scholarly journals Tailoring Wettability Properties of GaN Epitaxial Layers through Surface Porosity Induced during CVD Deposition

Langmuir ◽  
2021 ◽  
Author(s):  
Josué Mena ◽  
Joan J. Carvajal ◽  
Vitaly Zubialevich ◽  
Peter J. Parbrook ◽  
Francesc Díaz ◽  
...  
Author(s):  
Thomas P. Turnbull ◽  
W. F. Bowers

Until recently the prime purposes of filters have been to produce clear filtrates or to collect particles from solution and then remove the filter medium and examine the particles by transmission electron microscopy. These filters have not had the best characteristics for scanning electron microscopy due to the size of the pores or the surface topography. Advances in polymer chemistry and membrane technology resulted in membranes whose characteristics make them versatile substrates for many scanning electron microscope applications. These polysulphone type membranes are anisotropic, consisting of a very thin (0.1 to 1.5 μm) dense skin of extremely fine, controlled pore texture upon a much thicker (50 to 250μm), spongy layer of the same polymer. Apparent pore diameters can be controlled in the range of 10 to 40 A. The high flow ultrafilters which we are describing have a surface porosity in the range of 15 to 25 angstrom units (0.0015-0.0025μm).


1988 ◽  
Vol 49 (C4) ◽  
pp. C4-693-C4-696 ◽  
Author(s):  
J. P. LAURENTI ◽  
P. ROENTGEN ◽  
K. WOLTER ◽  
K. SEIBERT ◽  
H. KURZ ◽  
...  
Keyword(s):  

2002 ◽  
Vol 719 ◽  
Author(s):  
Masashi Kato ◽  
Masaya Ichimura ◽  
Eisuke Arai ◽  
Shigehiro Nishino

AbstractEpitaxial layers of 4H-SiC are grown on (0001) substrates inclined toward <1120> and <1100> directions. Defects in these films are characterized by deep level transient spectroscopy (DLTS) in order to clarify the dependence of concentrations and activation energies on substrate inclination. DLTS results show no such dependence on substrate inclination but show thickness dependence of the concentration.


1989 ◽  
Vol 54 (11) ◽  
pp. 2933-2950
Author(s):  
Emerich Erdös ◽  
Petr Voňka ◽  
Josef Stejskal ◽  
Přemysl Klíma

This paper represents a continuation and ending of the kinetic study of the gallium arsenide formation, where a so-called inhomogeneous model is proposed and quantitatively formulated in five variants, in which two kinds of active centres appear. This model is compared both with the experimental data and with the previous sequence of homogeneous models.


2021 ◽  
Vol 560-561 ◽  
pp. 126033
Author(s):  
J. Erlekampf ◽  
M. Rommel ◽  
K. Rosshirt-Lilla ◽  
B. Kallinger ◽  
P. Berwian ◽  
...  

Photonics ◽  
2021 ◽  
Vol 8 (6) ◽  
pp. 196
Author(s):  
Tsung-Chi Hsu ◽  
Yu-Tsai Teng ◽  
Yen-Wei Yeh ◽  
Xiaotong Fan ◽  
Kuo-Hsiung Chu ◽  
...  

High-quality epitaxial layers are directly related to internal quantum efficiency. The methods used to design such epitaxial layers are reviewed in this article. The ultraviolet C (UVC) light-emitting diode (LED) epitaxial layer structure exhibits electron leakage; therefore, many research groups have proposed the design of blocking layers and carrier transportation to generate high electron–hole recombination rates. This also aids in increasing the internal quantum efficiency. The cap layer, p-GaN, exhibits high absorption in deep UV radiation; thus, a small thickness is usually chosen. Flip chip design is more popular for such devices in the UV band, and the main factors for consideration are light extraction and heat transportation. However, the choice of encapsulation materials is important, because unsuitable encapsulation materials will be degraded by ultraviolet light irradiation. A suitable package design can account for light extraction and heat transportation. Finally, an atomic layer deposition Al2O3 film has been proposed as a mesa passivation layer. It can provide a low reverse current leakage. Moreover, it can help increase the quantum efficiency, enhance the moisture resistance, and improve reliability. UVC LED applications can be used in sterilization, water purification, air purification, and medical and military fields.


2015 ◽  
Vol 57 (10) ◽  
pp. 1966-1971 ◽  
Author(s):  
V. N. Bessolov ◽  
A. S. Grashchenko ◽  
E. V. Konenkova ◽  
A. V. Myasoedov ◽  
A. V. Osipov ◽  
...  

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