Local Tuning of Conductivity in Amorphous Titanium Oxide Films by Selective Electron Beam Irradiation

2007 ◽  
Vol 111 (37) ◽  
pp. 13972-13980 ◽  
Author(s):  
P. Kern ◽  
R. Widmer ◽  
P. Gasser ◽  
J. Michler
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Electron Beam Irradiation ◽  
Oxide Films ◽  
Beam Irradiation ◽  
Local Tuning ◽  
Titanium Oxide Films

Effect of N2 ion flux on the photocatalysis of nitrogen-doped titanium oxide films by electron-beam evaporation

2006 ◽  
Vol 252 (10) ◽  
pp. 3729-3736 ◽  
Author(s):  
Tien-Syh Yang ◽  
Min-Chi Yang ◽  
Ching-Bin Shiu ◽  
Wen-Ku Chang ◽  
Ming-Show Wong
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Oxide Films ◽  
Electron Beam Evaporation ◽  
Ion Flux ◽  
Nitrogen Doped ◽  
Titanium Oxide Films

Titanium oxide films on Si(100) deposited by electron-beam evaporation at 250 °C

2000 ◽  
Vol 18 (3) ◽  
pp. 917-921 ◽  
Author(s):  
H. K. Jang ◽  
S. W. Whangbo ◽  
H. B. Kim ◽  
K. Y. Im ◽  
Y. S. Lee ◽  
...  
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Oxide Films ◽  
Electron Beam Evaporation ◽  
Titanium Oxide Films

Huge Photoresistance in Transparent and Conductive Indium Titanium Oxide Films Prepared by Electron Beam–Physical Vapor Deposition

2014 ◽  
Vol 6 (3) ◽  
pp. 1781-1787 ◽  
Author(s):  
Rocío Martínez-Morillas ◽  
Rafael Ramírez ◽  
Jorge Sánchez-Marcos ◽  
Emiliano Fonda ◽  
Alicia de Andrés ◽  
...  
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Oxide Films ◽  
Titanium Oxide Films

Structure and hydrophilicity of titanium oxide films prepared by electron beam evaporation

2004 ◽  
Vol 548 (1-3) ◽  
pp. 75-82 ◽  
Author(s):  
Tien-Syh Yang ◽  
Ching-Bin Shiu ◽  
Ming-Show Wong
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Oxide Films ◽  
Electron Beam Evaporation ◽  
Titanium Oxide Films

Electron-Beam-Induced Topographical, Chemical, and Structural Patterning of Amorphous Titanium Oxide Films

2006 ◽  
Vol 110 (47) ◽  
pp. 23660-23668 ◽  
Author(s):  
P. Kern ◽  
Y. Müller ◽  
J. Patscheider ◽  
J. Michler
Keyword(s):  
Electron Beam ◽  
Titanium Oxide ◽  
Oxide Films ◽  
Titanium Oxide Films

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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