scholarly journals Nanostructure-specific X-ray tomography reveals myelin levels, integrity and axon orientations in mouse and human nervous tissue

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Marios Georgiadis ◽  
Aileen Schroeter ◽  
Zirui Gao ◽  
Manuel Guizar-Sicairos ◽  
Marianne Liebi ◽  
...  
Keyword(s):  
Mouse Brain ◽  
Nervous Tissue ◽  
Signal Transmission ◽  
X Ray ◽  
Tensor Tomography ◽  
Quantitative Studies ◽  
X Ray Scattering ◽  
Imaging Approach ◽  
Non Destructive ◽  
Mri Measurements

AbstractMyelin insulates neuronal axons and enables fast signal transmission, constituting a key component of brain development, aging and disease. Yet, myelin-specific imaging of macroscopic samples remains a challenge. Here, we exploit myelin’s nanostructural periodicity, and use small-angle X-ray scattering tensor tomography (SAXS-TT) to simultaneously quantify myelin levels, nanostructural integrity and axon orientations in nervous tissue. Proof-of-principle is demonstrated in whole mouse brain, mouse spinal cord and human white and gray matter samples. Outcomes are validated by 2D/3D histology and compared to MRI measurements sensitive to myelin and axon orientations. Specificity to nanostructure is exemplified by concomitantly imaging different myelin types with distinct periodicities. Finally, we illustrate the method’s sensitivity towards myelin-related diseases by quantifying myelin alterations in dysmyelinated mouse brain. This non-destructive, stain-free molecular imaging approach enables quantitative studies of myelination within and across samples during development, aging, disease and treatment, and is applicable to other ordered biomolecules or nanostructures.

scholarly journals Fast acquisition protocol for X-ray scattering tensor tomography

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jisoo Kim ◽  
Matias Kagias ◽  
Federica Marone ◽  
Zhitian Shi ◽  
Marco Stampanoni
Keyword(s):  
Null Space ◽  
Sufficient Information ◽  
Single Shot ◽  
Time Resolved ◽  
X Ray ◽  
Circular Pattern ◽  
Rapid Acquisition ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractMicrostructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

scholarly journals Influence of Fiber Deviation on Strength of Thin Birch (Betula pendula Roth.) Veneers

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1484
Author(s):  
Maximilian Pramreiter ◽  
Sabine C. Bodner ◽  
Jozef Keckes ◽  
Alexander Stadlmann ◽  
Cedou Kumpenza ◽  
...  
Keyword(s):  
Tensile Strength ◽  
High Performance ◽  
Betula Pendula ◽  
X Ray ◽  
X Ray Scattering ◽  
Out Of Plane ◽  
Automotive Parts ◽  
Pearson Correlations ◽  
Non Destructive ◽  
Fibril Angle

The currently pursued implementation of wood into novel high performance applications such as automotive parts require knowledge about the material behaviour including ultimate strength. Previous research has shown that fiber deviation seems to be the dominating factor influencing the strength of thin veneers. This study aims to further investigate and quantify the influence of fiber deviation in two dimension and different hierarchical levels on the tensile strength of thin birch veneers. The fiber deviation in- and out-of-plane as well as the micro fibril angle were assessed by means of wide-angle X-ray scattering. Tensile strength was determined in laboratory experiments. Results show a high variability for in-plane fiber deviation mainly constituted by knots and other growth influencing factors. Pearson correlations between strength and fiber deviation ranged from −0.594 up to −0.852. Best correlation (r = −0.852) was achieved for maximum in-plane fiber deviation directly followed by a combined angle of in- and out-of-plane fiber deviation (r = −0.846). Based on the results it was shown that fiber deviation in- and out-of-plane is the dominating factor influencing ultimate tensile strength of thin birch veneers. Further research in regard to non-destructive strength prediction is necessary.

scholarly journals 3D nanoscale analysis of bone healing around degrading Mg implants evaluated by X-ray scattering tensor tomography

2021 ◽  
Author(s):  
Marianne Liebi ◽  
Viviane Lutz-Bueno ◽  
Manuel Guizar-Sicairos ◽  
Bernd M. Schönbauer ◽  
Johannes Eichler ◽  
...  
Keyword(s):  
Bone Healing ◽  
X Ray ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals X-ray Reflectometry and Related Surface Near X-ray Scattering Methods

2014 ◽  
Vol 228 (10-12) ◽  
Author(s):  
Oliver H. Seeck
Keyword(s):  
Grazing Incidence ◽  
Surface Structures ◽  
Wave Optics ◽  
Near Surface ◽  
X Ray ◽  
Full Theory ◽  
X Ray Scattering ◽  
Grazing Incidence Diffraction ◽  
Non Destructive ◽  
Ray Scattering

AbstractSurface sensitive X-ray scattering methods are mostly non-destructive tools which are frequently used to investigate the nature of thin films, interfaces and artificial near surface structures. Discussed here are diffraction based methods, namely reflectometry and the related techniques grazing incidence diffraction and crystal truncation rod measurements. For the experiment, an X-ray beam is diffracted from surface near structures of the sample and detected by adequate detectors. To analyze the data the according X-ray scattering theory has to be applied. The full theory of surface sensitive X-ray scattering is complex and based on general considerations from wave optics. However, instructive insights into the scattering processes are provided by the Born-approximation which in many cases yields sufficient results. The methods are applied to solve the structure of a mercury-electrolyte interface during a chemical reaction and to determine the strain distribution in surface near SiGe quantum dots.

scholarly journals IRIXS Spectrograph: an ultra high-resolution spectrometer for tender RIXS

2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Joel Bertinshaw ◽  
Simon Mayer ◽  
Frank-Uwe Dill ◽  
Hakuto Suzuki ◽  
Olaf Leupold ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
X Rays ◽  
Full Width ◽  
X Ray ◽  
X Ray Scattering ◽  
Imaging Approach ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer ◽  
Better Than

The IRIXS Spectrograph represents a new design of an ultra-high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L 3-edge (2840 eV). First proposed in the field of hard X-rays by Shvyd'ko [(2015), Phys. Rev. A, 91, 053817], the X-ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland-type spectrometer [Gretarsson et al. (2020), J. Synchrotron Rad. 27, 538–544]. In combination with a dispersionless nested four-bounce high-resolution monochromator design that utilizes Si(111) and Al2O3(110) crystals, an overall energy resolution better than 35 meV full width at half-maximum has been achieved at the Ru L 3-edge, in excellent agreement with ray-tracing simulations.

scholarly journals Fast Acquisition Protocol for X-ray Scattering Tensor Tomography

2021 ◽  
Author(s):  
Jisoo Kim ◽  
Matias Kagias ◽  
Federica Marone ◽  
Zhitian Shi ◽  
Marco Stampanoni
Keyword(s):  
Null Space ◽  
Sufficient Information ◽  
Single Shot ◽  
Time Resolved ◽  
X Ray ◽  
Circular Pattern ◽  
Rapid Acquisition ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

Abstract Microstructural information over an entire sample is important to understand the macroscopic behavior of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. Leveraging on these new optical elements, we propose here simple yet inherently rapid acquisition protocols forX-ray scattering tensor tomography. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

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