Angular Resolved Electron Spectroscopy with Parallel Recording

1990 ◽  
Vol 48 (2) ◽  
pp. 370-371
Author(s):  
Huang Min ◽  
P.S. Flora ◽  
C.J. Harland ◽  
J.A. Venables
Keyword(s):  
Electron Spectroscopy ◽  
Low Voltage ◽  
Solid Angle ◽  
Detection System ◽  
Voltage Electron ◽  
Cylindrical Mirror ◽  
Inner Radius ◽  
Channel Plate ◽  
And Performance ◽  
Type Detector

A cylindrical mirror analyser (CMA) has been built with a parallel recording detection system. It is being used for angular resolved electron spectroscopy (ARES) within a SEM. The CMA has been optimised for imaging applications; the inner cylinder contains a magnetically focused and scanned, 30kV, SEM electron-optical column. The CMA has a large inner radius (50.8mm) and a large collection solid angle (Ω > 1sterad). An energy resolution (ΔE/E) of 1-2% has been achieved. The design and performance of the combination SEM/CMA instrument has been described previously and the CMA and detector system has been used for low voltage electron spectroscopy. Here we discuss the use of the CMA for ARES and present some preliminary results.The CMA has been designed for an axis-to-ring focus and uses an annular type detector. This detector consists of a channel-plate/YAG/mirror assembly which is optically coupled to either a photomultiplier for spectroscopy or a TV camera for parallel detection.

Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes

2011 ◽  
Vol 98 (17) ◽  
pp. 174103 ◽  
Author(s):  
Osamu Kamimura ◽  
Yosuke Maehara ◽  
Takashi Dobashi ◽  
Keita Kobayashi ◽  
Ryo Kitaura ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Structure ◽  
Low Voltage ◽  
Single Wall Carbon Nanotubes ◽  
Diffractive Imaging ◽  
Single Wall Carbon ◽  
Voltage Electron

Analysis of the possibility of performing microminiature low-voltage electron devices for vacuum millimeter-wavelength integral circuit

1994 ◽  
Author(s):  
Yuri V. Gulyaev ◽  
I. S. Nefyodov ◽  
A. V. Nechaev ◽  
Nickolay I. Sinitsyn ◽  
Gennadii V. Torgashov ◽  
...  
Keyword(s):  
Low Voltage ◽  
Millimeter Wavelength ◽  
Voltage Electron ◽  
Integral Circuit ◽  
Electron Devices

Promising Zn3Ta2O8:Pr3+ Red Phosphor for Low Voltage Cathodoluminescence Applications

2011 ◽  
Vol 306-307 ◽  
pp. 251-254 ◽  
Author(s):  
Shreyas S. Pitale ◽  
L.L. Noto ◽  
I.M. Nagpure ◽  
O.M. Ntwaeaborwa ◽  
J.J. Terblans ◽  
...  
Keyword(s):  
Electron Beam ◽  
Photoelectron Spectroscopy ◽  
Low Voltage ◽  
Chemical Constituents ◽  
High Energy ◽  
Binding Energies ◽  
Xenon Lamp ◽  
Voltage Electron ◽  
Information Displays ◽  
Prime Concern

Zn3Ta2O8 is a promising host for low voltage cathodoluminescence (CL) applications. Surface chemical stability during low voltage electron beam excitation is a prime concern for phosphors to be used in various new generation information displays. Photoluminescence (PL) and CL characteristics of the Zn3Ta2O8 host doped with Pr3+ are presented. The phosphors were synthesized via solid-state reaction route at 1100°C. Red CL or PL with a maximum at 611 nm, attributed to the 1D2-3H4 transition of the Pr3+ ion, was observed at room temperature under high energy electron (2 keV, 12 μA) or a monochromatic xenon lamp (257 nm) irradiation. Electron stimulated chemical changes on the surface of the Zn3Ta2O8:Pr3+ phosphor during an electron beam exposure from 0-350 C/cm2 was monitored using Auger electron spectroscopy. The CL exhibited only a 20% loss in the original intensity during the continuous electron beam exposure. X-ray photoelectron spectroscopy (XPS) was used to estimate the redox states of the chemical constituents and a comparison of binding energies was made with the standard Ta2O5 and ZnO compounds. A correlation between the structural configuration of Zn3Ta2O8 and the XPS data is also established.

The Distribution of Phosphorus in Romano-British Ironwork

1990 ◽  
Vol 185 ◽  
Author(s):  
Alain E. Kaloyeros ◽  
Robert M. Ehrenreich
Keyword(s):  
Electron Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Materials Analysis ◽  
X Ray ◽  
Transmission Electron ◽  
Depth Study ◽  
Iron Artifacts ◽  
And Performance ◽  
Secondary Ion

AbstractPhosphorus is found to be a common impurity in many of the iron tools and weapons produced during the pre-Roman and Roman Iron Ages of Britain (600 BC - 300 AD). The effects of this impurity on the properties and performance of antiquarian materials is not well understood, however. This paper presents the initial findings of an in-depth study of the distribution, chemistry, and effects of phosphorus in Romano-British ironwork. For this purpose, two Romano-British iron artifacts from the site of Ircheoter, Northamptonshire, were examined using powerful techniques for archeological materials analysis that include electron microprobe, secondary ion mass spectroscopy (SIMS), transmission electron microscopy (TEM) with energydispersive x-ray spectroscopy capabilities (EDXS), and Auger electron spectroscopy (AES). It was found that phosphorous was indeed present in the artifacts. The phosphorus atoms were predominantly segregated at grain boundaries and thus should have led to a lowering of grain boundary cohesion and a degradation in the performance of the tools.

Low voltage electron beam lithography in self‐assembled ultrathin films with the scanning tunneling microscope

1994 ◽  
Vol 64 (3) ◽  
pp. 390-392 ◽  
Author(s):  
C. R. K. Marrian ◽  
F. K. Perkins ◽  
S. L. Brandow ◽  
T. S. Koloski ◽  
E. A. Dobisz ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ultrathin Films ◽  
Electron Beam Lithography ◽  
Scanning Tunneling Microscope ◽  
Low Voltage ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Voltage Electron ◽  
Self Assembled

Temperature-gradient analyzers for non-resonant inelastic X-ray scattering

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Daisuke Ishikawa ◽  
Alfred Q. R. Baron
Keyword(s):  
Temperature Gradient ◽  
Solid Angle ◽  
Dispersion Compensation ◽  
Full Width ◽  
Half Maximum ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
And Performance

The detailed fabrication and performance of the temperature-gradient analyzers that were simulated by Ishikawa & Baron [(2010). J. Synchrotron Rad. 17, 12–24] are described and extended to include both quadratic and 2D gradients. The application of a temperature gradient compensates for geometric contributions to the energy resolution while allowing collection of a large solid angle, ∼50 mrad × 50 mrad, of scattered radiation. In particular, when operating relatively close to backscattering, π/2 − θB = 1.58 mrad, the application of a gradient of 1.32 K per 80 mm improves the measured total resolution from 60 to 25 meV at the full width at half-maximum, while when operating further from backscattering, π/2 − θB = 6.56 mrad, improvement from 330 to 32 meV is observed using a combination of a gradient of 6.2 K per 80 mm and dispersion compensation with a position-sensitive detector. In both cases, the operating energy was 15.8 keV and the incident bandwidth was 22 meV. Notably, the use of a temperature gradient allows a relatively large clearance at the sample, permitting installation of more complicated sample environments.

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