scholarly journals Experimental demonstration of a concave grating for spin waves in the Rowland arrangement

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Ádám Papp ◽  
Martina Kiechle ◽  
Simon Mendisch ◽  
Valentin Ahrens ◽  
Levent Sahin ◽  
...  

AbstractWe experimentally demonstrate the operation of a Rowland-type concave grating for spin waves, with potential application as a microwave spectrometer. In this device geometry, spin waves are coherently excited on a diffraction grating and form an interference pattern that focuses spin waves to a point corresponding to their frequency. The diffraction grating was created by focused-ion-beam irradiation, which was found to locally eliminate the ferrimagnetic properties of YIG, without removing the material. We found that in our experiments spin waves were created by an indirect excitation mechanism, by exploiting nonlinear resonance between the grating and the coplanar waveguide. Although our demonstration does not include separation of multiple frequency components, since this is not possible if the nonlinear excitation mechanism is used, we believe that using linear excitation the same device geometry could be used as a spectrometer. Our work paves the way for complex spin-wave optic devices—chips that replicate the functionality of integrated optical devices on a chip-scale.

2016 ◽  
Vol 16 (4) ◽  
pp. 3312-3317 ◽  
Author(s):  
Hiroyuki Yamamoto ◽  
Keiji Obara ◽  
Shohei Higashihara ◽  
Yuki Obama ◽  
Takeshi Yamao ◽  
...  

We have succeeded in directly engraving one-dimensional diffraction gratings on the surface of organic semiconducting oligomer crystals by using focused ion beam (FIB) lithography and laser ablation (LA) methods. The FIB method enabled us to shape the gratings with varying periods down to ∼150 nm. With the LA method a large-area grating with a ∼500-nm period was readily accessible. All the above crystals indicated spectrally-narrowed emission (SNE) lines even in the case of shallow groove depths ∼2–4 nm. In particular, we definitively observed the SNE pertinent to the first-order diffraction with the crystal having the diffraction grating of a 148.3-nm average period. The present results indicate utility of the built-in gratings that can directly be fabricated on the surface of the crystals.


2020 ◽  
Vol 101 (1) ◽  
Author(s):  
Lukáš Flajšman ◽  
Kai Wagner ◽  
Marek Vaňatka ◽  
Jonáš Gloss ◽  
Viola Křižáková ◽  
...  

2014 ◽  
Vol 31 (12) ◽  
pp. 124204 ◽  
Author(s):  
Ji-Cheng Zhang ◽  
Yu-Wei Liu ◽  
Cheng-Long Huang ◽  
Qiang-Qiang Zhang ◽  
Yong Yi ◽  
...  

2005 ◽  
Vol 13 (21) ◽  
pp. 8618 ◽  
Author(s):  
Kirill E. Zinoviev ◽  
Carlos Dominguez ◽  
Anna Vilà

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).


2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.


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