Examination of optical fibers by the luminescent method in the scanning electron microscope (SEM)
Light is transmitted along the central core of an optical fiber by total internal reflection at the interface with the surrounding layer. Here, we describe a method by which the optical properties of a cross-sectioned fibre can be studied by means of the luminescent image in the scanning electron microscope (SEM).The sample is prepared by depositing a thin cathodoluminescent layer over the end of a broken or cross-sectioned optical fiber. A thin conducting layer is then deposited to prevent charging. The far end of the fiber is optically coupled to a photomultiplier. During examination in the SEM, the sample is scanned by a fine electron beam, which gives a localised source of light on the surface of the sample at the point of impact of the beam. The quantity of light that is transmitted along the fiber to the photomultiplier determines the brightness of that particular pixel in the recorded image.