An investigation of secondary electron emission from ZnO based nanomaterials for future applications in radiation detectors

AbstractThis paper discusses the use of nanomaterials for the improved performance of time-of-flight particle detectors based on secondary electron emission (SEE). The purpose of the research presented in this paper is to find a nanomaterial that has a higher SEE than gold. In this article, we present a measurement of the SEE properties from 1D (one-dimensional) nanostructures of ZnO and ZnO/GaN (ZnO with GaN coating) composed of a mostly regular pattern of nanotubes grown on a thin Si3N4 substrate. The study was performed with 4.77 meV/u Au beam. We observed an average increase of 2.5 in the SEE properties from the 1D ZnO nanotubes compared to gold.

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In search of nano-materials with enhanced secondary electron emission for radiation detectors

Scientific Reports ◽

10.1038/s41598-021-89990-y ◽

2021 ◽

Vol 11 (1) ◽

Author(s):

Marian Cholewa ◽

Mario Cappellazzo ◽

Mario Ley ◽

Dennis Bittner ◽

Jan Jolie ◽

...

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Three Dimensional ◽

Radiation Detectors ◽

Heavy Ion ◽

Nano Materials ◽

Nano Structure ◽

Standard Material ◽

Structured Materials

AbstractThere has been limited research devoted to secondary electron emission (SEE) from nano-materials using rapid and heavy ion bombardment. Here we report a comparison of SEE properties between novel nano-materials with a three-dimensional nano-structure composed of a mostly regular pattern of rods and gold used as a standard material for SEE under bombardment of heavy ions at energies of a few MeV/nucleon. The nano-structured materials show enhanced SEE properties when compared with gold. Results from this work will enable the development of new radiation detectors for science and industry.

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Secondary electron emission multipliers as particle detectors

Journal of Physics E Scientific Instruments ◽

10.1088/0022-3735/9/5/001 ◽

1976 ◽

Vol 9 (5) ◽

pp. 321-330 ◽

Cited By ~ 22

Author(s):

W E Baumgartner ◽

W K Huber

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Particle Detectors

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Historical Introduction

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100077670 ◽

1977 ◽

Vol 35 ◽

pp. 2-5

Author(s):

R. D. Heidenreich

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

50Th Anniversary ◽

Secondary Emission ◽

Wave Nature ◽

Nobel Prize In Physics ◽

Primary Electrons ◽

The U.S ◽

Mutual Agreement

This program has been organized by the EMSA to commensurate the 50th anniversary of the experimental verification of the wave nature of the electron. Davisson and Germer in the U.S. and Thomson and Reid in Britian accomplished this at about the same time. Their findings were published in Nature in 1927 by mutual agreement since their independent efforts had led to the same conclusion at about the same time. In 1937 Davisson and Thomson shared the Nobel Prize in physics for demonstrating the wave nature of the electron deduced in 1924 by Louis de Broglie.The Davisson experiments (1921-1927) were concerned with the angular distribution of secondary electron emission from nickel surfaces produced by 150 volt primary electrons. The motivation was the effect of secondary emission on the characteristics of vacuum tubes but significant deviations from the results expected for a corpuscular electron led to a diffraction interpretation suggested by Elasser in 1925.

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SEM and Auger microanalysis studies of Cu-Be dynode surfaces at each activation condition

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109768 ◽

1978 ◽

Vol 36 (1) ◽

pp. 524-525

Author(s):

T. Koshikawa ◽

Y. Fujii ◽

E. Sugata ◽

F. Kanematsu

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Life Time ◽

Activation Process ◽

Beam Diameter ◽

Activation Temperature ◽

Electron Multiplier ◽

Activation Condition ◽

Activation Conditions

The Cu-Be alloys are widely used as the electron multiplier dynodes after the adequate activation process. But the structures and compositions of the elements on the activated surfaces were not studied clearly. The Cu-Be alloys are heated in the oxygen atmosphere in the usual activation techniques. The activation conditions, e.g. temperature and O2 pressure, affect strongly the secondary electron yield and life time of dynodes.In the present paper, the activated Cu-Be dynode surfaces at each condition are investigated with Scanning Auger Microanalyzer (SAM) (primary beam diameter: 3μmϕ) and SEM. The commercial Cu-Be(2%) alloys were polished with Cr2O3 powder, rinsed in the distilled water and set in the vacuum furnance.Two typical activation condition, i.e. activation temperature 730°C and 810°C in 5x10-3 Torr O2 pressure were chosen since the formation mechanism of the BeO film on the Cu-Be alloys was guessed to be very different at each temperature from the results of the secondary electron emission measurements.

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SEM analysis of DC magnetron sputtered beryllium films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106867 ◽

1988 ◽

Vol 46 ◽

pp. 960-961

Author(s):

E. F. Lindsey ◽

C. W. Price ◽

E. L. Pierce ◽

E. J. Hsieh

Keyword(s):

Fine Structure ◽

Electron Emission ◽

Secondary Electron ◽

Low Voltage ◽

Ion Beam ◽

Secondary Electron Emission ◽

Sem Analysis ◽

Fused Silica ◽

Grain Structure ◽

Silica Substrate

Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.

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