Characterization of the Interfacial Toughness in a Novel “GaN-on-Diamond” Material for High-Power RF Devices
2019 ◽
Vol 1
(3)
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pp. 354-369
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2010 ◽
Vol 2
(1)
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pp. 115-120
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2008 ◽
Vol 4
(4)
◽
pp. 1-10
2015 ◽
Vol 55
(2)
◽
pp. 383-388
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Keyword(s):
Keyword(s):