Application of high-pressure scanning electron microscopy (ECO-SEM) in forensic sample analysis
Traditionally to obtain satisfactory images and reasonable resolution with a Scanning Electron Microscope (SEM), it has been necessary to employ a high vacuum within the sample chamber.High vacuum can result in the dehydration of materials with an alteration of sample morphology and in some cases the introduction of artifacts. In such an environment, samples that are nonconductive experience extensive charging with image degradation. Samples of forensic concern, such as textile bundles or swatches, exhibit this problem even after the application of metal coating. The problem is even more pronounced when carbon coating is used, as is often the preference of forensic microscopists in order to simplify interpretation of the EDX spectra.The commercial availability of "high pressure" or controlled environment SEMs that operate with sample chamber pressures from 50 to 4000 millitorr, while the electron guns and columns are kept at high vacuum conditions have solved these problems. The presence of this "higher" pressure retards dehydration while charging effects are nearly eliminated.