scholarly journals A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Jizhong He
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Optical Imaging ◽  
Hard Disk Drive ◽  
Disk Drive ◽  
Atomic Force ◽  
Typical Data ◽  
Afm Imaging ◽  
Afm Analysis

We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM) for hard disk drive (HDD) media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.

scholarly journals A Comment on AFM vs. Replicas for High Resolution Imaging

2006 ◽  
Vol 14 (3) ◽  
pp. 50-50
Author(s):  
Don Chernoff
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Hard Disk Drive ◽  
Disk Drive ◽  
High Resolution Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging ◽  
Offline Analysis ◽  
Over 40 Years

High-resolution Pt/C shadowing and replication provided important insights into the size and shape of polymers beginning over 40 years ago. The first images of DNA molecules were made this way. However, in my opinion, this methodology has largely been supplanted by the use of Atomic Force Microscopy (AFM), both for direct height measurements (available in Pt/C replicas by measuring shadow lengths when the coating is deposited from one direction only) and for imaging molecular contours.As an everyday example, consider that making a magnetic read and write head for a hard disk drive requires controlling the relative heights of several different regions to a tolerance of about 1 nm. AFM supports production by providing a rapid means of offline analysis, far faster and more precise than any replica method could be.

scholarly journals Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

2016 ◽  
Vol 87 (7) ◽  
pp. 073702 ◽  
Author(s):  
H. von Allwörden ◽  
K. Ruschmeier ◽  
A. Köhler ◽  
T. Eelbo ◽  
A. Schwarz ◽  
...  
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Atomic Force ◽  
Set Up

Imaging of Xenopus laevis Oocyte Plasma Membrane in Physiological-Like Conditions by Atomic Force Microscopy

2013 ◽  
Vol 19 (5) ◽  
pp. 1358-1363 ◽  
Author(s):  
Massimo Santacroce ◽  
Federica Daniele ◽  
Andrea Cremona ◽  
Diletta Scaccabarozzi ◽  
Michela Castagna ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Plasma Membrane ◽  
High Resolution ◽  
Membrane Proteins ◽  
Xenopus Laevis ◽  
Functional Study ◽  
Xenopus Laevis Oocyte ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

AbstractXenopus laevis oocytes are an interesting model for the study of many developmental mechanisms because of their dimensions and the ease with which they can be manipulated. In addition, they are widely employed systems for the expression and functional study of heterologous proteins, which can be expressed with high efficiency on their plasma membrane. Here we applied atomic force microscopy (AFM) to the study of the plasma membrane of X. laevis oocytes. In particular, we developed and optimized a new sample preparation protocol, based on the purification of plasma membranes by ultracentrifugation on a sucrose gradient, to perform a high-resolution AFM imaging of X. laevis oocyte plasma membrane in physiological-like conditions. Reproducible AFM topographs allowed visualization and dimensional characterization of membrane patches, whose height corresponds to a single lipid bilayer, as well as the presence of nanometer structures embedded in the plasma membrane and identified as native membrane proteins. The described method appears to be an applicable tool for performing high-resolution AFM imaging of X. laevis oocyte plasma membrane in a physiological-like environment, thus opening promising perspectives for studying in situ cloned membrane proteins of relevant biomedical/pharmacological interest expressed in this biological system.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

Coupling In-Situ Techniques to Analyze Zinc Deposition and Dissolution for Energy Storage Applications

2013 ◽  
Vol 1491 ◽  
Author(s):  
Jayme Keist ◽  
Christine Orme ◽  
Frances Ross ◽  
Dan Steingart ◽  
Paul Wright ◽  
...  
Keyword(s):  
Liquid Electrolyte ◽  
Scattering Data ◽  
Zinc Deposition ◽  
Ionic Liquid Electrolyte ◽  
Force Microscopy ◽  
In Situ Techniques ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Afm Analysis

ABSTRACTThis investigation describes preliminary results of in-situ analysis of zinc deposition within an ionic liquid electrolyte utilizing electrochemical atomic force microscopy (EC AFM). From the AFM analysis, the morphology of the zinc deposition was analyzed by quantifying the surface roughness using height-height correlation functions. These results will be used to analyze the scattering data obtained from zinc deposition analysis utilizing an electrochemical ultra-small angle x-ray scattering (EC USAXS). The goal of this research is to link the early nucleation and growth behavior to the formation of detrimental morphologies.

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