Incorporation-limiting mechanisms during nitrogenation of monolayer graphene films in nitrogen flowing afterglows

Nanoscale ◽  
2021 ◽  
Vol 13 (5) ◽  
pp. 2891-2901
Author(s):  
G. Robert Bigras ◽  
R. Martel ◽  
L. Stafford

Modification of graphene films in the flowing afterglow of microwave N2 plasmas. Nitrogenation is first limited by the formation of defect sites by plasma-generated N and N2(A) at low damage and then by the adsorption of nitrogen atoms at high damage.

Author(s):  
А.Ф. Вяткин

AbstractA method of graphene synthesis on the surface of copper foil by cold implantation of carbon recoil atoms is considered. It is established that monolayer graphene films are formed on the surface of carbon-implanted copper foil under certain conditions (annealing temperature and duration, cooling rate) of postimplantation processing.


2015 ◽  
Author(s):  
Vladimir L. Derbov ◽  
Dmitry D. Grachev ◽  
Leonid A. Sevastyanov ◽  
Konstantin P. Lovetskiy ◽  
Sergey I. Vinitsky ◽  
...  

2014 ◽  
Vol T162 ◽  
pp. 014030 ◽  
Author(s):  
J R Prekodravac ◽  
S P Jovanović ◽  
I D Holclajtner-Antunović ◽  
D B Peruško ◽  
V B Pavlović ◽  
...  

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Byeong-Ju Park ◽  
Jin-Seok Choi ◽  
Hyun-Suk Kim ◽  
Hyun-You Kim ◽  
Jong-Ryul Jeong ◽  
...  

2012 ◽  
Vol 18 (6) ◽  
pp. 1342-1354 ◽  
Author(s):  
Wu Zhou ◽  
Mark P. Oxley ◽  
Andrew R. Lupini ◽  
Ondrej L. Krivanek ◽  
Stephen J. Pennycook ◽  
...  

AbstractWe show that aberration-corrected scanning transmission electron microscopy operating at low accelerating voltages is able to analyze, simultaneously and with single atom resolution and sensitivity, the local atomic configuration, chemical identities, and optical response at point defect sites in monolayer graphene. Sequential fast-scan annular dark-field (ADF) imaging provides direct visualization of point defect diffusion within the graphene lattice, with all atoms clearly resolved and identified via quantitative image analysis. Summing multiple ADF frames of stationary defects produce images with minimized statistical noise and reduced distortions of atomic positions. Electron energy-loss spectrum imaging of single atoms allows the delocalization of inelastic scattering to be quantified, and full quantum mechanical calculations are able to describe the delocalization effect with good accuracy. These capabilities open new opportunities to probe the defect structure, defect dynamics, and local optical properties in 2D materials with single atom sensitivity.


Carbon ◽  
2019 ◽  
Vol 148 ◽  
pp. 241-248 ◽  
Author(s):  
Shijing Wei ◽  
Lai-Peng Ma ◽  
Mao-Lin Chen ◽  
Zhibo Liu ◽  
Wei Ma ◽  
...  

2019 ◽  
Vol 5 (3) ◽  
pp. 463-470 ◽  
Author(s):  
Changqing Shen ◽  
Xingzhou Yan ◽  
Fangzhu Qing ◽  
Xiaobin Niu ◽  
Richard Stehle ◽  
...  

2021 ◽  
Vol 13 (4) ◽  
pp. 574-582
Author(s):  
Kun Xu ◽  
Pei Ding ◽  
Yan Li ◽  
Leiming Chen ◽  
Junwei Xu ◽  
...  

A layer of nano amorphous carbon was fabricated on the target substrate by precisely controlled magnetron sputtering, and then a layer of copper film was fabricated on the amorphous carbon. By using a vertical cold wall chemical vapor deposition system under protective atmosphere, the carbon atoms at high temperature was catalyzed by copper to form graphene films. The amorphous carbon nano thin film was converted into monolayer graphene on a SiO2 substrate directly. The experimental results show that the graphene film has high crystal quality and conductivity. Compared with other methods, the process is simple and the process window is wider. By virtue of this technique, a graphene-Si photodetector was also demonstrated. The photoelectric response and frequency characteristics have been studied which shows good device characteristics.


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