Is a TEM for “Real World” Application Available Presently?

2001 ◽  
Vol 7 (S2) ◽  
pp. 522-523
Author(s):  
W. Probst ◽  
G. Benner ◽  
B. Kabius ◽  
G. Lang ◽  
S. Hiller ◽  
...  
Keyword(s):  
Real World ◽  
Leading Edge ◽  
Ease Of Use ◽  
Real World Application ◽  
Transmission Electron ◽  
Wide Range ◽  
Race Horse ◽  
Electron Microscopes ◽  
Ray Path ◽  
Technological Opportunities

Transmission electron microscopes have been built along with and guided by technological opportunities since the last five decades. Even though there are some “workhorse” type of microscopes, these instruments are still more or less built from the technological viewpoint and less from the viewpoint of ease of use in a wide range of applications. On the other hand, leading edge applications are the drivers for the development and the use of leading edge technology. The result then is a “race horse” which is of very limited benefit in “Real world”.During the last decade computers have been integrated to build microscope systems. in most cases, however, computers still have to deal with obsolete electron optical ray path designs and thus, have to be used more to overcome the problems of imperfect optics and bad design of ray paths than to provide optimized “Real world” capabilities.

scholarly journals Atomically resolved tomographic reconstruction of nanoparticles from Single Projection: influence of amorphous carbon support

2020 ◽  
Author(s):  
Pritam Banerjee ◽  
Chiranjit Roy ◽  
Subhra Kanti De ◽  
Antonio J. Santos ◽  
Francisco M. Morales ◽  
...  
Keyword(s):  
Amorphous Carbon ◽  
Tomographic Reconstruction ◽  
Carbon Film ◽  
Carbon Support ◽  
Atomic Scale ◽  
Structure Property ◽  
Transmission Electron ◽  
Wide Range ◽  
Correlation Information ◽  
Electron Microscopes

Abstract Nanoparticles have a wide range of applications due to their unique geometry and arrangement of atoms. For a precise structure-property correlation, information regarding atomically resolved 3D structures of nanoparticles is utmost beneficial. Though modern aberration-corrected transmission electron microscopes can resolve atoms with sub-angstrom resolution, an atomic-scale 3D reconstruction of nanoparticle is a challenge using tilt series tomography due to high radiation damage. Instead, inline 3D holography based tomographic reconstructions from single projection registered at low electron doses are more suitable for defining atoms dispositions at nanostructures. Nanoparticles are generally supported on amorphous carbon film for TEM experiments. However, neglecting the influence of carbon film on the tomographic reconstruction of the nanoparticle may lead to ambiguity. In order to address this issue, the effect of amorphous carbon support was quantitatively studied using simulations and experiments.

SHaRE: Collaborative materials science research

1988 ◽  
Vol 46 ◽  
pp. 804-805
Author(s):  
Edward A. Kenik ◽  
Karren L. More
Keyword(s):  
Electron Microscope ◽  
Materials Science ◽  
Analytical Electron Microscopy ◽  
Science Research ◽  
Atom Probe ◽  
Probe Field ◽  
Transmission Electron ◽  
Wide Range ◽  
Analytical Electron ◽  
Electron Microscopes

The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, techniques, and recognized expertise in the Division. The microscopy facilities include four analytical electron microscopes (one 300 kV, one 200 kV, and two 120 kV instruments), a conventional transmission electron microscope with a low field polepiece for examination of ferromagnetic materials, a high voltage (1 MV) electron microscope with a number of in situ capabilities, and a variety of EM support facilities. An atom probe field-ion microscope provides microstructural and elemental characterization at atomic resolution.

High-performance EM-002B optical column construction for future expansion

1993 ◽  
Vol 51 ◽  
pp. 256-257
Author(s):  
K. Shirota ◽  
K. Moriyama ◽  
S. Mikami ◽  
A. Ando ◽  
O. Nakamura ◽  
...  
Keyword(s):  
High Performance ◽  
Cold Trap ◽  
Objective Lens ◽  
Transmission Electron ◽  
Probe Size ◽  
Wide Range ◽  
Electron Microscopes ◽  
Time Required ◽  
Modern Analytical ◽  
Typical User

Since modern analytical transmission electron microscopes must have a wide range of illumination conditions (from “mm” to “nm” probe size), an additional lens (one of the condenser lenses, usually called the “mini-lens”) is arranged immediately above the objective lens pole pieces. As a result, it has become very difficult to install an exchange mechanism for the objective pole pieces, which used to be done routinely.To overcome this, TOPCON Electron Microscope EM-OO2B incorporated a new mechanism which can be exchanged quite easily and reliably by the user. This mechanism makes a space to exchange pole pieces, without column disassembly, by precisely driven external mechanisms (Fig. 1). The time required for a typical user to carry out such exchange is usually 15 to 20 minutes, and it will take not more than two hours for high resolution image or analysis after exchange. This time is also shortened by the fact that an anti-contamination cold trap is not generally required in the case of EM-OO2B.

Instrumentation and Computation

1990 ◽  
Vol 48 (1) ◽  
pp. 2-3
Author(s):  
P.B. Hirsch
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Materials Science ◽  
Image Interpretation ◽  
Specimen Preparation ◽  
Scanning Tunnelling Microscope ◽  
Transmission Electron ◽  
Wide Range ◽  
Electron Microscopes ◽  
Types Of Information

The benefit to society arising from developments in instrumentation and computation can be judged primarily by the advances in knowledge and understanding generated by their application in different branches of science, covered in the other papers in this symposium. Without advances in instrumentation none of these advances is possible; developments in instrumentation and in image interpretation are therefore fundamental to and precede scientific advances in fields in which knowledge of structure is important. There is little doubt that the revolutionary first step was the development of the transmission electron microscope (TEM) in 1931 by Ernst Ruska; a second was the development of the scanning electron microscope (SEM); and the third the introduction of the scanning tunnelling microscope (STM) for high resolution surface imaging, by Binnig and Rohrer.The TEM and SEM have undergone continuous developments over the last 50 years or so, and have had a far-reaching impact in a wide range of disciplines; the STM is a relative newcomer but no doubt it too will have an increasing impact in furthering our understanding of solids and surfaces in particular. Once the basic instruments became available subsequent developments have been driven by the demands of the scientific disciplines in which these instruments have been applied. Many of the new developments in instrumentation and interpretation have been pioneered by the users themselves, and these in turn have led to modifications in commercial instruments to make such advances in technique available to the user community as a whole. Other developments have been initiated directly by the manufacturers as a result of a perceived need. There has been and continues to be a close interaction between the developers of hardware (not only of electron microscopes but also of ancillary equipment, e.g. microanalysis attachments, image processing equipment, specialist specimen stages, and specimen preparation facilities) and the users, leading to extensions in the range of applications and the types of information which can be obtained by electron microscopy. The following examples from the developments of electron microscopy in Materials Science illustrate these interactions and the particular advances arising from specific developments:

Tutorial on Off-Axis Electron Holography

2002 ◽  
Vol 8 (6) ◽  
pp. 447-466 ◽  
Author(s):  
Michael Lehmann ◽  
Hannes Lichte
Keyword(s):  
Materials Science ◽  
Electron Holography ◽  
Large Area ◽  
Transmission Electron ◽  
Step Procedure ◽  
Medium Resolution ◽  
Wide Range ◽  
Electric Potentials ◽  
Electron Microscopes ◽  
Powerful Electron

Through recent years, off-axis electron holography has helped us to understand and to overcome some experimental restrictions in transmission electron microscopy. With development of powerful electron microscopes, slow-scan CCD cameras, and computers, holography is not an academic technique anymore used by specialized laboratories. Holography has proven its wide range of applications in solving real-world problems in materials science and biology. At medium resolution, that is, on nanometer scale, holography allows access to large area phase contrast produced by magnetic fields and electric potentials. In the high-resolution domain, holography unveils its power by unscrambling amplitude and phase of the electron wave, resulting in an improved lateral resolution up to the information limit. Holography is a thoroughly quantitative method, and, in combination with the perfect zero-loss filtering inherent to this method, the interpretation of the reconstructed data is strongly simplified. After outlining the basics of holography, in this tutorial we focus on development of a step-by-step procedure for recording and reconstruction of holograms. At the end, some recent applications are discussed.

scholarly journals Low Vacuum SEMs: Latest Generation Technologies and Applications

2007 ◽  
Vol 15 (4) ◽  
pp. 20-25
Author(s):  
William Neijssen ◽  
Ben Lich ◽  
Pete Carleson
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
High Vacuum ◽  
Ease Of Use ◽  
Wide Range ◽  
Sample Chamber ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Backscatter Diffraction

Since becoming popular more than a decade ago, low vacuum scanning electron microscopes (SEM) have continued to evolve. The latest systems offer uncompromised performance over an unprecedented range of sample chamber vacuum conditions. Instruments are now available that provide near-nanometer resolution in all vacuum modes and the ability to operate at pressures as high as 4000 Pascals (~30 Torr). Low vacuum operation eliminates much of the sample preparation required for conventional (high vacuum) SEM. Insulating samples can be imaged without conductive coatings. Wet, dirty, outgassing samples can be examined without drying and fixing. Systems can also be configured with a wide range of ancillary capabilities for imaging, analysis, and sample manipulation, including advanced secondary, backscattered, and transmitted electron detection, X-ray spectrometry, electron backscatter diffraction, and focused ion beam (FIB) manipulation. The current generation of systems combine speed, flexibility, repeatability, and ease of use, making them the ideal solution for any laboratory that must satisfy a wide range of imaging and analytical demands.

scholarly journals FEI Titan G3 50-300 PICO

2015 ◽  
Vol 1 ◽  
Author(s):  
Karsten Tillmann ◽  
Juri Barthel ◽  
Lothar Houben
Keyword(s):  
Electron Gun ◽  
Atomic Scale ◽  
Fourth Generation ◽  
High Brightness ◽  
Transmission Electron ◽  
Wide Range ◽  
Schottky Type ◽  
Resolution Analysis ◽  
Technical Specifications ◽  
Electron Microscopes

The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale and thus necessitating true atomic resolution analysis capabilities. For these purposes, the FEI Titan G3 50-300 PICO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a monochromator unit, and a Cs probe corrector (CEOS DCOR), a Cs-Cc achro-aplanat image corrector (CEOS CCOR+), a double biprism, a post-column energy filter system (Gatan Quantum 966 ERS) as well as a 16 megapixel CCD system (Gatan UltraScan 4000 UHS). Characterised by a TEM and STEM resolution well below 50 pm at 200 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in the world. Typical examples of use and technical specifications for the instrument are given below.

scholarly journals Robust Asymmetric Bayesian Adaptive Matrix Factorization

2017 ◽  
Author(s):  
Xin Guo ◽  
Boyuan Pan ◽  
Deng Cai ◽  
Xiaofei He
Keyword(s):  
Real World ◽  
Matrix Factorization ◽  
State Of The Art ◽  
Low Rank ◽  
Data Sets ◽  
Real World Application ◽  
Factorization Model ◽  
Rank Matrix ◽  
Wide Range ◽  
Low Rank Matrix

Low rank matrix factorizations(LRMF) have attracted much attention due to its wide range of applications in computer vision, such as image impainting and video denoising. Most of the existing methods assume that the loss between an observed measurement matrix and its bilinear factorization follows symmetric distribution, like gaussian or gamma families. However, in real-world situations, this assumption is often found too idealized, because pictures under various illumination and angles may suffer from multi-peaks, asymmetric and irregular noises. To address these problems, this paper assumes that the loss follows a mixture of Asymmetric Laplace distributions and proposes robust Asymmetric Laplace Adaptive Matrix Factorization model(ALAMF) under bayesian matrix factorization framework. The assumption of Laplace distribution makes our model more robust and the asymmetric attribute makes our model more flexible and adaptable to real-world noise. A variational method is then devised for model inference. We compare ALAMF with other state-of-the-art matrix factorization methods both on data sets ranging from synthetic and real-world application. The experimental results demonstrate the effectiveness of our proposed approach.

Progress in Computer Assisted Electron Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1093-1094
Author(s):  
M. Pan ◽  
K. Ishizuka ◽  
C. E. Meyer ◽  
O. L. Krivanek ◽  
J. Sasakit ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Computer Control ◽  
Image Features ◽  
Ease Of Use ◽  
External Control ◽  
Objective Lens ◽  
Computer Assisted ◽  
Serial Interface ◽  
Transmission Electron ◽  
Electron Microscopes

All the lenses, deflectors and stigmators of contemporary electron microscopes are controlled digitally by an internal computer. Control through RS232 serial interface by an external computer has also become a standard feature. This external control has made so-called computer assisted electron microscopy (CAEM) possible and practical. We are developing a CAEM system with two objectives: (1) to free inexperienced microscopists from technical details of operating an electron microscope, especially transmission electron microscopes (TEM); (2) to assist experienced microscopists to operate their microscopes with higher accuracy and efficiency. The features include automated and/or assisted standard operations in focusing, stigmating, and aligning the microscope, and also sophisticated tuning that requires the evaluation of subtle changes in image features such as aligning the incident electron beam direction in the presence of 3-fold astigmatism in objective lens. CAEM can further assist operators in selecting areas or objects and taking images/diffraction/energy spectrum with all the parameters well controlled and catalogued together, thus not only enabling ease-of-use and high accuracy in operation but also yielding more information on the specimen.

Microscopy in the Real World - Instrumentation Requirements

2001 ◽  
Vol 7 (S2) ◽  
pp. 524-525
Author(s):  
Brian Cunningham
Keyword(s):  
Electron Microscopy ◽  
High Performance ◽  
Ease Of Use ◽  
User Requirements ◽  
End User ◽  
Transmission Electron ◽  
Reasonable Cost ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

In the last two decades, microscopy, in particular transmission electron microscopy, has moved from the research environment into industry. As such, the user requirements of the microscopes have changed. Previously, users required the highest performance in all aspects of microscopy e.g. imaging, analytical capabilities, with little regard to other factors. Today, additional requirements are being placed on areas such as ease of use, reliability, high throughput, expanded sample requirements, and networking capabilities. However, the “high performance” aspects of the instrumentation are still a high priority to the end user. These user requirements cause microscope manufacturers a dilemma in many instances. It is not always possible to provide the “new” requirements while still maintaining the high performance of the instruments, at a “reasonable” cost. An example is the large sample requirements in scanning electron microscopes. Large stages are inherently more prone to vibration than smaller stages, and therefore adversely affect resolution.

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