affinity for CdS nanocrystals.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

scholarly journals In-Situ X-ray Diffraction Measurement for Pure Niobium Metal in High Temperature Hydrogen Atmosphere

2006 ◽  
Vol 70 (6) ◽  
pp. 467-472 ◽  
Author(s):  
Tomonori Nambu ◽  
Nobue Shimizu ◽  
Hisakazu Ezaki ◽  
Hiroshi Yukawa ◽  
Masahiko Morinaga ◽  
...  
Keyword(s):  
High Temperature ◽  
Hydrogen Atmosphere ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pure Niobium

Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients

2007 ◽  
Vol 40 (4) ◽  
pp. 675-683 ◽  
Author(s):  
Cristy L. Azanza Ricardo ◽  
Mirco D'Incau ◽  
Paolo Scardi
Keyword(s):  
Residual Stress ◽  
Hole Drilling ◽  
Al Alloy ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Surface Residual Stress ◽  
X Ray ◽  
Stress Gradients ◽  
Layer Removal ◽  
Removal Technique

A new procedure is proposed to determine sub-surface residual stress gradients by laboratory X-ray diffraction measurements at different depths using a chemical layer-removal technique. The standard correction algorithm for stress relaxation due to layer removal is improved by including corrections for X-ray absorption, and by the addition of constraints imposed by the mechanical equilibrium conditions. Besides correcting the data,i.e.providing more reliable through-thickness residual stress trends, the proposed procedure also provides an elastically compatible and plausible estimate of the residual stress inside the component, well beyond the measured region. The application of the model is illustrated for a set of Al-alloy components shot-peened at different Almen intensities. Results are compared with those given by `blind hole drilling', which is an independent and partly destructive method.

scholarly journals PHYSICOCHEMICAL STUDY AND QUANTITATIVE ANALYSIS SWARNA MAKSHIKA BHASMA.

2021 ◽  
Vol 9 (1) ◽  
Author(s):  
Rajni Bhardwaj ◽  
Smita Johar ◽  
Amit Kapila ◽  
Amandeep Sharma
Keyword(s):  
Particle Size ◽  
Quantitative Analysis ◽  
Iron Oxide ◽  
Major Element ◽  
X Ray Diffraction ◽  
X Ray ◽  
Minor Elements ◽  
Rhombohedral Crystal ◽  
Main Component ◽  
Reddish Brown Color

Swarnamakshika is grouped under Updhatu of Swarna and is composed of Copper, Iron and Sulphur. In this study Swarnamakshika was subjected to Shodhana by Bharjana with Nimbuka swarasa and Shudha Swarnamakshika was given Bhavana with Nimbuka swarasa and subjected to Varahaputa. With ten Varahaputa Bhasma Siddhi Lakshanas were attained swarnamakshika Marana was done by using Nimbuka swarasa until bhasma siddi lakshanas found and it took 10 puta till it attained reddish brown color. The X-ray diffraction analysis showed that d-identified peaks after 10th puta Swarnamakshika bhasma composition is of Iron oxide with rhombohedral crystal system as main component. EDX analysis of Swarna makshika bhasma shows that it contains Iron and Oxygen, as major element and Copper, Sulphur, Carbon, Aluminium, Calcium etc. as minor elements. FESEM study revealed that the particle size of Ashudha and Shudha Swarnamakshika was in the range of 500 nm-3nm. Keywords: Swarnamakshika Bhasma, Nimbuka swarasa, puta

scholarly journals X-Ray Single Crystal Structural Analysis of Magnetically Oriented Microcrystals

2014 ◽  
Vol 70 (a1) ◽  
pp. C1138-C1138
Author(s):  
Chiaki Tsuboi ◽  
Kazuki Aburaya ◽  
Shingo Higuchi ◽  
Fumiko Kimura ◽  
Masataka Maeyama ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Crystal Structure ◽  
Single Crystal ◽  
Three Dimensional ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Data Set ◽  
Uv Curable ◽  
X Ray

We have developed magnetically oriented microcrystal array (MOMA) technique that enables single crystal X-ray diffraction analyses from microcrystalline powder. In this method, microcrystals suspended in a UV-curable monomer matrix are there-dimensionally aligned by special rotating magnetic field, followed by consolidation of the matrix by photopolymerization. From thus achieved MOMAs, we have been succeeded in crystal structure analysis for some substances [1, 2]. Though MOMA method is an effective technique, it has some problems as follows: in a MOMA, the alignment is deteriorated during the consolidation process. In addition, the sample microcrystals cannot be recovered from a MOMA. To overcome these problems, we performed an in-situ X-ray diffraction measurement using a three-dimensional magnetically oriented microcrystal suspension (3D MOMS) of L-alanine. An experimental setting of the in-situ X-ray measurement of MOMS is schematically shown in the figure. L-alanine microcrystal suspension was poured into a glass capillary and placed on the rotating unit equipped with a pair of neodymium magnets. Rotating X-ray chopper with 10°-slits was placed between the collimator and the suspension. By using this chopper, it was possible to expose the X-ray only when the rotating MOMS makes a specific direction with respect to the impinging X-ray. This has the same effect as the omega oscillation in conventional single crystal measurement. A total of 22 XRD images of 10° increments from 0° to 220° were obtained. The data set was processed by using conventional software to obtain three-dimensional molecular structure of L-alanine. The structure is in good agreement with that reported for the single crystal. R1 and wR2 were 6.53 and 17.4 %, respectively. RMSD value between the determined molecular structure and the reported one was 0.0045 Å. From this result, we conclude that this method can be effective and practical to be used widely for crystal structure analyses.

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