Imaging Cell Surface Macromolecular Distribution by Mapping Intermolecular Interactions with an Atomic Force Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 976-977
Author(s):  
R. Bhatia ◽  
H. Lin ◽  
A. Quist ◽  
G. Primbs ◽  
N. Desai ◽  
...  
Keyword(s):  
Endothelial Cells ◽  
Cell Surface ◽  
Atomic Force Microscope ◽  
Real Time ◽  
Intermolecular Interactions ◽  
Growth Factor Receptor ◽  
Atomic Force ◽  
Afm Imaging ◽  
Recent Developments ◽  
Afm Probe

An atomic force microscope (AFM) can image real-time intermolecular interactions between complementary macromolecules, such as receptor-ligand and antigen-antibody with nanometer resolution in hydrated state. Recent developments in AFM imaging allow mapping of such interaction forces over a large surface area such that local as well as global distribution of complementary biomolecules could be ascertained simultaneously. Using the force-volume maps and AFM probe conjugated with antibody, we have mapped the reorganization of specific receptors on the cell surface as well as the resultant changes in cellular micromechanical properties, such as elasticity and cytoskeletal reorganization of the cell (Figure 1).In present study, we have mapped vascular endothelial growth factor receptor (VEGF-R) in the plasma membrane of cultured endothelial cells using anti-VEGFR - antibody conjugated to AFM probe. VEGF induced changes in cytoskeleton reorganization in endothelial cells were observed by real-time AFM imaging.

Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurements

2011 ◽  
Vol 22 (9) ◽  
pp. 094017
Author(s):  
Xiaomei Chen ◽  
Ludger Koenders ◽  
Helmut Wolff ◽  
Holger Neddermeyer ◽  
Frank Haertig
Keyword(s):  
Atomic Force Microscope ◽  
Real Time ◽  
Atomic Force ◽  
Displacement Measurements

A Finite-Impulse-Response-Based Approach to Control Acoustic-Caused Probe-Vibration in Atomic Force Microscope Imaging

2017 ◽  
Author(s):  
Sicheng Yi ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscope ◽  
Impulse Response ◽  
Controller Design ◽  
Finite Impulse Response ◽  
Feedforward Control ◽  
Acoustic Noise ◽  
Noise Cancellation ◽  
Control Approach ◽  
Atomic Force ◽  
Afm Imaging

In this paper, we propose a finite-impulse-response (FIR)-based feedforward control approach to mitigate the acoustic-caused probe vibration during atomic force microscope (AFM) imaging. Compensation for the extraneous probe vibration is needed to avoid the adverse effects of environmental disturbances such as acoustic noise on AFM imaging, nanomechanical characterization, and nanomanipulation. Particularly, residual noise still exists even though conventional passive noise cancellation apparatus has been employed. The proposed technique exploits a data-driven approach to capture both the noise propagation dynamics and the noise cancellation dynamics in the controller design, and is illustrated through the experimental implementation in AFM imaging application.

Theoretical Approach to Contrast Mechanism for U-AFM

2002 ◽  
Author(s):  
C. Miyasaka ◽  
B. R. Tittmann ◽  
T. Adachi ◽  
A. Yamaji
Keyword(s):  
Theoretical Analysis ◽  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Dynamic Theory ◽  
Beam Theory ◽  
Ultrasonic Waves ◽  
Two Dimensional ◽  
Atomic Force ◽  
Afm Imaging ◽  
Contrast Mechanism

When the Ultrasonic-Atomic Force Microscope (U-AFM) is used to form an image of a surface of a specimen having discontinuities, contrast of the specimen in the image is usually stronger than that of an image formed by a conventional Atomic Force Microscope (AFM). In this article, the mechanism of the contrast of the image obtained by the U-AFM was explained by theoretical analysis. A ceramic and metal jointed bar (Steel/Cu/Si3N4) was selected as a specimen for this study. The specimen was located on the surface of a disc transducer generating ultrasonic waves up to 500 KHz, and was vibrated, wherein its first resonant frequency was 133.43 kHz. Both stress and displacement of the specimen were analyzed by classical beam theory and the two-dimensional elasto-dynamic theory. Experimental U-AFM imaging analyses were also carried out to compare the results.

scholarly journals A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Jizhong He
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Optical Imaging ◽  
Hard Disk Drive ◽  
Disk Drive ◽  
Atomic Force ◽  
Typical Data ◽  
Afm Imaging ◽  
Afm Analysis

We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM) for hard disk drive (HDD) media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.

Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Florian Krohs ◽  
Cagdas Onal ◽  
Metin Sitti ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscope ◽  
Estimation Method ◽  
Thermal Drift ◽  
Promising Technique ◽  
Drift Estimation ◽  
Atomic Force ◽  
Drift Compensation ◽  
Monte Carlo Localization ◽  
Afm Probe

While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter, the assembly of nano-objects, is a very promising technique for prototyping nanoelectronical devices that are composed of DNA-based nanowires, CNTs, etc. But, pushing nano-objects in the order of a few nanometers nowadays remains a very challenging, labor-intensive task that requires frequent human intervention. To increase throughput of AFM-based nanomanipulation, automation can be considered as a long-term goal. However, automation is impeded by spatial uncertainties existing in every AFM system. This article focuses on thermal drift, which is a crucial error source for automating AFM-based nanoassembly, since it implies a varying, spatial displacement between AFM probe and sample. A novel, versatile drift estimation method based on Monte Carlo localization is presented and experimental results obtained on different AFM systems illustrate that the developed algorithm is able to estimate thermal drift inside an AFM reliably even with highly unstructured samples and inside inhomogeneous environments.

Imaging Single Nacreous Tablets with the Atomic Force Microscope

1994 ◽  
Vol 332 ◽  
Author(s):  
R. Giles ◽  
S. Manne ◽  
C.M. Zaremba ◽  
A. Belcher ◽  
S. Mann ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Sea Water ◽  
Three Dimensional ◽  
Force Microscopy ◽  
Topographic Features ◽  
Atomic Force ◽  
Recent Developments ◽  
Growth Experiments ◽  
Dimensional Picture

ABSTRACTAfter describing some recent developments in atomic force microscopy (AFM), a specific application to the study of shell ultrastructure is examined in detail. By embedding bleached nacreous tablets in epoxy and imaging them with the atomic force microscope (AFM) during in situ dissolution, it was possible to visualize the topography of both the top faces of the tablets and the impressions in epoxy made by the bottom faces of the tablets. This epoxy imprint reproduced tablet features down to the 10 nm scale. Using this technique it should be possible to measure correspondence between topographic features on the proximal and distal faces of tablets, which is necessary to form a three-dimensional picture of the nacreous region. In addition to these dissolution experiments, growth experiments (in modified sea water) on bleached, embedded tablets indicated that aragonite grows on a tablet as asperities oriented along the c axis, normal to the tablet surface. No change was seen on the surface of the epoxy, which confirmed that the crystals were growing on the tablet surface, not spontaneously nucleating out of solution.

Wear Characteristics of Atomic Force Microscope Probe Tips

2005 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Electron Microscope ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Probe ◽  
Silicon Silicon ◽  
Microscope Probe ◽  
Scanning Electron

In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (FESEM) analyses were utilized. Using the Archard’s wear equation, the degree of the probe tip wear was quantitatively assessed. Based on the experimental results and analysis, the plausible wear mechanisms of the AFM probe tips were proposed in an effort to understand the nano-scale wear.

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