scholarly journals Influence of Fiber Deviation on Strength of Thin Birch (Betula pendula Roth.) Veneers

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1484
Author(s):  
Maximilian Pramreiter ◽  
Sabine C. Bodner ◽  
Jozef Keckes ◽  
Alexander Stadlmann ◽  
Cedou Kumpenza ◽  
...  
Keyword(s):  
Tensile Strength ◽  
High Performance ◽  
Betula Pendula ◽  
X Ray ◽  
X Ray Scattering ◽  
Out Of Plane ◽  
Automotive Parts ◽  
Pearson Correlations ◽  
Non Destructive ◽  
Fibril Angle

The currently pursued implementation of wood into novel high performance applications such as automotive parts require knowledge about the material behaviour including ultimate strength. Previous research has shown that fiber deviation seems to be the dominating factor influencing the strength of thin veneers. This study aims to further investigate and quantify the influence of fiber deviation in two dimension and different hierarchical levels on the tensile strength of thin birch veneers. The fiber deviation in- and out-of-plane as well as the micro fibril angle were assessed by means of wide-angle X-ray scattering. Tensile strength was determined in laboratory experiments. Results show a high variability for in-plane fiber deviation mainly constituted by knots and other growth influencing factors. Pearson correlations between strength and fiber deviation ranged from −0.594 up to −0.852. Best correlation (r = −0.852) was achieved for maximum in-plane fiber deviation directly followed by a combined angle of in- and out-of-plane fiber deviation (r = −0.846). Based on the results it was shown that fiber deviation in- and out-of-plane is the dominating factor influencing ultimate tensile strength of thin birch veneers. Further research in regard to non-destructive strength prediction is necessary.

scholarly journals Nanostructure-specific X-ray tomography reveals myelin levels, integrity and axon orientations in mouse and human nervous tissue

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Marios Georgiadis ◽  
Aileen Schroeter ◽  
Zirui Gao ◽  
Manuel Guizar-Sicairos ◽  
Marianne Liebi ◽  
...  
Keyword(s):  
Mouse Brain ◽  
Nervous Tissue ◽  
Signal Transmission ◽  
X Ray ◽  
Tensor Tomography ◽  
Quantitative Studies ◽  
X Ray Scattering ◽  
Imaging Approach ◽  
Non Destructive ◽  
Mri Measurements

AbstractMyelin insulates neuronal axons and enables fast signal transmission, constituting a key component of brain development, aging and disease. Yet, myelin-specific imaging of macroscopic samples remains a challenge. Here, we exploit myelin’s nanostructural periodicity, and use small-angle X-ray scattering tensor tomography (SAXS-TT) to simultaneously quantify myelin levels, nanostructural integrity and axon orientations in nervous tissue. Proof-of-principle is demonstrated in whole mouse brain, mouse spinal cord and human white and gray matter samples. Outcomes are validated by 2D/3D histology and compared to MRI measurements sensitive to myelin and axon orientations. Specificity to nanostructure is exemplified by concomitantly imaging different myelin types with distinct periodicities. Finally, we illustrate the method’s sensitivity towards myelin-related diseases by quantifying myelin alterations in dysmyelinated mouse brain. This non-destructive, stain-free molecular imaging approach enables quantitative studies of myelination within and across samples during development, aging, disease and treatment, and is applicable to other ordered biomolecules or nanostructures.

Structural characterization of laser ablated epitaxial (Ba0.5Sr0.5)TiO3 thin films on MgO(001) by synchrotron x-ray scattering

1999 ◽  
Vol 14 (7) ◽  
pp. 2905-2911 ◽  
Author(s):  
Sangsub Kim ◽  
Tae Soo Kang ◽  
Jung Ho Je
Keyword(s):  
Thin Films ◽  
Early Stage ◽  
Lattice Parameter ◽  
Normal Direction ◽  
X Ray ◽  
X Ray Scattering ◽  
Surface Normal ◽  
Out Of Plane ◽  
Axis Parallel ◽  
Ray Scattering

Epitaxial (Ba0.5Sr0.5) TiO3 thin films of two different thickness (∼25 and ∼134 nm) on MgO(001) prepared by a pulsed laser deposition method were studied by synchrotron x-ray scattering measurements. The film grew initially with a cube-on-cube relationship, maintaining it during further growth. As the film grew, the surface of the film became significantly rougher, but the interface between the film and the substrate did not. In the early stage of growth, the film was highly strained in a tetragonal structure (c/a = 1.04) with the longer axis parallel to the surface normal direction. As the growth proceeded further, it relaxed to a cubic structure with the lattice parameter near the bulk value, and the mosaic distribution improved significantly in both in- and out-of-plane directions. The thinner film (∼25 nm) showed only one domain limited mainly by the film thickness, but the thicker film (∼134 nm) exhibited three domains along the surface normal direction.

Diffuse X-ray scattering from tiny sample volumes

2005 ◽  
Vol 220 (12) ◽  
Author(s):  
Gene E. Ice ◽  
Rozaliya I. Barabash ◽  
Wenjun Liu
Keyword(s):  
Local Structure ◽  
Diffuse Scattering ◽  
High Performance ◽  
Sensitive Area ◽  
X Ray ◽  
X Ray Scattering ◽  
Defect Content ◽  
Ray Scattering

AbstractThe emergence of intense synchrotron X-ray sources, efficient focusing optics and high-performance X-ray sensitive area detectors allows for measurements of diffuse scattering from cubic micron-scale sample vol umes. Here we present an experiment that illustrates methods for studying the local structure and defect content of tiny sample volumes. In the experiment, an X-ray microbeam illuminating about ∼5 μm

scholarly journals Parameters based on X-ray images to assess the physical and physiological quality of Leucaena leucocephala seeds

2018 ◽  
Vol 42 (6) ◽  
pp. 643-652 ◽  
Author(s):  
André Dantas de Medeiros ◽  
Joyce de Oliveira Araújo ◽  
Manuel Jesús Zavala León ◽  
Laércio Junio da Silva ◽  
Denise Cunha Fernandes dos Santos Dias
Keyword(s):  
Leucaena Leucocephala ◽  
High Performance ◽  
Principal Component ◽  
Automated Analysis ◽  
Radiographic Images ◽  
X Ray ◽  
Physiological Quality ◽  
Non Destructive ◽  
Do So

ABSTRACT Non-destructive and high performance analyses are highly desirable and important for assessing the quality of forest seeds. The aim of this study was to relate parameters obtained from semi-automated analysis of radiographs of Leucaena leucocephala seeds to their physiological potential by means of multivariate analysis. To do so, seeds from five lots collected from parent trees from the region of Viçosa, MG, Brazil, were used. The study was carried out through analysis of radiographic images of seeds, from which the percentage of damaged seeds (predation and fungi), and measurements of area, perimeter, circularity, relative density, and integrated density of the seeds were obtained. After the X-ray test, the seeds were tested for germination in order to assess variables related to seed physiological quality. Multivariate statistics were applied to the data generated, with use of principal component analysis (PCA). X-ray testing allowed visualization of details of the internal structure of seeds and differences regarding density of seed tissues. Semi-automated analysis of radiographic images of Leucaena leucocephala seeds provides information on seed physical characteristics and generates parameters related to seed physiological quality in a simple, fast, and inexpensive manner.

When dendrimers are not better – rational design of nanolayers for high-performance organic electronic devices

Nanoscale ◽  
2019 ◽  
Vol 11 (10) ◽  
pp. 4463-4470 ◽  
Author(s):  
Maxim A. Shcherbina ◽  
Oleg V. Borshchev ◽  
Alexandra P. Pleshkova ◽  
Sergei A. Ponomarenko ◽  
Sergei N. Chvalun
Keyword(s):  
High Performance ◽  
Rational Design ◽  
Electronic Devices ◽  
Carbosilane Dendrimers ◽  
Scanning Calorimetry ◽  
Organic Electronic Devices ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force

Several generations of carbosilane dendrimers with quaterthiophene end groups were studied by X-ray scattering, differential scanning calorimetry, polarizing optical and atomic force microscopy and molecular modelling.

Synchrotron x-ray Scattering Study on Oxidation of AIN/Sapphire

1999 ◽  
Vol 590 ◽  
Author(s):  
H. C. Kang ◽  
S. H. Seo ◽  
D. Y. Noh
Keyword(s):  
Domain Size ◽  
Film Plane ◽  
Atomic Concentration ◽  
X Ray ◽  
X Ray Scattering ◽  
Nano Crystalline ◽  
Out Of Plane ◽  
Plane Direction ◽  
Scattering Study ◽  
Ray Scattering

ABSTRACTWe present an x-ray scattering study of the oxidation of AIN/sapphire films into λ-A12O3 upon annealing. Epitaxial AIN/Sapphire(0001) transforms into nano-crystalline epitaxial λ-A12O3 during annealing at temperatures above 800°C in air. The crystalline orientational relation between the λ-Al2O3 and AIN are < 111 > // < 0001 > in the film normal direction, and < 110 > // < 1120 > in the film plane direction. The domain size of the spinel λ-A1203 crystalline is smaller than 50 Å in both out-of-plane and in-plane directions. The XPS depth profiles of the oxide film showed that the film is composed of aluminum and oxygen, and the atomic concentration ratio is about 2:3.

In-Situ Synchrotron X-ray Scattering Studies of the Thermally-Induced Self-Assembly of High-Performance Aromatic Copolyesters

2014 ◽  
Vol 6 (11) ◽  
pp. 2352-2357
Author(s):  
Young Yong Kim ◽  
Kyuyoung Heo ◽  
Kyeong Sik Jin ◽  
Jehan Kim ◽  
Jong Ryang Kim ◽  
...  
Keyword(s):  
Self Assembly ◽  
High Performance ◽  
Thermally Induced ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Principal Residual Strains as A function of Depth for Sputter Deposited Mo Thin Films

1994 ◽  
Vol 356 ◽  
Author(s):  
S. G. Malhotra ◽  
Z. U. Rek ◽  
L. J. Parfitt ◽  
S. M. Yalisove ◽  
J. C. Bilello
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Out Of Plane ◽  
Residual Strains ◽  
Sputter Deposited ◽  
Film Substrate ◽  
Principal Strains

AbstractTraditionally, the magnitude of the stress in a thin film is obtained by measuring the curvature of the film-substrate couple; however, these techniques all measure the average stress throughout the film thickness. On a microscopic level, the details of the strain distribution as a function of depth through the thickness of the film can have important consequences in governing film quality and ultimate morphology. A new method for determining the magnitude of principal strains (strain eigenvalues) as a function of x-ray penetration depth using grazing incidence x-ray scattering for a polycrystalline thin film will be described. Results are reported for two Mo metallizations ˜ 500 Å and ˜1000 Å thick sputtered onto Si {100} substrates. The magnitude of the principal strains at several penetration depths was accomplished by an analysis of the diffraction peak shifts of at least six independent {hkl} scattering vectors from the Mo thin films. An out-of-plane strain gradient was identified in both Mo films and the strain eigenvalues were found to be anisotropic in nature. This new methodology should work with a variety of thin films and hence would provide quantitative insight into the evolution of thin film microstructure.

Extremely Light Weight Rheocast Components for Automotive Space Frame

2012 ◽  
Vol 192-193 ◽  
pp. 545-550 ◽  
Author(s):  
Mario Rosso ◽  
Ildiko Peter ◽  
Gianluigi Chiarmetta ◽  
Ivano Gattelli
Keyword(s):  
High Performance ◽  
Mechanical Tests ◽  
Standard Samples ◽  
Fe Content ◽  
Wide Range ◽  
Automotive Parts ◽  
Fracture Surface Analysis ◽  
High Level ◽  
Non Destructive ◽  
Very High

This paper presents an analysis of a new rheocasting process suitable for the manufacturing of high performance automotive parts. The process is able for the realization of components using Al alloys. An important aspect is related to the possibility to obtain quite wide range of thicknesses, starting from 2.5 mm. The used alloy is the well known A356, with low Fe content, maximum 0.08 wt%. T6 heat treatments has been performed, while the soundness of the parts has been certified by non destructive tests. These parts are produced to be mounted on a top level and famous sport car. Non standard samples for mechanical tests have been machined directly from the components. Following the mechanical tests fracture surface analysis has been carried out by SEM to observe some morphological details and to evaluate the influence of the process and of the alloy conditions on the fracture behaviour. On the polished transverse sections of the samples morphological analysis has been performed. The obtained results shown high level of mechanical strength for all series of components. The reliability of the process is very high at a convenient level of manufacturing rate. The weldability of the parts has been demonstrated.

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